Atelier du FORUM-MD: "AI in a metrology context: AI for metrology and metrology for AI"

The workshop is organised as part of the activities of the Forum on Metrology and Digitisation (FORUM-MD).

Overview

Artificial Intelligence is reshaping science, technology, and industry. In metrology—the science of measurement—AI offers new opportunities to enhance data analysis, automate processes, and improve decision-making. At the same time, metrology ensures the reliability, traceability, and trustworthiness of AI systems.

Programme

This workshop is structured into two main parts:

Morning Sessions (Plenary)

We will start with two common sessions addressing the core perspectives:

1. Metrology for AI systems: Assessment and methodologies
2. AI for metrology: Improved metrological services and certificates

Afternoon Sessions (Parallel Tracks)

In the afternoon, participants will join three parallel sessions focusing on specific topics:

• Data quality, semantics & AI
• AI safety
• AI best practice applications

Finally, the day will conclude with a podium discussion, bringing together insights from all sessions and fostering an open dialogue on future directions.

Presentations will be given by experts from the National Metrology Institutes (NMIs), International Organisations and industry.

The full agenda will be available at a later date.

Organizers