Présentation de posters #BIPM150 :
Métrologie et recyclage des éléments critiques pour la technologie issus des déchets d'équipements électroniques
From smartphones to solar panels, technology critical elements (TCEs) power the digital age — but recovering these scarce resources from waste remains a global challenge.
At the BIPM’s Scientific Symposium held during the 150th Anniversary of the Metre Convention, Dr Sarah Hill of the United Kingdom’s National Measurement Laboratory hosted at LGC presented a poster entitled “Enabling the recycling of technology critical elements from e-waste through metrology.”
This work responds to the recycling industry’s pressing need for fast, reliable methods to assess the economic value of waste and design processes that maximize recovery. The analysis of waste streams is a complicated task due to the huge variety of materials present—metal, glass, plastics, ceramics and more—and their heterogeneity across tonnes.
This poster describes the work undertaken to address this.
The Poster
Listen to a 2-minute audio recording of Dr Sarah Hill explaining the poster, here.
This research forms part of the EURAMET MetroCycleEU project, which brought together national metrology institutes, academia and industry from across Europe to strengthen analytical methods and produce reference materials needed to support the measurement of TCEs at the end of their life cycles.
The poster was co-authored by MetroCycleEU collaborators from institutes across Europe. The project coordinator was LNE (France) with work packages led by INRIM (Italy), BAM (Germany) and Eramet (France).
Watch the Presentation
BIPM150: Nine Standout Scientific Posters
Chosen from nearly 400 submissions received from around the world, these standout posters address some of the most pressing challenges in modern metrology—from quantum technologies and digital transformation to health, education and sustainability.
Each of these 9 posters was selected by the BIPM Poster Committee from one of nine key topic areas, reflecting the breadth and innovation driving the global metrology community. Learn more.