International comparison of NO2 in nitrogen standards (BIPM.QM-K6)
The BIPM.QM-K6 is an on-demand comparison for gaseous nitrogen dioxide (NO2) in nitrogen contained in high pressure cylinders.
The Key Comparison BIPM.QM-K6 is aimed at underpinning the capabilities of the participants to value assign the amount fraction of nitrogen dioxide (NO2) in nitrogen standards at a nominal amount fraction of
The comparison is run as a series of bilateral comparisons between each participant and the BIPM. The facility maintained by the BIPM provides the Key Comparison Reference Value (KCRV) in each case and quantifies NO2 amount fractions in nitrogen samples via the dynamic nitrogen dioxide primary gas mixtures obtained from the BIPM Nitrogen Dioxide (NO2) Primary Facility.
The BIPM facility’s performance has been validated during the CCQM-K74 [1], CCQM K74.2018 [2] and described in detail in a publications [3-5].
The comparison protocol and associated forms can be downloaded from this page. Completed registration forms should be sent to the comparison coordinator, Dr. Edgar Flores (BIPM).
[1] E. Flores, F. Idrees, P. Moussay, J. Viallon, R. Wielgosz, T. Fernandez, S. Ramirez, A. Rojo, U. Shinji, J. Walden, M. Sega, O. Sang-Hyub, T. Mace, C. Couret, H. Qiao, D. Smeulders, F. R. Guenther, W. J. Thorn III, J. Tshilongo, N. G. Ntsasa, V. Stovcik, M. Valkova, L. Konopelko, E. Gromova, G. Nieuwenkamp, R. M. Wessel, M. Milton, A. Harling, G. Vargha, D. Tuma, A. Kohl and G. Schulz, Metrologia, 2012, 49, Tech. Suppl., 08005.
[2] E. Flores, J. Viallon, F. Idrees, P. Moussay, R. Wielgosz, U. Shinji, D. Cieciora, F. Rolle, M. Sega, O. Sang-Hyub, T. Macé, C. Sutour, C. Pascale, T. Zhang, D. Wang, H. Guo, Q. Han, D. Smeulders, M. Jozela, N. G. Ntsasa, J. Tshilongo, T. Mphamo, S. V. Aswegen, D. Worton, P. Brewer, M. Valkova, T. Tarhan, O. Efremova, L. Konopelko, I. d. Krom, S. Persijn and A. v. d. Veen, Metrologia, 2021, 58, 08018.
[3] E. Flores, F. Idrees, P. Moussay, J. Viallon and R. Wielgosz, Anal. Chem., 2012, 84, 10283-10290.
[4] E. Flores, J. Viallon, P. Moussay and R. I. Wielgosz, Appl. Spectrosc., 2013, 67, 1171-1178.
[5] E. Flores, J. Viallon, F. Idrees, P. Moussay, R. Wielgosz, M. d. Jesús Ávila Salas, J. K. Delgado, S.-H. Oh, S. Lee, J. Jung, M. Jozela, N. G. Ntsasa, J. Tshilongo, T. Mphamo, D. R. Worton, P. Brewer, M. Ward, S. Persijn, I. d. Krom and A. v. d. Veen, Metrologia, 2023, 60, 08006.
Contact
Chemistry Department
Information