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Dr Haoran Liu from the National Institute of Metrology (China) was awarded one of the two Best Poster Awards at the 24th International Conference on Radionuclide Metrology and its Applications (ICRM 2025), held in Paris, France, from May 19 to 23, 2025.

Dr Liu's award-winning poster, "A Novel Digital Background Correction Algorithm for the Selective Sampling Method," offers a fresh perspective on nuclear counting techniques. The study introduces an innovative digital background correction algorithm for the Selective Sampling (SESAM) method, which was originally introduced by Jörg W. Müller from the Bureau International des Poids et Mesures (BIPM) in the 1980s as an alternative to conventional β-γ coincidence counting. The Müller algorithm for background correction tended to have problems when sample count rates were not significantly higher than the background. To overcome this, Dr. Liu and his colleagues developed a novel digital cross-selective sampling background correction algorithm that operates on list-mode digital data offline and introduces innovative, virtually-created cross-selective sampling modes not feasible with conventional correction methods. These additions significantly enhance the precision and reliability of the background correction process, demonstrating that the new digital SESAM counting method enhances accuracy, especially for samples with moderate activity levels, and solidifies SESAM as a dependable alternative to traditional β-γ coincidence counting.

The basis for the award, as stated by the jury, is that the “subject of the poster is highly relevant to the field of radionuclide metrology, revisiting an old but fundamental method. The poster is well-structured with an appealing layout, includes all relevant information, and presents a novel approach with clear explanations. The presenting author was frequently present at the poster, consistently willing to engage in discussion and provide additional information."