BIPM Workshop: The Quantum Revolution in Metrology
28-29 September 2017 (at the BIPM)
Steering Committee
Sang-Kyung Choi
KRISS
Patrick Gill
NPL
Martin Milton (Chair)
BIPM
Maria-Luisa Rastello
INRIM
Uwe Siegner
PTB
Carl Williams
NIST
Workshop Executive Secretary
Pierre Gournay
BIPM
Focus Issue of Metrologia
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Focus on the Quantum Revolution in Metrology
Guest Editor: Pierre Gournay
Introduction
The objective of the workshop is to promote scientific exchange amongst the National Metrology Institutes and with leading researchers on the applications of quantum-based technologies to metrology.
Workshop sessions
The workshop was organized in five thematic sessions:
- Advances in quantum electrical standards, single-electron transistors and demonstrations of the quantum metrology triangle;
- Single-photon measurements, radiometry with entangled sources, superconducting particle detectors;
- Highly entangled systems for metrology, entangled optical clocks;
- Quantum standards for mass, force, pressure, vacuum, temperature, acoustics and vibration;
- Emerging ideas in quantum metrology.
Documents
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A single-emitter sub-shot noise quantum light source: press a button and get one photon
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The effect of turbulence in free-space synchronization, using second-order quantum interferenc
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Single photon detection without losing the count
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Non-destructive detection for strontium optical lattice clocks: Towards a lattice clock in the quantum regime
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Towards creation of the nuclear clock and frequency reference point: Search for the optimal parameters today, working instruments of the future
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Optical-clock local-oscillator universal interrogation protocol for zero probe-field-induced frequency-shifts
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How to optimize the shape of quantum light for quantum metrology
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Impact of the new generation of Josephson voltage standards in ac and dc electric metrology
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Error modelling of quantum Hall array resistance standards
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Distinction between electromagnetically induced transparency and Autler-Townes splitting: a conceptual approach
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The robustness and universality of tunable-barrier electron pumps
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Quantum optical explorations of the nanoscale metrology frontier
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Searching for an invariant of the sample composition in the measurement of the amount of substance
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Measuring a mole of photons: optical power traceable to the kilogram
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Novel source of multimode squeezed light for quantum enhanced space-time positioning
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Optical magnetometry beyond the shot noise limit
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Chip‐scale atomic instrumentation for metrology
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