| Metrology area, Sub-field | Length, Dimensional Metrology |
| Description | Flatness of optical flat measured by flatness interferometer |
| Time of measurements | 2015 - 2016 |
| Status | Approved |
| Final Reports of the comparisons | |
| References | |
| Measurand | Flatness, diameter 60 mm and 150 mm |
| Transfer device | Optical flats |
| Comparison type | Supplementary Comparison |
| Consultative Committee | CCL (Consultative Committee for Length ) |
| Conducted by | APMP (Asia Pacific Metrology Programme) |
| Comments |
|
| Pilot institute |
NIMT
National Institute of Metrology (Thailand) Thailand |
| Contact person | Jariya Buajarern +66 2577 5100 |
| Pilot laboratory | |
|---|---|
| NIMT |
National Institute of Metrology (Thailand), Thailand, APMP |
| MSL |
Measurement Standards Laboratory, New Zealand, APMP |
| NIM |
National Institute of Metrology, China, APMP |
| NMC, A*STAR |
National Metrology Centre, Agency for Science, Technology and Research, Singapore, APMP |
| NMIJ AIST |
National Metrology Institute of Japan, Japan, APMP |
| NMISA |
National Metrology Institute of South Africa, South Africa, AFRIMETS |
| NPLI |
CSIR National Physical Laboratory of India, India, APMP |
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