No graphs of equivalence are drawn up for supplementary comparisons.
No graphs of equivalence are drawn up for supplementary comparisons.
No degrees of equivalence are computed for supplementary comparisons.
No degrees of equivalence are computed for supplementary comparisons.
| Metrology area, Sub-field | Length, Dimensional Metrology |
| Description | Calibration of gauge blocks by inteferometry on measurement standards of length |
| Time of measurements | 2020 - 2022 |
| Status | Measurements in progress |
| Measurand | Length Nominal length 3; 30; 60; 100 mm |
| Parameters | Deviation of central length from nominal length |
| Transfer device | Steel gauge blocks |
| Comparison type | Supplementary Comparison |
| Consultative Committee | CCL (Consultative Committee for Length ) |
| Conducted by | COOMET (Euro-Asian Cooperation of National Metrological Institutions) |
| RMO Internal Identifier | COOMET 746/BY/18 |
| Pilot institute |
BelGIM
Belarussian State Institute for Metrology Belarus |
| Contact person | V. Makarevich +375 17 239 23 38 |
| Additional |
| Pilot laboratory | |
|---|---|
| BelGIM |
Belarussian State Institute for Metrology, Belarus, COOMET |
| KazStandard |
Kazakhstan Institute of Standardization and Metrology, Kazakhstan, COOMET |
| PTB |
Physikalisch-Technische Bundesanstalt, Germany, EURAMET |
| VNIIM |
D.I. Mendeleyev Institute for Metrology, Rosstandart, Russian Federation, COOMET |
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Supplementary comparison results are not interpreted in terms of equivalence.
Supplementary comparison results are not interpreted in terms of equivalence.
MEASURAND : Average pitch of grating, measured in central area (1 mm x 1 mm)
NOMINAL PITCH VALUE : P1 = 290 nm
xi1 : result of measurement carried out by laboratory i
ui1 : combined standard uncertainty of xi1 reported by laboratory i
xR1 : reference value for grating of nominal value P1, obtained from the weighted mean of the participant values xi1
uR1 : standard uncertainty of the reference value obtained from the reported standard uncertainties ui1
OD : Optical diffraction
SPM : Scanning probe methods
OM : Optical microscopy
MEASURAND : Average pitch of grating, measured in central area (1 mm x 1 mm)
NOMINAL PITCH VALUE : P2 = 700 nm
xi2 : result of measurement carried out by laboratory i
ui2 : combined standard uncertainty of xi2 reported by laboratory i
xR2 : reference value for grating of nominal value P2, obtained from the weighted mean of the participant values xi2
uR2 : standard uncertainty of the reference value obtained from the reported standard uncertainties ui2
OD : Optical diffraction
SPM : Scanning probe methods
OM : Optical microscopy
