MEASURAND : Spectral responsivity
WAVELENGTH : 900 nm

Degrees of equivalence relative to the key comparison reference value, Di and Ui its expanded uncertainty (k = 2), both expressed in %

MEASURAND : Spectral responsivity
WAVELENGTH : 950 nm

Degrees of equivalence relative to the key comparison reference value, Di and Ui its expanded uncertainty (k = 2), both expressed in %

MEASURAND : Spectral responsivity
WAVELENGTH : 1000 nm

Degrees of equivalence relative to the key comparison reference value, Di and Ui its expanded uncertainty (k = 2), both expressed in %

MEASURAND : Spectral responsivity
WAVELENGTH : 1050 nm

Degrees of equivalence relative to the key comparison reference value, Di and Ui its expanded uncertainty (k = 2), both expressed in %

MEASURAND : Spectral responsivity
WAVELENGTH : 1100 nm

Degrees of equivalence relative to the key comparison reference value, Di and Ui its expanded uncertainty (k = 2), both expressed in %

MEASURAND : Spectral responsivity
WAVELENGTH : 1150 nm

Degrees of equivalence relative to the key comparison reference value, Di and Ui its expanded uncertainty (k = 2), both expressed in %

MEASURAND : Spectral responsivity
WAVELENGTH : 1200 nm

Degrees of equivalence relative to the key comparison reference value, Di and Ui its expanded uncertainty (k = 2), both expressed in %

MEASURAND : Spectral responsivity
WAVELENGTH : 1250 nm

Degrees of equivalence relative to the key comparison reference value, Di and Ui its expanded uncertainty (k = 2), both expressed in %

MEASURAND : Spectral responsivity
WAVELENGTH : 1300 nm

Degrees of equivalence relative to the key comparison reference value, Di and Ui its expanded uncertainty (k = 2), both expressed in %

MEASURAND : Spectral responsivity
WAVELENGTH : 1350 nm

Degrees of equivalence relative to the key comparison reference value, Di and Ui its expanded uncertainty (k = 2), both expressed in %

MEASURAND : Spectral responsivity
WAVELENGTH : 1400 nm

Degrees of equivalence relative to the key comparison reference value, Di and Ui its expanded uncertainty (k = 2), both expressed in %

MEASURAND : Spectral responsivity
WAVELENGTH : 1450 nm

Degrees of equivalence relative to the key comparison reference value, Di and Ui its expanded uncertainty (k = 2), both expressed in %

MEASURAND : Spectral responsivity
WAVELENGTH : 1500 nm

Degrees of equivalence relative to the key comparison reference value, Di and Ui its expanded uncertainty (k = 2), both expressed in %

MEASURAND : Spectral responsivity
WAVELENGTH : 1550 nm

Degrees of equivalence relative to the key comparison reference value, Di and Ui its expanded uncertainty (k = 2), both expressed in %

MEASURAND : Spectral responsivity
WAVELENGTH : 1600 nm

Degrees of equivalence relative to the key comparison reference value, Di and Ui its expanded uncertainty (k = 2), both expressed in %

MEASURAND : Spectral responsivity
WAVELENGTH : 900 nm

   
Lab iDiUi
 / %/ %
LNE-1.30.6
NMISA0.12.6
NMIA-0.80.4
HUT-0.43.1
IFA-CSIC1.91.3
KRISS0.10.8
NIM3.51.4
NIST0.00.4
VSL0.71.2
NPL0.40.4
NRC0.70.4
MKEH0.02.8
PTB-0.10.4
SMU0.10.6
VNIIOFI0.31.2

Results are presented under A4 printable format in Summary Results (.PDF file).

Unless otherwise stated, in the final numbers presented here, rounding has been applied according to ISO-31-0 Annex B Rule B.

MEASURAND : Spectral responsivity
WAVELENGTH : 950 nm

   
Lab iDiUi
 / %/ %
LNE-1.20.5
NMISA0.12.6
NMIA-0.30.3
HUT0.93.6
IFA-CSIC1.51.2
KRISS0.10.8
NIM1.30.9
NIST0.11.3
VSL0.20.9
NPL0.50.3
NRC0.00.3
MKEH-0.42.8
PTB-0.20.3
SMU0.50.5
VNIIOFI-1.01.0

Results are presented under A4 printable format in Summary Results (.PDF file).

Unless otherwise stated, in the final numbers presented here, rounding has been applied according to ISO-31-0 Annex B Rule B.

MEASURAND : Spectral responsivity
WAVELENGTH : 1000 nm

   
Lab iDiUi
 / %/ %
LNE-1.10.5
NMISA0.12.6
NMIA-0.40.3
HUT-0.13.5
IFA-CSIC1.31.2
KRISS0.30.8
NIM1.30.9
NIST-0.20.9
VSL0.50.9
NPL0.10.3
NRC0.10.2
MKEH-0.22.8
PTB0.10.3
SMU0.40.4
VNIIOFI-0.81.1

Results are presented under A4 printable format in Summary Results (.PDF file).

Unless otherwise stated, in the final numbers presented here, rounding has been applied according to ISO-31-0 Annex B Rule B.

MEASURAND : Spectral responsivity
WAVELENGTH : 1050 nm

   
Lab iDiUi
 / %/ %
LNE-1.10.5
NMISA0.22.2
NMIA-0.30.3
HUT0.53.5
IFA-CSIC1.51.2
KRISS0.01.0
NIM0.80.8
NIST0.20.9
VSL0.30.8
NPL0.10.3
NRC0.10.2
MKEH0.63.5
PTB0.10.3
SMU0.20.4
VNIIOFI-0.91.3

Results are presented under A4 printable format in Summary Results (.PDF file).

Unless otherwise stated, in the final numbers presented here, rounding has been applied according to ISO-31-0 Annex B Rule B.

MEASURAND : Spectral responsivity
WAVELENGTH : 1100 nm

   
Lab iDiUi
 / %/ %
LNE-1.00.5
NMISA-0.12.2
NMIA-0.30.3
HUT-0.13.5
IFA-CSIC1.51.2
KRISS0.11.0
NIM0.30.9
NIST0.00.5
VSL0.30.6
NPL0.20.3
NRC0.00.2
MKEH0.83.3
PTB0.10.3
SMU0.20.4
VNIIOFI-1.21.1

Results are presented under A4 printable format in Summary Results (.PDF file).

Unless otherwise stated, in the final numbers presented here, rounding has been applied according to ISO-31-0 Annex B Rule B.

MEASURAND : Spectral responsivity
WAVELENGTH : 1150 nm

   
Lab iDiUi
 / %/ %
LNE-1.00.5
NMISA0.32.2
NMIA-0.10.3
HUT0.23.5
IFA-CSIC1.41.2
KRISS0.11.0
NIM0.00.8
NIST0.10.8
VSL0.20.5
NPL0.20.3
NRC0.00.2
MKEH0.73.5
PTB0.20.2
SMU0.20.4
VNIIOFI-1.51.1

Results are presented under A4 printable format in Summary Results (.PDF file).

Unless otherwise stated, in the final numbers presented here, rounding has been applied according to ISO-31-0 Annex B Rule B.

MEASURAND : Spectral responsivity
WAVELENGTH : 1200 nm

   
Lab iDiUi
 / %/ %
LNE-0.70.5
NMISA0.02.2
NMIA-0.30.2
HUT0.43.5
IFA-CSIC1.61.2
KRISS0.11.0
NIM-0.30.9
NIST0.01.5
VSL0.10.5
NPL0.30.3
NRC-0.10.2
MKEH0.73.4
PTB0.20.2
SMU0.20.4
VNIIOFI-1.91.1

Results are presented under A4 printable format in Summary Results (.PDF file).

Unless otherwise stated, in the final numbers presented here, rounding has been applied according to ISO-31-0 Annex B Rule B.

MEASURAND : Spectral responsivity
WAVELENGTH : 1250 nm

   
Lab iDiUi
 / %/ %
LNE-0.80.5
NMISA0.12.0
NMIA-0.40.2
HUT0.03.5
IFA-CSIC1.51.2
KRISS0.01.0
NIM-0.40.8
NIST0.10.9
VSL0.20.4
NPL0.20.3
NRC0.00.2
MKEH0.33.4
PTB0.30.2
SMU0.20.4
VNIIOFI-2.01.1

Results are presented under A4 printable format in Summary Results (.PDF file).

Unless otherwise stated, in the final numbers presented here, rounding has been applied according to ISO-31-0 Annex B Rule B.

MEASURAND : Spectral responsivity
WAVELENGTH : 1300 nm

   
Lab iDiUi
 / %/ %
LNE-0.80.5
NMISA0.22.0
NMIA-0.30.2
HUT0.03.5
IFA-CSIC1.51.2
KRISS0.21.0
NIM-0.30.8
NIST0.10.9
VSL0.20.4
NPL0.20.3
NRC0.00.1
MKEH0.53.4
PTB0.10.2
SMU0.20.4
VNIIOFI-2.21.1

Results are presented under A4 printable format in Summary Results (.PDF file).

Unless otherwise stated, in the final numbers presented here, rounding has been applied according to ISO-31-0 Annex B Rule B.

MEASURAND : Spectral responsivity
WAVELENGTH : 1350 nm

   
Lab iDiUi
 / %/ %
LNE-0.60.5
NMISA0.82.0
NMIA-0.20.2
HUT0.53.5
IFA-CSIC1.41.2
KRISS-0.11.0
NIM-0.50.8
NIST0.30.9
VSL0.10.4
NPL0.30.3
NRC0.00.2
MKEH0.53.4
PTB0.20.2
SMU0.10.4
VNIIOFI-2.61.1

Results are presented under A4 printable format in Summary Results (.PDF file).

Unless otherwise stated, in the final numbers presented here, rounding has been applied according to ISO-31-0 Annex B Rule B.

MEASURAND : Spectral responsivity
WAVELENGTH : 1400 nm

   
Lab iDiUi
 / %/ %
LNE-0.60.5
NMISA1.02.0
NMIA-0.30.3
HUT-0.23.5
IFA-CSIC1.41.1
KRISS-0.11.0
NIM-0.50.8
NIST0.51.2
VSL0.20.4
NPL0.20.3
NRC0.00.2
MKEH0.83.3
PTB0.20.2
SMU0.10.4
VNIIOFI-1.21.1

Results are presented under A4 printable format in Summary Results (.PDF file).

Unless otherwise stated, in the final numbers presented here, rounding has been applied according to ISO-31-0 Annex B Rule B.

MEASURAND : Spectral responsivity
WAVELENGTH : 1450 nm

   
Lab iDiUi
 / %/ %
LNE-0.80.5
NMISA1.42.0
NMIA-0.30.2
HUT-0.13.5
IFA-CSIC1.51.2
KRISS0.11.0
NIM-0.70.9
NIST0.60.9
VSL0.20.4
NPL0.20.4
NRC0.20.2
MKEH0.93.4
PTB0.00.2
SMU0.20.4
VNIIOFI-2.81.1

Results are presented under A4 printable format in Summary Results (.PDF file).

Unless otherwise stated, in the final numbers presented here, rounding has been applied according to ISO-31-0 Annex B Rule B.

MEASURAND : Spectral responsivity
WAVELENGTH : 1500 nm

   
Lab iDiUi
 / %/ %
LNE-0.70.5
NMISA1.72.0
NMIA-0.30.3
HUT0.13.5
IFA-CSIC1.31.2
KRISS0.31.0
NIM-0.71.0
NIST0.91.0
VSL0.30.4
NPL0.30.3
NRC0.10.2
MKEH0.63.4
PTB0.10.2
SMU0.10.4
VNIIOFI-3.21.2

Results are presented under A4 printable format in Summary Results (.PDF file).

Unless otherwise stated, in the final numbers presented here, rounding has been applied according to ISO-31-0 Annex B Rule B.

MEASURAND : Spectral responsivity
WAVELENGTH : 1550 nm

   
Lab iDiUi
 / %/ %
LNE-0.70.5
NMISA2.42.0
NMIA-0.40.3
HUT-0.13.5
IFA-CSIC1.41.2
KRISS0.01.0
NIM-0.91.1
NIST0.51.1
VSL0.30.8
NPL0.20.3
NRC0.10.2
MKEH-2.75.3
PTB0.30.2
SMU0.30.4
VNIIOFI-3.61.2

Results are presented under A4 printable format in Summary Results (.PDF file).

Unless otherwise stated, in the final numbers presented here, rounding has been applied according to ISO-31-0 Annex B Rule B.

MEASURAND : Spectral responsivity
WAVELENGTH : 1600 nm

   
Lab iDiUi
 / %/ %
LNE-0.60.5
NMISA3.22.0
NMIA-0.30.3
HUT-0.63.5
IFA-CSIC1.61.2
KRISS0.31.1
NIM-0.91.2
NIST0.71.3
VSL0.41.4
NPL0.20.4
NRC0.40.2
MKEH-2.06.0
PTB0.40.3
SMU0.20.4
VNIIOFI-4.01.1

Results are presented under A4 printable format in Summary Results (.PDF file).

Unless otherwise stated, in the final numbers presented here, rounding has been applied according to ISO-31-0 Annex B Rule B.

Comparison
Comparison close
CC comparison
Linked comparison
CCPR-K2.a
Metrology area, Sub-field Photometry and Radiometry, Radiometry
Description Spectral responsivity
Time of measurements 1999 - 2001
Status Approved for equivalence
Final Reports of the comparisons
References

CCPR-K2.a Technical Protocol

Measurand Spectral responsivity
Parameters Wavelength from 900 nm to 1600 nm
Transfer device InGaAs photodiodes
Comparison type Key Comparison
Consultative Committee CCPR (Consultative Committee for Photometry and Radiometry)
Conducted by CCPR (Consultative Committee for Photometry and Radiometry)
Comments

Results published on 14 January 2010

Spectral responsivity

Pilot institute NIST
National Institute of Standards and Technology
United States
Contact person S. Brown
steven.brown@nist.gov
+1 301 975 5167
First Name Last Name
wwww@ww.www +356719836 Institute 1 Institute 1 Khmelnitskiy
Pilot laboratory
NIST

National Institute of Standards and Technology, United States, SIM

HUT

Helsinki University of Technology, Finland, EURAMET

IFA-CSIC

Instituto de Fisica Aplicada - Consejo Superior de Investigaciones Cientificas, now IO-CSIC, Instituto de Optica Daza de Valdés, Spain, EURAMET

KRISS

Korea Research Institute of Standards and Science, Korea, Republic of, APMP

LNE

Laboratoire national de métrologie et d'essais, France, EURAMET

MKEH

Hungarian Trade Licensing Office; now BFKH, Hungary, EURAMET

NIM

National Institute of Metrology, China, APMP

NMIA

National Measurement Institute, Australia, Australia, APMP

NMISA

National Metrology Institute of South Africa, South Africa, AFRIMETS

NPL

National Physical Laboratory, United Kingdom, EURAMET

NRC

National Research Council, Canada, SIM

PTB

Physikalisch-Technische Bundesanstalt, Germany, EURAMET

SMU

Slovensky Metrologicky Ustav, Slovakia, EURAMET

VNIIOFI

All-Russian Scientific Institute for Optical and Physical Measurements, Rosstandart, Russian Federation, COOMET

VSL

VSL, Netherlands, EURAMET

MEASURAND : Spectral responsivity
WAVELENGTH : 900 nm

The key comparison reference value is calculated as a weighted mean with cut-off, excluding NMISA and KRISS results (see on page 80 of Section 7 of the CCPR-K2.a Final Report).
The value of the cut-off varies with the wavelength and is listed in table 7.17 on page 83 of the Final Report.

The degree of equivalence of each laboratory i with respect to the key comparison reference value is given by a pair of terms: 
Di and Ui, its expanded uncertainty (k = 2), both expressed in %.

The degree of equivalence between two laboratories is given by a pair of terms:
Dij and Uij, its expanded uncertainty (k = 2), both expressed in %.

MEASURAND : Spectral responsivity
WAVELENGTH : 950 nm

The key comparison reference value is calculated as a weighted mean with cut-off, excluding NMISA and KRISS results (see on page 80 of Section 7 of the CCPR-K2.a Final Report).
The value of the cut-off varies with the wavelength and is listed in table 7.17 on page 83 of the Final Report.

The degree of equivalence of each laboratory i with respect to the key comparison reference value is given by a pair of terms:
Di and Ui, its expanded uncertainty (k = 2), both expressed in %.

The degree of equivalence between two laboratories is given by a pair of terms:
Dij and Uij, its expanded uncertainty (k = 2), both expressed in %.

MEASURAND : Spectral responsivity
WAVELENGTH : 1000 nm

The key comparison reference value is calculated as a weighted mean with cut-off, excluding NMISA and KRISS results (see on page 80 of Section 7 of the CCPR-K2.a Final Report).
The value of the cut-off varies with the wavelength and is listed in table 7.17 on page 83 of the Final Report.

The degree of equivalence of each laboratory i with respect to the key comparison reference value is given by a pair of terms:
Di and Ui, its expanded uncertainty (k = 2), both expressed in %.

The degree of equivalence between two laboratories is given by a pair of terms:
Dij and Uij, its expanded uncertainty (k = 2), both expressed in %.

MEASURAND : Spectral responsivity
WAVELENGTH : 1050 nm

The key comparison reference value is calculated as a weighted mean with cut-off, excluding NMISA and KRISS results (see on page 80 of Section 7 of the CCPR-K2.a Final Report).
The value of the cut-off varies with the wavelength and is listed in table 7.17 on page 83 of the Final Report.

The degree of equivalence of each laboratory i with respect to the key comparison reference value is given by a pair of terms:
Di and Ui, its expanded uncertainty (k = 2), both expressed in %.

The degree of equivalence between two laboratories is given by a pair of terms:
Dij and Uij, its expanded uncertainty (k = 2), both expressed in %.

MEASURAND : Spectral responsivity
WAVELENGTH : 1100 nm

The key comparison reference value is calculated as a weighted mean with cut-off, excluding NMISA and KRISS results (see on page 80 of Section 7 of the CCPR-K2.a Final Report).
The value of the cut-off varies with the wavelength and is listed in table 7.17 on page 83 of the Final Report.

The degree of equivalence of each laboratory i with respect to the key comparison reference value is given by a pair of terms:
Di and Ui, its expanded uncertainty (k = 2), both expressed in %.

The degree of equivalence between two laboratories is given by a pair of terms:
Dij and Uij, its expanded uncertainty (k = 2), both expressed in %.

MEASURAND : Spectral responsivity
WAVELENGTH : 1150 nm

The key comparison reference value is calculated as a weighted mean with cut-off, excluding NMISA and KRISS results (see on page 80 of Section 7 of the CCPR-K2.a Final Report).
The value of the cut-off varies with the wavelength and is listed in table 7.17 on page 83 of the Final Report.

The degree of equivalence of each laboratory i with respect to the key comparison reference value is given by a pair of terms:
Di and Ui, its expanded uncertainty (k = 2), both expressed in %.

The degree of equivalence between two laboratories is given by a pair of terms:
Dij and Uij, its expanded uncertainty (k = 2), both expressed in %.

MEASURAND : Spectral responsivity
WAVELENGTH : 1200 nm

The key comparison reference value is calculated as a weighted mean with cut-off, excluding NMISA and KRISS results (see on page 80 of Section 7 of the CCPR-K2.a Final Report).
The value of the cut-off varies with the wavelength and is listed in table 7.17 on page 83 of the Final Report.

The degree of equivalence of each laboratory i with respect to the key comparison reference value is given by a pair of terms:
Di and Ui, its expanded uncertainty (k = 2), both expressed in %.

The degree of equivalence between two laboratories is given by a pair of terms:
Dij and Uij, its expanded uncertainty (k = 2), both expressed in %.

MEASURAND : Spectral responsivity
WAVELENGTH : 1250 nm

The key comparison reference value is calculated as a weighted mean with cut-off, excluding NMISA and KRISS results (see on page 80 of Section 7 of the CCPR-K2.a Final Report).
The value of the cut-off varies with the wavelength and is listed in table 7.17 on page 83 of the Final Report.

The degree of equivalence of each laboratory i with respect to the key comparison reference value is given by a pair of terms:
Di and Ui, its expanded uncertainty (k = 2), both expressed in %.

The degree of equivalence between two laboratories is given by a pair of terms:
Dij and Uij, its expanded uncertainty (k = 2), both expressed in %.

MEASURAND : Spectral responsivity
WAVELENGTH : 1300 nm

The key comparison reference value is calculated as a weighted mean with cut-off, excluding NMISA and KRISS results (see on page 80 of Section 7 of the CCPR-K2.a Final Report).
The value of the cut-off varies with the wavelength and is listed in table 7.17 on page 83 of the Final Report.

The degree of equivalence of each laboratory i with respect to the key comparison reference value is given by a pair of terms:
Di and Ui, its expanded uncertainty (k = 2), both expressed in %.

The degree of equivalence between two laboratories is given by a pair of terms:
Dij and Uij, its expanded uncertainty (k = 2), both expressed in %.

MEASURAND : Spectral responsivity
WAVELENGTH : 1350 nm

The key comparison reference value is calculated as a weighted mean with cut-off, excluding NMISA and KRISS results (see on page 80 of Section 7 of the CCPR-K2.a Final Report).
The value of the cut-off varies with the wavelength and is listed in table 7.17 on page 83 of the Final Report.

The degree of equivalence of each laboratory i with respect to the key comparison reference value is given by a pair of terms:
Di and Ui, its expanded uncertainty (k = 2), both expressed in %.

The degree of equivalence between two laboratories is given by a pair of terms:
Dij and Uij, its expanded uncertainty (k = 2), both expressed in %.

MEASURAND : Spectral responsivity
WAVELENGTH : 1400 nm

The key comparison reference value is calculated as a weighted mean with cut-off, excluding NMISA and KRISS results (see on page 80 of Section 7 of the CCPR-K2.a Final Report).
The value of the cut-off varies with the wavelength and is listed in table 7.17 on page 83 of the Final Report.

The degree of equivalence of each laboratory i with respect to the key comparison reference value is given by a pair of terms:
Di and Ui, its expanded uncertainty (k = 2), both expressed in %.

The degree of equivalence between two laboratories is given by a pair of terms:
Dij and Uij, its expanded uncertainty (k = 2), both expressed in %.

MEASURAND : Spectral responsivity
WAVELENGTH : 1450 nm

The key comparison reference value is calculated as a weighted mean with cut-off, excluding NMISA and KRISS results (see on page 80 of Section 7 of the CCPR-K2.a Final Report).
The value of the cut-off varies with the wavelength and is listed in table 7.17 on page 83 of the Final Report.

The degree of equivalence of each laboratory i with respect to the key comparison reference value is given by a pair of terms:
Di and Ui, its expanded uncertainty (k = 2), both expressed in %.

The degree of equivalence between two laboratories is given by a pair of terms:
Dij and Uij, its expanded uncertainty (k = 2), both expressed in %.

MEASURAND : Spectral responsivity
WAVELENGTH : 1500 nm

The key comparison reference value is calculated as a weighted mean with cut-off, excluding NMISA and KRISS results (see on page 80 of Section 7 of the CCPR-K2.a Final Report).
The value of the cut-off varies with the wavelength and is listed in table 7.17 on page 83 of the Final Report.

The degree of equivalence of each laboratory i with respect to the key comparison reference value is given by a pair of terms:
Di and Ui, its expanded uncertainty (k = 2), both expressed in %.

The degree of equivalence between two laboratories is given by a pair of terms:
Dij and Uij, its expanded uncertainty (k = 2), both expressed in %.

MEASURAND : Spectral responsivity
WAVELENGTH : 1550 nm

The key comparison reference value is calculated as a weighted mean with cut-off, excluding NMISA and KRISS results (see on page 80 of Section 7 of the CCPR-K2.a Final Report).
The value of the cut-off varies with the wavelength and is listed in table 7.17 on page 83 of the Final Report.

The degree of equivalence of each laboratory i with respect to the key comparison reference value is given by a pair of terms:
Di and Ui, its expanded uncertainty (k = 2), both expressed in %.

The degree of equivalence between two laboratories is given by a pair of terms:
Dij and Uij, its expanded uncertainty (k = 2), both expressed in %.

MEASURAND : Spectral responsivity
WAVELENGTH : 1600 nm

The key comparison reference value is calculated as a weighted mean with cut-off, excluding NMISA and KRISS results (see on page 80 of Section 7 of the CCPR-K2.a Final Report).
The value of the cut-off varies with the wavelength and is listed in table 7.17 on page 83 of the Final Report.

The degree of equivalence of each laboratory i with respect to the key comparison reference value is given by a pair of terms:
Di and Ui, its expanded uncertainty (k = 2), both expressed in %.

The degree of equivalence between two laboratories is given by a pair of terms:
Dij and Uij, its expanded uncertainty (k = 2), both expressed in %.

MEASURAND : Spectral responsivity
WAVELENGTH : 900 nm

The individual measurements of the participating laboratories are given in Section 4 of the CCPR-K2.a Final Report.
Examination and correction of the data are explained in Section 5.
The data analysis in given in Section 6 and is based on the calculation of the mean relative differences between each participant and the Pilot Laboratory, NIST, weighted by the transfer uncertainty of the measurements of each photodiode.

MEASURAND : Spectral responsivity
WAVELENGTH : 950 nm

The individual measurements of the participating laboratories are given in Section 4 of the CCPR-K2.a Final Report.
Examination and correction of the data are explained in Section 5.
The data analysis in given in Section 6 and is based on the calculation of the mean relative differences between each participant and the Pilot Laboratory, NIST, weighted by the transfer uncertainty of the measurements of each photodiode.

MEASURAND : Spectral responsivity
WAVELENGTH : 1000 nm

The individual measurements of the participating laboratories are given in Section 4 of the CCPR-K2.a Final Report.
Examination and correction of the data are explained in Section 5.
The data analysis in given in Section 6 and is based on the calculation of the mean relative differences between each participant and the Pilot Laboratory, NIST, weighted by the transfer uncertainty of the measurements of each photodiode.

MEASURAND : Spectral responsivity
WAVELENGTH : 1050 nm

The individual measurements of the participating laboratories are given in Section 4 of the CCPR-K2.a Final Report.
Examination and correction of the data are explained in Section 5.
The data analysis in given in Section 6 and is based on the calculation of the mean relative differences between each participant and the Pilot Laboratory, NIST, weighted by the transfer uncertainty of the measurements of each photodiode.

MEASURAND : Spectral responsivity
WAVELENGTH : 1100 nm

The individual measurements of the participating laboratories are given in Section 4 of the CCPR-K2.a Final Report.
Examination and correction of the data are explained in Section 5.
The data analysis in given in Section 6 and is based on the calculation of the mean relative differences between each participant and the Pilot Laboratory, NIST, weighted by the transfer uncertainty of the measurements of each photodiode.

MEASURAND : Spectral responsivity
WAVELENGTH : 1150 nm

The individual measurements of the participating laboratories are given in Section 4 of the CCPR-K2.a Final Report.
Examination and correction of the data are explained in Section 5.
The data analysis in given in Section 6 and is based on the calculation of the mean relative differences between each participant and the Pilot Laboratory, NIST, weighted by the transfer uncertainty of the measurements of each photodiode.

MEASURAND : Spectral responsivity
WAVELENGTH : 1200 nm

The individual measurements of the participating laboratories are given in Section 4 of the CCPR-K2.a Final Report.
Examination and correction of the data are explained in Section 5.
The data analysis in given in Section 6 and is based on the calculation of the mean relative differences between each participant and the Pilot Laboratory, NIST, weighted by the transfer uncertainty of the measurements of each photodiode.

MEASURAND : Spectral responsivity
WAVELENGTH : 1250 nm

The individual measurements of the participating laboratories are given in Section 4 of the CCPR-K2.a Final Report.
Examination and correction of the data are explained in Section 5.
The data analysis in given in Section 6 and is based on the calculation of the mean relative differences between each participant and the Pilot Laboratory, NIST, weighted by the transfer uncertainty of the measurements of each photodiode.

MEASURAND : Spectral responsivity
WAVELENGTH : 1300 nm

The individual measurements of the participating laboratories are given in Section 4 of the CCPR-K2.a Final Report.
Examination and correction of the data are explained in Section 5.
The data analysis in given in Section 6 and is based on the calculation of the mean relative differences between each participant and the Pilot Laboratory, NIST, weighted by the transfer uncertainty of the measurements of each photodiode.

MEASURAND : Spectral responsivity
WAVELENGTH : 1350 nm

The individual measurements of the participating laboratories are given in Section 4 of the CCPR-K2.a Final Report.
Examination and correction of the data are explained in Section 5.
The data analysis in given in Section 6 and is based on the calculation of the mean relative differences between each participant and the Pilot Laboratory, NIST, weighted by the transfer uncertainty of the measurements of each photodiode.

MEASURAND : Spectral responsivity
WAVELENGTH : 1400 nm

The individual measurements of the participating laboratories are given in Section 4 of the CCPR-K2.a Final Report.
Examination and correction of the data are explained in Section 5.
The data analysis in given in Section 6 and is based on the calculation of the mean relative differences between each participant and the Pilot Laboratory, NIST, weighted by the transfer uncertainty of the measurements of each photodiode.

MEASURAND : Spectral responsivity
WAVELENGTH : 1450 nm

The individual measurements of the participating laboratories are given in Section 4 of the CCPR-K2.a Final Report.
Examination and correction of the data are explained in Section 5.
The data analysis in given in Section 6 and is based on the calculation of the mean relative differences between each participant and the Pilot Laboratory, NIST, weighted by the transfer uncertainty of the measurements of each photodiode.

MEASURAND : Spectral responsivity
WAVELENGTH : 1500 nm

The individual measurements of the participating laboratories are given in Section 4 of the CCPR-K2.a Final Report.
Examination and correction of the data are explained in Section 5.
The data analysis in given in Section 6 and is based on the calculation of the mean relative differences between each participant and the Pilot Laboratory, NIST, weighted by the transfer uncertainty of the measurements of each photodiode.

MEASURAND : Spectral responsivity
WAVELENGTH : 1550 nm

The individual measurements of the participating laboratories are given in Section 4 of the CCPR-K2.a Final Report.
Examination and correction of the data are explained in Section 5.
The data analysis in given in Section 6 and is based on the calculation of the mean relative differences between each participant and the Pilot Laboratory, NIST, weighted by the transfer uncertainty of the measurements of each photodiode.

MEASURAND : Spectral responsivity
WAVELENGTH : 1600 nm

The individual measurements of the participating laboratories are given in Section 4 of the CCPR-K2.a Final Report.
Examination and correction of the data are explained in Section 5.
The data analysis in given in Section 6 and is based on the calculation of the mean relative differences between each participant and the Pilot Laboratory, NIST, weighted by the transfer uncertainty of the measurements of each photodiode.