Checklist For Attending the 150th Anniversary of the Metre Convention
We’re thrilled to welcome participants from around the world to join us in celebrating 150 Years of the Metre Convention from 20–22 May in Paris and Versailles.
Whether you’re attending the World Metrology Day Symposium at UNESCO or the Scientific Conference in Versailles, make sure you have everything you need.
ESSENTIAL INFORMATION
BEFORE 16 May
Register via both BIPM and UNESCO systems
Even if you’ve signed up through the BIPM event platform, UNESCO requires separate registration to grant you access to the building. This link has also been emailed to confirmed participants — please ensure you’ve completed both steps.
On 20 May
Bring your QR code
You will need to show the QR code you received in the UNESCO registration confirmation email to enter the building. Without this, you will not be able to attend the event. This email will be sent by noreply@un.org.
Bring a valid ID
Access to the UNESCO building requires a valid form of identification (passport or national ID). Please ensure you have this with you, in addition to the QR code, for entry.
HELPFUL TIPS
1. Plan extra time for security and getting your badge
We recommend arriving at each venue at least 30 minutes early to allow for security screening, check-in and networking opportunities.
2. Check the venue location and plan your route
UNESCO is in central Paris and can be accessed via the metro. Palais des Congrès, Versailles is located outside of Paris — ensure you’ve mapped out your journey and allowed enough time for travel.
3. Review the full agenda and list of speakers
Explore the exceptional programme and prepare to hear from global leaders across science, industry and international cooperation. View the agenda
4. Spread the word before and during our events
Let your colleagues and networks know you’ll be there and share your insights and event highlights using #BIPM150 and @BIPM.You’ll find graphics and messages ready to use in our Social Media Toolkit. We’ll be amplifying your posts and celebrating your contributions throughout the week.
We look forward to seeing you in just ONE WEEK for what promises to be an inspiring, forward-looking celebration of global metrology
Let’s make history — and the future — together! #BIPM150