BIPM Workshop "The Quantum Revolution in Metrology"

A single-emitter sub-shot noise quantum light source: press a button and get one photon

Stephan Götzinger (Max Planck Institute for Light, Germany)

The effect of turbulence in free-space synchronization, using second-order quantum interferenc

Filippus S. Roux (NMISA, South Africa)

Single photon detection without losing the count

Mauro Rajteri (INRIM, Italy)

Non-destructive detection for strontium optical lattice clocks: Towards a lattice clock in the quantum regime

Jérôme Lodewyck (LNE-SYRTE, France)

Towards creation of the nuclear clock and frequency reference point: Search for the optimal parameters today, working instruments of the future

Feodr F. Karpeshin, (VNIIM, Russia)

Optical-clock local-oscillator universal interrogation protocol for zero probe-field-induced frequency-shifts

Thomas Zanon-Willette (Observatoire de Paris, France)

How to optimize the shape of quantum light for quantum metrology

Claude Fabre (Laboratoire Kastler Brossel, France)

Impact of the new generation of Josephson voltage standards in ac and dc electric metrology

Al)ain Rüfenacht (NIST, USA)

Error modelling of quantum Hall array resistance standards

Martina Marzano (INRIM, Italy)

Distinction between electromagnetically induced transparency and Autler-Townes splitting: a conceptual approach

Satya kesh Dubey (CSIR-NPLI, India)

The robustness and universality of tunable-barrier electron pumps

Stephen Giblin (NPL, UK)

Quantum optical explorations of the nanoscale metrology frontier

Jacob Taylor (NIST/JQI, USA)

Searching for an invariant of the sample composition in the measurement of the amount of substance

Hong Yi (NIM, China)

Measuring a mole of photons: optical power traceable to the kilogram

John Lehman (NIST, USA)

Novel source of multimode squeezed light for quantum enhanced space-time positioning

Lucas La Volpe (Laboratoire Kastler Brossel, France)

see Session3: S3-08

Optical magnetometry beyond the shot noise limit

Ricardo Jimenez-Martinez (ICFO - The Institute of Photonic Sciences, Spain)

Chip‐scale atomic instrumentation for metrology

John Kitching (NIST, USA)