Comparison
Comparison close
Results

BIPM.EM-K13 and SIM.EM-K1

 

MEASURAND               Resistance

NOMINAL VALUE       1 Ω

 

Degrees of equivalence represented by Di = (xI - xR) / 1, for which (xI - x) and 1 are expressed in Ω, and its expanded uncertainty Ui at a 95 % level of confidence, both expressed in 10-8.

1 Ω
Di / 10-8
Participating institutes

BIPM.EM-K13

 

MEASURAND               Resistance

NOMINAL VALUE       10 kΩ

 

Degrees of equivalence represented by Di = (xI - xR) / 104, for which (xI - x) and 104 are expressed in Ω, and its expanded uncertainty Ui at a 95 % level of confidence, both expressed in 10-8.

10 kΩ
Di / 10-8
Participating institutes
Comparison
Comparison close
Results

BIPM.EM-K13 and SIM.EM-K1

 

MEASURAND               Resistance

BIPM.EM-K13 and SIM.EM-K1

NOMINAL VALUE       1 Ω

 

Degrees of equivalence represented by Di = (xI - xR) / 1, for which (xI - x) and 1 are expressed in Ω, and its expanded uncertainty Ui at a 95 % level of confidence, both expressed in 10-8.

LABi Di Uneg,i Upos,i
10-8
10-8
10-8
CEM (a) -8.0 18
JV 2.7 12
INPL 18 30
KRISS (a) 3.1 8.4
INM(RO) 7.0 26
NIST (a) -1.4 4.2
NMIA (b) -13 23
GUM (a) -6.2 8.6
BIM -18 17
NIMT -7.1 19
CMI (a) 0.3 4.6
SMD -5.0 8.2
NMISA -12 12
NIM (a) 1.0 3.4
NMC A*STAR (a) -1.2 6.4
EMI -5.7 40
NSAI NML -8.1 9.0
INMETRO (a) 1.0 6.8
NPLI 37 87
CEM 5.6 10.6
INRIM -7.4 13.4
INTI -8.8 10
UTE 5.2 118
NRC -1.4 4.6
CENAM 17 19
Participating institutes
BIPM.EM-K13
SIM.EM-K1

BIPM.EM-K13

 

MEASURAND               Resistance

NOMINAL VALUE       10 kΩ

 

Degrees of equivalence represented by Di = (xI - xR) / 104, for which (xI - x) and 104 are expressed in Ω, and its expanded uncertainty Ui at a 95 % level of confidence, both expressed in 10-8.

LABi Di Uneg,i Upos,i
10-8
10-8
10-8
CEM (a) -2.0 4.0
JV 1.2 13.4
INPL -83 118
EIM (a) 7.3 7.0
INM(RO) -9.0 18
GUM (a) -3.7 6.8
KRISS (a) -0.1 3.2
BIM 0.6 30
NIMT (a) -31 74
CMI (a) -1.8 3.4
SMD 0.4 6.8
NMISA 52 60
NIM (a) -0.1 3.2
NMC A*STAR (a) 1.6 3.6
EMI 1.7 19
NSAI NML 6.9 42
INMETRO (a) 2.6 3.6
NPLI 31 17
CEM 2.0 6.8
INRIM -4.5 17.4
Participating institutes
BIPM.EM-K13
Comparison
Comparison close
BIPM comparison
Linked comparison
APMP.EM.BIPM-K13
Metrology area, Sub-field Electricity and Magnetism, Resistance
Description Comparison of 1 Ω and 10 kΩ resistance standards
Time of measurements 2023 - 2024
Status Measurements in progress
References

APMP.EM.BIPM-K13 Technical Protocol

Measurand DC Resistance
1 Ω and 10 kΩ
Transfer device One 1 Ω and one 10 kΩ travelling standards provided by NIMT M are used for this comparison. The 1 Ω standard and the 10 kΩ standard were made by Measurement International (MI), 9331 series, with serial number 1103855 and serial number 1103602, respectively.
Comparison type Key Comparison
Consultative Committee CCEM (Consultative Committee for Electricity and Magnetism)
Conducted by APMP (Asia Pacific Metrology Programme)
Pilot institute NIMT
National Institute of Metrology (Thailand)
Thailand
Contact person Natenapit Khumthukthit

6625775100 ext.1240
Additional
First Name Last Name
wwww@ww.www +356719836 Institute 1 Institute 1 Khmelnitskiy
Pilot laboratory
NIMT

National Institute of Metrology (Thailand), Thailand, APMP

CMS

ITRI Center for Measurement Standards, Chinese Taipei, APMP

EMI

Emirates Metrology Institute, United Arab Emirates, GULFMET

KRISS

Korea Research Institute of Standards and Science, Korea, Republic of, APMP

MASM

Mongolian Agency for Standardization and Metrology, Mongolia, APMP

MSL

Measurement Standards Laboratory, New Zealand, APMP

NMC, A*STAR

National Metrology Centre, Agency for Science, Technology and Research, Singapore, APMP

NMIA

National Measurement Institute, Australia, Australia, APMP

NMIM

National Metrology Institute of Malaysia, Malaysia, APMP

NMLPHIL

National Metrology Laboratory of the Philippines, Philippines, APMP

SASO-NMCC

National Measurement and Calibration Center - Saudi Standards, Metrology and Quality Organization, Saudi Arabia, GULFMET

SCL

Standards and Calibration Laboratory, Hong Kong, China, APMP

SNSU-BSN

National Measurement Standard - National Standardization Agency of Indonesia, Indonesia, APMP

Comparison
Comparison close
Results

BIPM.EM-K13 and SIM.EM-K1

 

MEASURAND               Resistance

NOMINAL VALUE       1 Ω

 

The key comparison reference value xR is the BIPM value. Its standard uncertainty is evaluated to be uR = 1.5x10-8 and is included in ui .
For laboratories that base their measurements on a calculable capacitor, the uncertainty associated with the use of RK-90, 1 × 10-7, needs to be included in the ui. This is a consequence of the use of the QHR reference at BIPM. Further details can be found here.

The degree of equivalence of each laboratory with respect to the reference value is given by a pair of terms: Di = xi and its expanded uncertainty (k = 2), Ui = 2ui, both expressed in 10-8.

The degree of equivalence between two laboratories i and j may be calculated,  taking into account the correlation introduced by the BIPM measurements.

 

Linking SIM.EM-K1 to BIPM.EM-K13

The linkage of SIM.EM-K1 results to those of BIPM.EM-K13 is ensured by NIST who participated in both comparisons. The detailed calculation of the linkage is explained in Appendix G of the SIM.EM-K1 Final Report.

BIPM.EM-K13

 

MEASURAND               Resistance

NOMINAL VALUE       10 kΩ

 

The key comparison reference value xR is the BIPM value. Its standard uncertainty is evaluated to be uR = 1.5x10-8 and is included in ui .

 

The degree of equivalence of each laboratory with respect to the reference value is given by a pair of terms: Di = xi and its expanded uncertainty (k = 2), Ui = 2ui, both expressed in 10-8.

The degree of equivalence between two laboratories i and j may be calculated,  taking into account the correlation introduced by the BIPM measurements.

Comparison
Comparison close
Results

BIPM.EM-K13 and SIM.EM-K1

 

MEASURAND               Resistance

NOMINAL VALUE       1 Ω

 

BIPM.EM-K13

 

xi : relative difference between the result of measurement of laboratory i and that of the BIPM
ui : combined standard uncertainty of xi

  Labi xi
/ 10-8
ui
/ 10-8
measurement date
(a) CEM -8.0 9.0 1996-06
  JV 2.7 6.2 1997-06
  NSAI NML 3.0 20 1998-04
  CMI 11 10 1998-06
  INPL 18 15 1998-12
  NSAI NML -3.0 21 2000-04
  NSAI NML -7.0 23 2002-03
(a) KRISS 3.1 4.2 2003-06
  NSAI NML -7.1 23 2004-04
  NSAI NML 0.0 19 2006-04
  INM (RO) 7.0 13 2006-04
(a) NIST -1.4 2.1 2007-08
(a) CMI 4.0 3.1 2008-02
  NSAI NML 4.2 5.4 2008-11
(b) NMIA -13 11 2008-11
(a) GUM -6.2 4.3 2009-11
  NSAI NML 10 5.7 2010-10
  NPLI 16 26 2012-09
  BIM -18 8.6 2013-04
  NSAI NML -6.7 8.1 2014-12
  NIMT -7.1 9.6 2015-05
(a) CMI 0.3 2.3 2015-10
  SMD -5.3 4.0 2017-02
  NMISA -12 6.0 2017-12
  NSAI NML 2.6 8.6 2018-06
(a) NIM 1.0 1.7 2018-11
(a) NMC A*STAR -1.2 3.2 2020-02
  EMI -5.7 20 2020-05
(a) INMETRO 1.0 3.4 2021-06
  NSAI NML -8.1 18 2021-08
  NPLI 36.0 43 2022-04
  CEM 5.6 5.3 2022-06
  INRIM -7.4 6.7 2022-12

 

(a) Institute using a quantum Hall resistance standard 

(b) Measurements traceable to a calculable capacitor

BIPM.EM-K13

 

MEASURAND               Resistance

NOMINAL VALUE       10 kΩ

 

xi : relative difference between the result of measurement of laboratory i and that of the BIPM
ui : combined standard uncertainty of xi

  Labi xi
/ 10-8
ui
/ 10-8
measurement date
 (a) CEM -2.0 2.0 1996-06
  JV 1.2 6.7 1997-06
  NML(IE) 23 75 1998-04
  INPL -83 59 1998-12
  CMI 12 20 2000-04
  NML(IE) -1.0 54 2000-05
  NML(IE) 0.7 59 2002-03
 (a) EIM 7.3 3.5 2003-09
  NML(IE) 2.8 59 2004-04
  NML(IE) 28 46 2006-04
  INM(RO) -9.0 9.0 2006-05
 (a) CMI -2.8 3.5 2008-05
  NML(IE) 3.9 30 2008-11
 (a) NIMT 66 11 2009-04
 (a) GUM -3.7 3.4 2009-11
  NML(IE) 0.0 30 2010-10
 (a) KRISS -0.1 1.6 2011-03
  NPLI 13 14 2012-09
  BIM 0.6 15 2013-04
  NSAI NML 1.6 21 2014-12
  NIMT -31 37 2015-05
 (a) CMI -1.8 1.7 2015-10
  SMD 0.2 3.4 2017-02
  NMISA 52 30 2017-12
  NSAI NML 6.6 21 2018-06
 (a) NIM -0.1 1.6 2018-11
 (a) NMC A*STAR 1.6 1.8 2020-02
  EMI 1.7 9.7 2021-05
(a) INMETRO 2.6 1.8 2021-06
  NSAI NML 6.9 21 2021-08
  NPLI 30.6 8 2022-04
  CEM 2.0 3.4 2022-06
  INRIM -4.5 8.7 2022-12

 

(a) Institute using a quantum Hall resistance standard