BIPM Workshop: The Quantum Revolution in Metrology
28-29 September 2017 (at the BIPM)
Steering Committee
Sang-Kyung Choi
KRISS
Patrick Gill
NPL
Martin Milton (Chair)
BIPM
Maria-Luisa Rastello
INRIM
Uwe Siegner
PTB
Carl Williams
NIST
Workshop Executive Secretary
Pierre Gournay
BIPM
Focus Issue of Metrologia
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Focus on the Quantum Revolution in Metrology
Guest Editor: Pierre Gournay
Introduction
The objective of the workshop is to promote scientific exchange amongst the National Metrology Institutes and with leading researchers on the applications of quantum-based technologies to metrology.
Workshop sessions
The workshop was organized in five thematic sessions:
- Advances in quantum electrical standards, single-electron transistors and demonstrations of the quantum metrology triangle;
- Single-photon measurements, radiometry with entangled sources, superconducting particle detectors;
- Highly entangled systems for metrology, entangled optical clocks;
- Quantum standards for mass, force, pressure, vacuum, temperature, acoustics and vibration;
- Emerging ideas in quantum metrology.