BIPM.EM-K13 and SIM.EM-K1
MEASURAND Resistance
NOMINAL VALUE 1 Ω
Degrees of equivalence represented by Di = (xi - xR) / 1, for which (xi - xR ) and 1 are expressed in Ω, and its expanded uncertainty Ui at a 95 % level of confidence, both expressed in 10-8.
(a) Institute using a quantum Hall resistance standard
(b) Measurements traceable to a calculable capacitor
Only the most recent comparison of the series of bilaterals conducted in the framework of BIPM.EM-K13 is retained.
Enlarged graph
BIPM.EM-K13
MEASURAND Resistance
NOMINAL VALUE 10 kΩ
Degrees of equivalence represented by Di = (xi - xR) / 104, for which (xi - xR ) and 104 are expressed in Ω, and its expanded uncertainty Ui at a 95 % level of confidence, both expressed in 10-8.
(a) Institute using a quantum Hall resistance standard
Only the most recent comparison of the series of bilaterals conducted in the framework of BIPM.EM-K13 is retained.
Enlarged graph
BIPM.EM-K13 and SIM.EM-K1
MEASURAND Resistance
NOMINAL VALUE 1 Ω
Degrees of equivalence represented by Di = (xi - xR) / 1, for which (xi - xR ) and 1 are expressed in Ω, and its expanded uncertainty Ui at a 95 % level of confidence, both expressed in 10-8.
| LABi | Di | Uneg,i | Upos,i | |
|---|---|---|---|---|
10-8 |
10-8 |
10-8 |
||
| JV | 2.7 | 12 | ||
| INPL | 18 | 30 | ||
| KRISS (a) | 3.1 | 8.4 | ||
| INM | 7.0 | 26 | ||
| NIST (a) | -1.4 | 4.2 | ||
| NMIA (b) | -13 | 23 | ||
| GUM (a) | -6.2 | 8.6 | ||
| BIM | -18 | 17 | ||
| NIMT | -7.1 | 19 | ||
| CMI (a) | 0.3 | 4.6 | ||
| SMD | -5.0 | 8.2 | ||
| NMISA | -12 | 12 | ||
| NIM (a) | 1.0 | 3.4 | ||
| NMC A*STAR (a) | -1.2 | 6.4 | ||
| EMI | -5.7 | 40 | ||
| NSAI NML | -8.1 | 9.0 | ||
| INMETRO (a) | 1.0 | 6.8 | ||
| NPLI | 37 | 87 | ||
| CEM (a) | 5.6 | 10.6 | ||
| INRIM (a) | -7.4 | 13.4 | ||
| INTI | -8.8 | 10.2 | ||
| UTE | 5.2 | 118 | ||
| NRC (a) | -1.4 | 4.6 | ||
| CENAM (a) | 16.5 | 19.4 |
(a) Institute using a quantum Hall resistance standard
(b) Measurements traceable to a calculable capacitor
Only the most recent comparison of the series of bilaterals conducted in the framework of BIPM.EM-K13 is retained.
BIPM.EM-K13
MEASURAND Resistance
NOMINAL VALUE 10 kΩ
Degrees of equivalence represented by Di = (xi - xR) / 104, for which (xi - xR ) and 104 are expressed in Ω, and its expanded uncertainty Ui at a 95 % level of confidence, both expressed in 10-8.
| LABi | Di | Uneg,i | Upos,i | |
|---|---|---|---|---|
10-8 |
10-8 |
10-8 |
||
| JV | 1.2 | 13.4 | ||
| INPL | -83 | 118 | ||
| EIM (a) | 7.3 | 7.0 | ||
| INM | -9.0 | 18 | ||
| GUM (a) | -3.7 | 6.8 | ||
| KRISS (a) | -0.1 | 3.2 | ||
| BIM | 0.6 | 30.2 | ||
| NIMT | -31 | 74 | ||
| CMI (a) | -1.8 | 3.4 | ||
| SMD | 0.4 | 6.8 | ||
| NMISA | 52 | 60 | ||
| NIM (a) | -0.1 | 3.2 | ||
| NMC A*STAR (a) | 1.6 | 3.6 | ||
| EMI | 1.7 | 19.4 | ||
| NSAI NML | 6.9 | 42 | ||
| INMETRO (a) | 2.6 | 3.6 | ||
| NPLI | 31 | 16.6 | ||
| CEM (a) | 2.0 | 6.8 | ||
| INRIM (a) | -4.5 | 17.4 | ||
| UME (a) | 1.7 | 5.0 |
(a) Institute using a quantum Hall resistance standard
Only the most recent comparison of the series of bilaterals conducted in the framework of BIPM.EM-K13 is retained.
| Metrology area, Sub-field | Electricity and Magnetism, Resistance |
| Description | Comparison of resistance standards |
| Time of measurements | 2006 - 2007 |
| Status | Approved for equivalence |
| Final Reports of the comparisons | |
| Measurand | Resistance: 1 ohm |
| Transfer device | Two wire-wound resistors |
| Comparison type | Key Comparison |
| Consultative Committee | CCEM (Consultative Committee for Electricity and Magnetism) |
| Conducted by | SIM (Inter-American Metrology System) |
| Comments | SIM.EM-K1 results published on 14 January 2009, linked to those of BIPM.EM-K13.a BIPM key comparison of resistance, 1 ohm |
| Pilot institute |
NIST
National Institute of Standards and Technology United States |
| Contact person | R. Elmquist +1 301 975 6591 |
| Additional |
| Pilot laboratory | |
|---|---|
| NIST |
National Institute of Standards and Technology, United States, SIM |
| CENAM |
Centro Nacional de Metrologia, Mexico, SIM |
| INMETRO |
Instituto Nacional de Metrologia, Qualidade e Tecnologia, Brazil, SIM |
| INTI |
Instituto Nacional de Tecnologia Industrial, Argentina, SIM |
| NRC |
National Research Council, Canada, SIM |
| UTE |
Administración Nacional de Usinas y Transmisiones Eléctricas, Uruguay, SIM |
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BIPM.EM-K13 and SIM.EM-K1
MEASURAND Resistance
NOMINAL VALUE 1 Ω
The key comparison reference value xR is the BIPM value. Its standard uncertainty is evaluated to be uR = 1.5 × 10-8 and is included in ui .
For laboratories that base their measurements on a calculable capacitor, the uncertainty associated with the use of RK-90, 1 × 10-7, needs to be included in the ui. This is a consequence of the use of the QHR reference at BIPM. Further details can be found here.
The degree of equivalence of each laboratory with respect to the reference value is given by a pair of terms: Di = xi and its expanded uncertainty (k = 2), Ui = 2ui, both expressed in 10-8.
The degree of equivalence between two laboratories i and j may be calculated, taking into account the correlation introduced by the BIPM measurements.
Linking SIM.EM-K1 to BIPM.EM-K13
The linkage of SIM.EM-K1 results to those of BIPM.EM-K13 is ensured by NIST who participated in both comparisons. The detailed calculation of the linkage is explained in Appendix G of the SIM.EM-K1 Final Report.
BIPM.EM-K13
MEASURAND Resistance
NOMINAL VALUE 10 kΩ
The key comparison reference value xR is the BIPM value. Its standard uncertainty is evaluated to be uR = 1.5 × 10-8 and is included in ui .
The degree of equivalence of each laboratory with respect to the reference value is given by a pair of terms: Di = xi and its expanded uncertainty (k = 2), Ui = 2ui, both expressed in 10-8.
The degree of equivalence between two laboratories i and j may be calculated, taking into account the correlation introduced by the BIPM measurements.
BIPM.EM-K13 and SIM.EM-K1
MEASURAND Resistance
NOMINAL VALUE 1 Ω
BIPM.EM-K13
xi : relative difference between the result of measurement of laboratory i and that of the BIPM
ui : combined standard uncertainty of xi
| Labi | xi / 10-8 |
ui / 10-8 |
measurement date | |
| JV | 2.7 | 6.2 | 1997-06 | |
| NSAI NML | 3.0 | 20 | 1998-04 | |
| CMI | 11 | 10 | 1998-06 | |
| INPL | 18 | 15 | 1998-12 | |
| NSAI NML | -3.0 | 21 | 2000-04 | |
| NSAI NML | -7.0 | 23 | 2002-03 | |
| (a) | KRISS | 3.1 | 4.2 | 2003-06 |
| NSAI NML | -7.1 | 23 | 2004-04 | |
| NSAI NML | 0.0 | 19 | 2006-04 | |
| INM (RO) | 7.0 | 13 | 2006-04 | |
| (a) | NIST | -1.4 | 2.1 | 2007-08 |
| (a) | CMI | 4.0 | 3.1 | 2008-02 |
| NSAI NML | 4.2 | 5.4 | 2008-11 | |
| (b) | NMIA | -13 | 11 | 2008-11 |
| (a) | GUM | -6.2 | 4.3 | 2009-11 |
| NSAI NML | 10 | 5.7 | 2010-10 | |
| NPLI | 16 | 26 | 2012-09 | |
| BIM | -18 | 8.6 | 2013-04 | |
| NSAI NML | -6.7 | 8.1 | 2014-12 | |
| NIMT | -7.1 | 9.6 | 2015-05 | |
| (a) | CMI | 0.3 | 2.3 | 2015-10 |
| SMD | -5.3 | 4.0 | 2017-02 | |
| NMISA | -12 | 6.0 | 2017-12 | |
| NSAI NML | 2.6 | 8.6 | 2018-06 | |
| (a) | NIM | 1.0 | 1.7 | 2018-11 |
| (a) | NMC A*STAR | -1.2 | 3.2 | 2020-02 |
| EMI | -5.7 | 20 | 2020-05 | |
| (a) | INMETRO | 1.0 | 3.4 | 2021-06 |
| NSAI NML | -8.1 | 18 | 2021-08 | |
| NPLI | 36.0 | 43 | 2022-04 | |
| (a) | CEM | 5.6 | 5.3 | 2022-06 |
| (a) | INRIM | -7.4 | 6.7 | 2022-12 |
(a) Institute using a quantum Hall resistance standard
(b) Measurements traceable to a calculable capacitor
SIM.EM-K1
Individual measurements reported by laboratories participant in SIM.EM-K1 are given in Tables 6.1 and 6.2 for both of the transfer instruments: see on pages 13 and 14 of the SIM.EM-K1 Final Report. These are relative difference between the result of measurement of laboratory i and the nominal value 1 ohm.
Measurements were carried out between January 2006 and August 2007.
BIPM.EM-K13
MEASURAND Resistance
NOMINAL VALUE 10 kΩ
xi : relative difference between the result of measurement of laboratory i and that of the BIPM
ui : combined standard uncertainty of xi
| Labi | xi / 10-8 |
ui / 10-8 |
measurement date | |
| JV | 1.2 | 6.7 | 1997-06 | |
| INPL | -83 | 59 | 1998-12 | |
| (a) | EIM | 7.3 | 3.5 | 2003-09 |
| INM | -9.0 | 9.0 | 2006-05 | |
| (a) | GUM | -3.7 | 3.4 | 2009-11 |
| (a) | KRISS | -0.1 | 1.6 | 2011-03 |
| BIM | 0.6 | 15 | 2013-04 | |
| NIMT | -31 | 37 | 2015-05 | |
| (a) | CMI | -1.8 | 1.7 | 2015-10 |
| SMD | 0.2 | 3.4 | 2017-02 | |
| NMISA | 52 | 30 | 2017-12 | |
| (a) | NIM | -0.1 | 1.6 | 2018-11 |
| (a) | NMC A*STAR | 1.6 | 1.8 | 2020-02 |
| EMI | 1.7 | 9.7 | 2021-05 | |
| (a) | INMETRO | 2.6 | 1.8 | 2021-06 |
| NSAI NML | 6.9 | 21 | 2021-08 | |
| NPLI | 30.6 | 8 | 2022-04 | |
| (a) | CEM | 2.0 | 3.4 | 2022-06 |
| (a) | INRIM | -4.5 | 8.7 | 2022-12 |
| (a) | UME | 1.7 | 2.5 | 2025-02 |
(a) Institute using a quantum Hall resistance standard
