quantum-metrology INTRO

BIPM Workshop: The Quantum Revolution in Metrology

28-29 September 2017 (at the BIPM)

 

quantum-metrology SC

Steering Committee

Sang-Kyung Choi

KRISS

Patrick Gill

NPL

Martin Milton (Chair)

BIPM

Maria-Luisa Rastello

INRIM

Uwe Siegner

PTB

Carl Williams

NIST

Workshop Executive Secretary

Pierre Gournay

BIPM

quantum-metrology METROLOGIA

Focus Issue of Metrologia

quantum-metrology DETAILS

Introduction

The objective of the workshop is to promote scientific exchange amongst the National Metrology Institutes and with leading researchers on the applications of quantum-based technologies to metrology.

 

Workshop sessions

The workshop was organized in five thematic sessions:

  1. Advances in quantum electrical standards, single-electron transistors and demonstrations of the quantum metrology triangle;

  2. Single-photon measurements, radiometry with entangled sources, superconducting particle detectors;

  3. Highly entangled systems for metrology, entangled optical clocks;

  4. Quantum standards for mass, force, pressure, vacuum, temperature, acoustics and vibration;

  5. Emerging ideas in quantum metrology.

Publications

Applications est temporairement indisponible.

quantum-metrology PHOTO