BIPM.EM-K10 and EUROMET.EM.BIPM-K10.a
MEASURAND DC voltage, Josephson standard
NOMINAL VALUE 1.018 V
Degrees of equivalence represented by Di = (xi - xR) and its expanded uncertainty Ui at a 95 % level of confidence, both expressed in nV.
BIPM.EM-K10 at 1.018 V previously represented by BIPM.EM-K10.a
For higher resulution graph, please click here.
(a) now LNE
(b) now NMIJ AIST
(c) now VSL
(d) now RISE
(e) now INRiM
BIPM.EM-K10, SIM.EM.BIPM-K10.b, SIM.EM.BIPM-K10.b.1, COOMET.EM.BIPM-K10.b and COOMET.EM.BIPM-K10.b.1
MEASURAND DC voltage, Josephson standards
NOMINAL VALUE 10 V
Degrees of equivalence represented by Di = (xi - xR) and its expanded uncertainty Ui at a 95 % level of confidence, both expressed in nV.
BIPM.EM-K10 at 10 V previously represented by BIPM.EM-K10.b
For higher resolution graph, please click here
(a) now RISE
(b) now NMIJ AIST
(c) now IPQ
(x) The degrees of equivalence are computed using the final result
BIPM.EM-K10 and EUROMET.EM.BIPM-K10.a
MEASURAND DC voltage, Josephson standard
NOMINAL VALUE 1.018 V
Degrees of equivalence represented by Di = (xi - xR) and its expanded uncertainty Ui at a 95 % level of confidence, both expressed in nV.
| LABi | Di | Uneg,i | Upos,i | |
|---|---|---|---|---|
nV |
nV |
nV |
||
| DFM | 0.20 | 0.6 | ||
| PTB | -0.10 | 0.6 | ||
| NIST | 0.10 | 0.6 | ||
| NRC | 0.20 | 0.6 | ||
| NPL | -0.07 | 1.0 | ||
| BNM-LCIE (a) | -0.12 | 0.3 | ||
| NMIJ (b) | -0.04 | 0.4 | ||
| NMi-VSL (c) | 0.20 | 0.4 | ||
| KRISS | 0.20 | 0.4 | ||
| MSL | -0.24 | 0.4 | ||
| NMIA | -0.02 | 0.3 | ||
| NIM | -0.01 | 0.2 | ||
| SP (d) | 0.10 | 0.6 | ||
| IEN (e) | 0.10 | 0.4 | ||
| CEM | 0.00 | 0.4 | ||
| NMC A*STAR | 1.80 | 1.8 | ||
| INTI | -1.06 | 4.0 | ||
| METAS | 0.28 | 0.9 | ||
| VNIIM | 0.0 | 0.5 | ||
| UME | 0.1 | 0.8 | ||
| PTB | 0.1 | 0.5 | ||
| SP | 0.0 | 2.3 | ||
| NPL | -1.2 | 1.2 | ||
| DFM | 0.2 | 1.1 | ||
| IEN | 0.0 | 0.7 | ||
| EIM | -0.9 | 4.5 | ||
| MIKES | 0.1 | 0.4 | ||
| GUM | 1.3 | 6.2 | ||
| CMI | -0.7 | 5.1 | ||
| NMi-VSL | 1.7 | 12.4 |
BIPM.EM-K10 at 1.018 V previously represented by BIPM.EM-K10.a
(a) now LNE
(b) now NMIJ AIST
(c) now VSL
(d) now RISE
(e) now INRiM
BIPM.EM-K10, SIM.EM.BIPM-K10.b, SIM.EM.BIPM-K10.b.1, COOMET.EM.BIPM-K10.b and COOMET.EM.BIPM-K10.b.1
MEASURAND DC voltage, Josephson standards
NOMINAL VALUE 10 V
Degrees of equivalence represented by Di = (xi - xR) and its expanded uncertainty Ui at a 95 % level of confidence, both expressed in nV.
| LABi | Di | Uneg,i | Upos,i | |
|---|---|---|---|---|
nV |
nV |
nV |
||
| SP (a) | 1.4 | 2.4 | ||
| SMU | 14.0 | 22.0 | ||
| NPL | -1.5 | 4.4 | ||
| NRC | 2.8 | 6.2 | ||
| CEM | 0.4 | 3.0 | ||
| NMIJ (b) | -1.2 | 2.6 | ||
| BEV | 1.1 | 7.0 | ||
| INETI (c) | 0.8 | 9.2 | ||
| INMETRO (2006) | 19.0 | 32.0 | ||
| NMIA | 0.9 | 3.4 | ||
| VSL | -1.5 | 3.6 | ||
| KRISS | 1.7 | 2.6 | ||
| LNE (x) | -0.1 | 0.2 | ||
| NIST (2006)(x) | -0.8 | 1.9 | ||
| SMD (x) | -0.4 | 2.7 | ||
| EIM (x) | -0.6 | 4.0 | ||
| NMC, A*STAR (x) | 0.4 | 1.9 | ||
| VNIIM (x) | -0.1 | 4.1 | ||
| CMI (x) | 9.6 | 20.6 | ||
| CENAM (x) | -0.6 | 1.3 | ||
| METAS | 0.3 | 2.0 | ||
| MSL (x) | 2.5 | 8.0 | ||
| NIM (x) | -0.2 | 1.8 | ||
| INM(RO) | 3.3 | 5.2 | ||
| PTB (x) | 0.7 | 1.0 | ||
| DMDM (x) | -0.1 | 3.0 | ||
| NIMT (x) | -1.0 | 5.2 | ||
| MIKES | 2.2 | 4.1 | ||
| NIST | 2.5 | 6.5 | ||
| INMETRO (2009) | -0.3 | 3.5 | ||
| BelGIM (2014) | 0.9 | 5.2 | ||
| BelGIM (2024) | -2.5 | 5.0 |
BIPM.EM-K10 at 10 V previously represented by BIPM.EM-K10.b
(a) now RISE
(b) now NMIJ AIST
(c) now IPQ
(x) The degrees of equivalence are computed using the final result
| Metrology area, Sub-field | Electricity and Magnetism, DC Voltage and Current |
| Description | DC voltage, Josephson standards |
| Time of measurements | 2009 |
| Status | Approved for equivalence |
| Final Reports of the comparisons | |
| Measurand | DC voltage: 10 V (direct comparison of Josephson voltage standards) |
| Transfer device | Compact Josephson Voltage Standard (CJVS) |
| Comparison type | Key Comparison |
| Consultative Committee | CCEM (Consultative Committee for Electricity and Magnetism) |
| Conducted by | SIM (Inter-American Metrology System) |
| Comments | Results published on 11 March 2010 SIM.EM.BIPM-K10.b.1 results are linked to those of BIPM.EM-K10.b. DC voltage, Josephson standards, 10 V |
| Pilot institute |
NIST
National Institute of Standards and Technology United States |
| Contact person | Yi-Hua Tang +1 301 975 4691 |
This page proposes print-out on A4 paper (portrait) of the comparison details (best printed out using a black and white printer).
Please, select items to be printed out, then click on "OK" :
BIPM.EM-K10 and EUROMET.EM.BIPM-K10.a
MEASURAND DC voltage, Josephson standard
NOMINAL VALUE 1.018 V
The key comparison reference value is the BIPM value. Its standard uncertainty is evaluated to be 0.1 nV and is included in the ui values.
The degree of equivalence between two laboratories i and j can be estimated as Dij = Di - Dj = (xi - xj) and its expanded uncertainty (k = 2), Uij, both expressed in nV, where Uij = 2[ui2 + uj2 - 2cov(i, j)]1/2. cov(i, j) << (0.1 nV)2 is the estimated covariance that takes into account the correlation introduced by the BIPM measurements. This term is negligible.
Linking EUROMET.EM.BIPM-K10.a to BIPM.EM-K10
The results issued from EUROMET.EM.BIPM-K10.a were linked to BIPM.EM-K10 via the BIPM who participated in both comparisons. Detailed information on the linking is given on page 6 of the EUROMET.EM.BIPM-K10.a Final Report.
BIPM.EM-K10, SIM.EM.BIPM-K10.b, SIM.EM.BIPM-K10.b.1, COOMET.EM.BIPM-K10.b and COOMET.EM.BIPM-K10.b.1
MEASURAND DC voltage, Josephson standards
NOMINAL VALUE 10 V
BIPM.EM-K10
The key comparison reference value is the BIPM value. Its standard uncertainty is evaluated to be 0.04 nV and is included in the ui values.
The degree of equivalence of laboratory i with respect to the key comparison reference value is given by a pair of terms:
Di = xi and its expanded uncertainty (k = 2), Ui = 2 ui, both expressed in nV.
When required, the degree of equivalence between two laboratories i and j can be estimated as Dij = Di - Dj = (xi - xj) and its expanded uncertainty (k = 2), Uij, both expressed in nV, where Uij = 2[ui2 + uj2 - 2cov(i, j)]1/2. cov(i, j) << (0.1 nV)2 is the estimated covariance that takes into account the correlation introduced by the BIPM measurements. This term is negligible.
Linking SIM.EM.BIPM-K10.b to BIPM.EM-K10
The results issued from SIM.EM.BIPM-K10.b were linked to BIPM.EM-K10 via NRC, having participated in both comparisons.
Linking SIM.EM.BIPM-K10.b.1 to BIPM.EM-K10
The results issued from SIM.EM.BIPM-K10.b.1 were linked to BIPM.EM-K10 via NIST, having participated in both comparisons.
Linking COOMET.EM.BIPM-K10.b to BIPM.EM-K10
The results issued from COOMET.EM.BIPM-K10.b were linked to BIPM.EM-K10 via VNIIM, having participated in both comparisons.
Linking COOMET.EM.BIPM-K10.b.1 to BIPM.EM-K10
The results issued from COOMET.EM.BIPM-K10.b.1 were linked to BIPM.EM-K10 via VNIIM, having participated in both comparisons.
BIPM.EM-K10 and EUROMET.EM.BIPM-K10.a
MEASURAND DC voltage, Josephson standard
NOMINAL VALUE 1.018 V
BIPM.EM-K10
xi measured voltage difference reported by laboratory i, Labi
ui combined standard uncertainty of xi
(a) now LNE
(b) now NMIJ AIST
(c) now VSL
(d) now RISE
(e) now INRiM
EUROMET.EM.BIPM-K10.a
NOMINAL VALUE : close to 1 V
di-EUR : result of measurement carried out by laboratory i expressed as the relative difference to the nominal value of the portable Josephson voltage standard (PJVS)
di-EUR = (VPJVS - Vi-EUR)/Vi-EUR, where "V" stands for "voltage"
ui-EUR : combined standard uncertainty of di-EUR
(c) now VSL
(d) now RISE
(e) now INRiM
BIPM.EM-K10, SIM.EM.BIPM-K10.b, SIM.EM.BIPM-K10.b.1, COOMET.EM.BIPM-K10.b and COOMET.EM.BIPM-K10.b.1
MEASURAND DC voltage, Josephson standards
NOMINAL VALUE 10 V
BIPM.EM-K10
xi measured voltage difference reported by laboratory i, Labi
ui combined standard uncertainty of xi
(a) now RISE
(b) now NMIJ AIST
(c) now IPQ
(1) initial result
(2) final result following technical improvements during the comparison
SIM.EM.BIPM-K10.b
SIM.EM.BIPM-K10.b is a bilateral key comparison between NIST and NRC conducted from August 13 to August 17, 2007.
dNIST-NRC : reported difference between NIST CJVS (Compact Josephson Voltage Standard) and NRC JVS
UNIST-NRC : expanded uncertainty (k = 2) of dNIST-NRC
dNIST-NRC = -0.28 nV
UNIST-NRC = 2.07 nV
SIM.EM.BIPM-K10.b.1
SIM.EM.BIPM-K10.b.1 is a bilateral key comparison between INMETRO and NIST conducted in June 2009.
dINMETRO-NIST : reported difference between INMETRO JVS and NIST CJVS
uINMETRO-NIST : combined standard uncertainty of dINMETRO-NIST
dINMETRO-NIST = 0.54 nV
uINMETRO-NIST = 1.48 nV
COOMET.EM.BIPM-K10.b
COOMET.EM.BIPM-K10.b is a bilateral key comparison between VNIIM and BelGIM conducted from September 4 to August 8, 2014.
dBelGIM-VNIIM : reported difference between BelGIM JVS (Josephson Voltage Standard) and VNIIM JVS, obtained using a transportable JVS
UBelGIM-VNIIM : expanded uncertainty (k = 2) of dBelGIM-VNIIM
dBelGIM-VNIIM = 0.99 nV
UBelGIM-VNIIM = 3.05 nV
COOMET.EM.BIPM-K10.b.1
COOMET.EM.BIPM-K10.b.1 is a bilateral key comparison between VNIIM and BelGIM conducted from October 8 to November 14, 2024.
dBelGIM-VNIIM : reported difference between BelGIM JVS (Josephson Voltage Standard) and VNIIM JVS, obtained using a transportable JVS
UBelGIM-VNIIM : expanded uncertainty (k = 2) of dBelGIM-VNIIM
dBelGIM-VNIIM = -2.36 nV
UBelGIM-VNIIM = 2.91 nV
