CCEM Webinar on Challenging Applications of RF metrology

Rydberg atom-based sensors for metrology and beyond

Dr Christopher Holloway (NIST)

The unique properties of Rydberg atoms allow for radio-frequency (RF) spectroscopy, which has resulted in intriguing applications. One of the keys to developing new science and technologies is to have sound metrology tools and techniques. Atom-based measurements allow for unprecedented accuracy in measurement systems, and as a result, measurement standards have evolved towards atom-based measurements over the last few decades; most notably length (m), frequency (Hz), and time (s) standards. Recently, there has been a great interest in extending this to magnetic (H), electric (E), and other physical quantities. These Atom-based measurements allow for direct International System of Units (SI) traceable measurements. The development of Rydberg atom-based sensors has allowed for SI-traceable measurements for E-fields and RF power. With the great progress in the development of Rydberg atom-based sensors, interesting and unforeseen applications are emerging. These applications include, (1) SI-traceable measurements for electric field and power, (2) amplitude and phase detection of time-varying signals, (3) angle-of-arrival, (4) waveforms and spectrum analyzers, (5) plasma sensors, (6) near-field and sub-wavelength imaging, (7) blackbody detection and thermometry, (8) DC/AC voltage measurements, (9) new imaging applications, and even streaming video over the air. As well as many other applications.

One of the more intriguing applications for Rydberg atom-based sensors is in the detection of time-varying signals. These atom-based receivers allow for the detection of amplitude-, frequency-, and phase-modulated signals. In fact, in receiver applications, these Rydberg-atom sensors act like an antenna (to detect the signal) and they perform the demodulation and down conversion automatically. In this talk, we will present the development of this technology, and in the process, we will summarize this work and discuss various applications.

Cryogenic RF metrology for quantum computing

Prof. Manoj Stanley (NPL)

The rapid advancement of quantum computing technologies is driving an unprecedented demand for radio frequency (RF) quantum, semiconductor, and electronic devices capable of operating at temperatures as low as 4 K and below. These extreme cryogenic environments are essential for protecting quantum systems from thermal noise while enabling ultra-low-noise, energy-efficient operation of supporting electronics. However, innovation and commercial deployment remain constrained by the lack of accurate, traceable, and reliable RF measurement techniques at cryogenic temperatures. This measurement gap limits device characterisation, model validation, design optimisation, and ultimately the scalability of next-generation technologies. This talk will examine the unique challenges associated with cryogenic RF measurements, with particular emphasis on S-parameter characterisation. It will highlight the UK's National Physical Laboratory's state-of-the-art capabilities for cryogenic RF metrology and present ongoing efforts to develop advanced measurement methodologies, standards, and international collaborations that are establishing the measurement foundations required for scalable quantum technologies.