Comparison Display

CCL-K3.n01

MEASURAND Pitch angle deviation

ARTEFACT 10-sided polygon, serial number 31391.15

Degrees of equivalence represented by D_i = (x_i - x_R) and its expanded uncertainty U_i at a 95 % level of confidence, both expressed in ″ (arcsecond).

Angle 1:2

10-sided polygon: Face 1 to Face 2

D_i / ″

Participating institutes

Angle 2:3

10-sided polygon: Face 2 to Face 3

D_i / ″

Participating institutes

Angle 3:4

10-sided polygon: Face 3 to Face 4

D_i / ″

Participating institutes

Angle 4:5

10-sided polygon: Face 4 to Face 5

D_i / ″

Participating institutes

Angle 5:6

10-sided polygon: Face 5 to Face 6

D_i / ″

Participating institutes

Angle 6:7

10-sided polygon: Face 6 to Face 7

D_i / ″

Participating institutes

Angle 7:8

10-sided polygon: Face 7 to Face 8

D_i / ″

Participating institutes

Angle 8:9

10-sided polygon: Face 8 to Face 9

D_i / ″

Participating institutes

Angle 9:10

10-sided polygon: Face 9 to Face 10

D_i / ″

Participating institutes

Angle 10:1

10-sided polygon: Face 10 to Face 1

D_i / ″

Participating institutes

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CCL-K3.n01

MEASURAND Pitch angle deviation

ARTEFACT 12-sided polygon, serial number 327

Degrees of equivalence represented by D_i = (x_i - x_R) and its expanded uncertainty U_i at a 95 % level of confidence, both expressed in ″ (arcsecond).

Angle 1:2

12-sided polygon: Face 1 to Face 2

D_i / ″

Participating institutes

Angle 2:3

12-sided polygon: Face 2 to Face 3

D_i / ″

Participating institutes

Angle 3:4

12-sided polygon: Face 3 to Face 4

D_i / ″

Participating institutes

Angle 4:5

12-sided polygon: Face 4 to Face 5

D_i / ″

Participating institutes

Angle 5:6

12-sided polygon: Face 5 to Face 6

D_i / ″

Participating institutes

Angle 6:7

12-sided polygon: Face 6 to Face 7

D_i / ″

Participating institutes

Angle 7:8

12-sided polygon: Face 7 to Face 8

D_i / ″

Participating institutes

Angle 8:9

12-sided polygon: Face 8 to Face 9

D_i / ″

Participating institutes

Angle 9:10

12-sided polygon: Face 9 to Face 10

D_i / ″

Participating institutes

Angle 10:11

12-sided polygon: Face 10 to Face 11

D_i / ″

Participating institutes

Angle 11:12

12-sided polygon: Face 11 to Face 12

D_i / ″

Participating institutes

Angle 12:1

12-sided polygon: Face 12 to Face 1

D_i / ″

Participating institutes

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CCL-K3.n01

MEASURAND Pitch angle deviation

ARTEFACT 10-sided polygon, serial number 31391.15

Degrees of equivalence represented by D_i = (x_i - x_R) and its expanded uncertainty U_i at a 95 % level of confidence, both expressed in ″ (arcsecond).

Angle 1:2

LAB_i	D_i	U_neg,i	U_pos,i
	″	″	″
NRC	0.001	0.049
INRIM	-0.001	0.065
NIM	-0.007	0.056
NMIJ	-0.007	0.054
CENAM	0.001	0.096
UME	0.001	0.117
CEM	-0.009	0.158
KRISS	-0.015	0.103
NMC, A*STAR	0.281	0.399
INMETRO	0.121	0.198

Participating institutes

CCL-K3.n01

Angle 2:3

LAB_i	D_i	U_neg,i	U_pos,i
	″	″	″
NRC	0.001	0.049
INRIM	-0.001	0.065
NIM	-0.007	0.056
NMIJ	-0.007	0.054
CENAM	0.001	0.096
UME	0.001	0.117
CEM	-0.009	0.158
KRISS	-0.015	0.103
NMC, A*STAR	0.281	0.399
INMETRO	0.121	0.198

Participating institutes

CCL-K3.n01

Angle 3:4

LAB_i	D_i	U_neg,i	U_pos,i
	″	″	″
NRC	0.012	0.050
INRIM	-0.005	0.065
NIM	-0.010	0.057
NMIJ	0.001	0.039
CENAM	-0.008	0.097
UME	0.011	0.117
CEM	-0.008	0.158
KRISS	0.015	0.103
NMC, A*STAR	-0.068	0.399
INMETRO	-0.058	0.198

Participating institutes

CCL-K3.n01

Angle 4:5

LAB_i	D_i	U_neg,i	U_pos,i
	″	″	″
NRC	-0.006	0.049
INRIM	-0.023	0.065
NIM	0.003	0.056
NMIJ	0.008	0.056
CENAM	0.004	0.096
UME	-0.014	0.117
CEM	-0.016	0.158
KRISS	0.004	0.103
NMC, A*STAR	0.474	0.399
INMETRO	0.054	0.198

Participating institutes

CCL-K3.n01

Angle 5:6

LAB_i	D_i	U_neg,i	U_pos,i
	″	″	″
NRC	-0.005	0.049
INRIM	0.017	0.064
NIM	0.003	0.055
NMIJ	0.004	0.071
CENAM	0.016	0.096
UME	0.002	0.117
CEM	0.006	0.158
KRISS	-0.016	0.102
NMC, A*STAR	-0.574	0.399
INMETRO	0.006	0.198

Participating institutes

CCL-K3.n01

Angle 6:7

LAB_i	D_i	U_neg,i	U_pos,i
	″	″	″
NRC	0.014	0.049
INRIM	-0.006	0.064
NIM	0.003	0.056
NMIJ	-0.004	0.060
CENAM	-0.018	0.096
UME	-0.010	0.117
CEM	-0.008	0.158
KRISS	-0.003	0.104
NMC, A*STAR	0.282	0.399
INMETRO	-0.048	0.198

Participating institutes

CCL-K3.n01

Angle 7:8

LAB_i	D_i	U_neg,i	U_pos,i
	″	″	″
NRC	-0.016	0.050
INRIM	0.015	0.065
NIM	-0.002	0.056
NMIJ	0.005	0.043
CENAM	-0.016	0.097
UME	0.039	0.117
CEM	-0.006	0.158
KRISS	0.006	0.103
NMC, A*STAR	-0.136	0.399
INMETRO	0.024	0.198

Participating institutes

CCL-K3.n01

Angle 8:9

LAB_i	D_i	U_neg,i	U_pos,i
	″	″	″
NRC	0.007	0.051
INRIM	-0.005	0.066
NIM	-0.006	0.057
NMIJ	-0.005	0.032
CENAM	0.018	0.097
UME	-0.017	0.118
CEM	0.028	0.158
KRISS	0.011	0.105
NMC, A*STAR	0.148	0.399
INMETRO	0.018	0.199

Participating institutes

CCL-K3.n01

Angle 9:10

LAB_i	D_i	U_neg,i	U_pos,i
	″	″	″
NRC	0.008	0.050
INRIM	0.001	0.065
NIM	0.009	0.057
NMIJ	-0.006	0.041
CENAM	0.010	0.097
UME	0.006	0.117
CEM	0.000	0.158
KRISS	-0.010	0.103
NMC, A*STAR	-0.080	0.399
INMETRO	-0.110	0.198

Participating institutes

CCL-K3.n01

Angle 10:1

LAB_i	D_i	U_neg,i	U_pos,i
	″	″	″
NRC	0.001	0.050
INRIM	-0.004	0.065
NIM	0.000	0.056
NMIJ	-0.002	0.045
CENAM	0.003	0.097
UME	-0.013	0.117
CEM	0.003	0.158
KRISS	0.013	0.103
NMC, A*STAR	-0.337	0.399
INMETRO	0.083	0.198

Participating institutes

CCL-K3.n01

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CCL-K3.n01

MEASURAND Pitch angle deviation

ARTEFACT 12-sided polygon, serial number 327

Degrees of equivalence represented by D_i = (x_i - x_R) and its expanded uncertainty U_i at a 95 % level of confidence, both expressed in ″ (arcsecond).

Angle 1:2

LAB_i	D_i	U_neg,i	U_pos,i
	″	″	″
NRC	-0.003	0.159
INRIM	-0.012	0.164
NIM	0.078	0.165
NMIJ	-0.134	0.151
CENAM	-0.096	0.165
UME	0.058	0.188
CEM	0.094	0.231
KRISS	0.053	0.179
NMC, A*STAR	0.014	0.520
INMETRO	0.094	0.247

Participating institutes

CCL-K3.n01

Angle 2:3

LAB_i	D_i	U_neg,i	U_pos,i
	″	″	″
NRC	0.034	0.159
INRIM	0.020	0.164
NIM	-0.018	0.165
NMIJ	-0.094	0.153
CENAM	-0.071	0.165
UME	0.033	0.188
CEM	0.019	0.231
KRISS	0.017	0.180
NMC, A*STAR	0.349	0.520
INMETRO	0.099	0.247

Participating institutes

CCL-K3.n01

Angle 3:4

LAB_i	D_i	U_neg,i	U_pos,i
	″	″	″
NRC	0.018	0.159
INRIM	0.024	0.164
NIM	-0.098	0.165
NMIJ	0.038	0.157
CENAM	0.032	0.165
UME	-0.017	0.188
CEM	-0.038	0.231
KRISS	-0.025	0.179
NMC, A*STAR	0.202	0.520
INMETRO	0.032	0.247

Participating institutes

CCL-K3.n01

Angle 4:5

LAB_i	D_i	U_neg,i	U_pos,i
	″	″	″
NRC	0.033	0.158
INRIM	0.031	0.164
NIM	-0.049	0.165
NMIJ	0.042	0.160
CENAM	0.037	0.165
UME	-0.027	0.187
CEM	-0.073	0.231
KRISS	-0.045	0.185
NMC, A*STAR	0.117	0.520
INMETRO	-0.033	0.246

Participating institutes

CCL-K3.n01

Angle 5:6

LAB_i	D_i	U_neg,i	U_pos,i
	″	″	″
NRC	0.030	0.158
INRIM	-0.005	0.164
NIM	0.031	0.165
NMIJ	0.078	0.161
CENAM	0.029	0.165
UME	-0.038	0.188
CEM	-0.061	0.231
KRISS	-0.036	0.179
NMC, A*STAR	-0.141	0.520
INMETRO	-0.121	0.247

Participating institutes

CCL-K3.n01

Angle 6:7

LAB_i	D_i	U_neg,i	U_pos,i
	″	″	″
NRC	-0.043	0.158
INRIM	-0.037	0.164
NIM	0.052	0.165
NMIJ	0.044	0.160
CENAM	0.033	0.165
UME	-0.009	0.187
CEM	-0.017	0.246
KRISS	0.014	0.179
NMC, A*STAR	-0.177	0.520
INMETRO	-0.047	0.246

Participating institutes

CCL-K3.n01

Angle 7:8

LAB_i	D_i	U_neg,i	U_pos,i
	″	″	″
NRC	-0.048	0.158
INRIM	-0.059	0.164
NIM	0.040	0.165
NMIJ	-0.041	0.155
CENAM	-0.028	0.165
UME	0.045	0.188
CEM	0.052	0.247
KRISS	0.091	0.179
NMC, A*STAR	-0.158	0.520
INMETRO	0.042	0.247

Participating institutes

CCL-K3.n01

Angle 8:9

LAB_i	D_i	U_neg,i	U_pos,i
	″	″	″
NRC	-0.030	0.158
INRIM	0.010	0.164
NIM	0.001	0.165
NMIJ	-0.050	0.157
CENAM	-0.077	0.165
UME	0.065	0.187
CEM	0.043	0.280
KRISS	0.055	0.178
NMC, A*STAR	0.043	0.520
INMETRO	0.063	0.246

Participating institutes

CCL-K3.n01

Angle 9:10

LAB_i	D_i	U_neg,i	U_pos,i
	″	″	″
NRC	0.088	0.158
INRIM	0.105	0.164
NIM	-0.072	0.165
NMIJ	-0.101	0.158
CENAM	-0.093	0.165
UME	0.033	0.187
CEM	0.037	0.246
KRISS	0.017	0.179
NMC, A*STAR	-0.083	0.52
INMETRO	0.047	0.246

Participating institutes

CCL-K3.n01

Angle 10:11

LAB_i	D_i	U_neg,i	U_pos,i
	″	″	″
NRC	0.042	0.158
INRIM	0.050	0.164
NIM	-0.036	0.165
NMIJ	0.058	0.153
CENAM	0.058	0.165
UME	-0.092	0.187
CEM	-0.112	0.246
KRISS	-0.129	0.186
NMC, A*STAR	0.548	0.520
INMETRO	-0.032	0.246

Participating institutes

CCL-K3.n01

Angle 11-12

LAB_i	D_i	U_neg,i	U_pos,i
	″	″	″
NRC	-0.047	0.159
INRIM	-0.042	0.164
NIM	0.004	0.165
NMIJ	0.134	0.152
CENAM	0.134	0.165
UME	-0.082	0.188
CEM	-0.046	0.231
KRISS	-0.072	0.180
NMC, A*STAR	-0.216	0.520
INMETRO	-0.056	0.247

Participating institutes

CCL-K3.n01

Angle 12:1

LAB_i	D_i	U_neg,i	U_pos,i
	″	″	″
NRC	-0.075	0.159
INRIM	-0.084	0.164
NIM	0.069	0.165
NMIJ	0.029	0.152
CENAM	0.033	0.165
UME	0.032	0.188
CEM	0.103	0.247
KRISS	0.059	0.183
NMC, A*STAR	-0.497	0.520
INMETRO	-0.077	0.247

Participating institutes

CCL-K3.n01

Comparison

Comparison close

CCL-K3.n01

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Information & contact
Participants

Metrology area, Sub-field	Length, Dimensional Metrology
Description	Angle standards : optical polygon
Time of measurements	2023 - 2025
Status	Approved for equivalence

Final Reports of the comparisons	CCL-K3.n01 Final report 2026 43pp DOI:10.59161/KETH1559
References	CCL-K3.n01 Technical Protocol
Measurand	Angle Angle deviation
Transfer device	12 sided polygon

Comparison type	Key Comparison
Consultative Committee	CCL (Consultative Committee for Length )
Conducted by	CCL (Consultative Committee for Length )
Comments	Results published 05 November 2026
Pilot institute	NRC National Research Council Canada
Contact person	Brian EVES

Pilot laboratory
NRC	National Research Council, Canada, SIM

CEM	Centro Español de Metrologia, Spain, EURAMET

CENAM

Centro Nacional de Metrologia, Mexico, SIM

INMETRO

Instituto Nacional de Metrologia, Qualidade e Tecnologia, Brazil, SIM

INRIM

Istituto Nazionale di Ricerca Metrologica, Italy, EURAMET

KRISS

Korea Research Institute of Standards and Science, Korea, Republic of, APMP

NIM	National Institute of Metrology, China, APMP

NMC, A*STAR

National Metrology Centre, Agency for Science, Technology and Research, Singapore, APMP

NMIJ AIST

National Metrology Institute of Japan, Japan, APMP

UME	TÜBITAK Ulusal Metroloji Enstitüsü, Türkiye, EURAMET

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CCL-K3.n01

MEASURAND Pitch angle deviation

ARTEFACT 10-sided polygon, serial number 31391.15

The key comparison reference values x_R,j and their associated standard uncertainties u_R,j are computed from the weighted mean of the reported results with no exclusions as described in Section 7.1 of the CCL-K3.n01 Final report.

Angle _i	x_R_,j	u_R,_j
Angle _i	″	″
1:2	-0.361	0.013
2:3	-0.061	0.013
3:4	0.098	0.013
4:5	-0.564	0.013
5:6	0.694	0.014
6:7	-0.312	0.014
7:8	0.146	0.013
8:9	-0.158	0.012
9:10	0.070	0.013
10:1	0.447	0.013

The degree of equivalence of laboratory i relative to the key comparison reference value at each angle j, x_R,j is given by a pair of terms, both expressed in ″ (arcsecond):

D_i,j = (x_i,j - x_R,j) and its expanded uncertainty U_i,j at a 95 % level of confidence where U_i,j = 2 (u_i,j² - u_R,j²)^1/2 .

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CCL-K3.n01

MEASURAND Pitch angle deviation

ARTEFACT 12-sided polygon, serial number 327

The key comparison reference values x_R,j and their associated standard uncertainties u_R,j are computed from the weighted mean of the reported results, with their uncertainties increased by the artefact uncertainty in order to account for artefact instablility as described in Section 7.1 of the CCL-K3.n01 Final report.

Angle _j	x_R_,j	u_R,_j
Angle _j	″	″
1:2	-0.294	0.031
2:3	-0.689	0.031
3:4	-0.482	0.031
4:5	-0.307	0.031
5:6	0.341	0.031
6:7	0.547	0.031
7:8	0.248	0.031
8:9	0.027	0.032
9:10	0.073	0.031
10:11	-0.608	0.031
11:12	0.216	0.031
12:1	0.927	0.031

The degree of equivalence of laboratory i relative to the key comparison reference value at each angle j, x_R,j is given by a pair of terms, both expressed in ″ (arcsecond):

D_i,j = (x_i,j - x_R,j) and its expanded uncertainty U_i,j at a 95 % level of confidence where U_i,j = 2 (u_i,j² - u_R,j²)^1/2 .

print out

CCL-K3.n01

MEASURAND Pitch angle deviation

ARTEFACT 10-sided polygon, serial number 31391.15

The measurement results are listed in Table 3 and Table 4 of the CCL-K3.n01 Final report.

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CCL-K3.n01

MEASURAND Pitch angle deviation

ARTEFACT 12-sided polygon, serial number 327

The measurement results are listed in Table 5 and Table 6 of the CCL-K3.n01 Final report.

KCDB

CIPM MRA

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Key and supplementary comparisons - Print out