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Announcement of the 20th International Congress of Metrology (CIM 2021)

The 20th International Congress of Metrology, CIM 2021, will be held from 28-30 September 2021 in Paris (France). The congress will explore scientific and industrial challenges in the field of measurement through a varied programme focusing on the main following topics.

  • Controlled Measurements: uncertainties, traceability, cost optimization, certification, standardization, conformity and risks... for measurement, analysis and testing processes.
  • Optimized Measurements: techniques and best practices for mass, force, flow, pressure, dimension, electricity, time-frequency, temperature, hygrometry, optics and photonics, ionizing radiation, chemical measures, biological measures...
  • Advanced Measurements:
    • new technologies, smart sensors, IIOT
    • data qualification, analysis and security
    • quantum technology, AI, blockchain
    • jobs evolution, recruitment.

The topics have applications in all sectors: mechanics, chemistry, pharmaceuticals, health, agro-food, environment, pollution, energy...

The call for papers is open from 1 October 2020 to 15 January 2021.

More information about the congress programme and the call for papers can be found at

https://www.cim2021.com/home.html