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CIPM MRA PARTICIPANTS
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Results for: Measurement Standards Laboratory of New Zealand
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General physics
Geographical location
In the CMCs uncertainty statements, the notation Q[a, b] stands for the root-sum-square of the terms between brackets: Q[a, b] = [a 2 + b 2]1/2
Unless otherwise stated the expanded uncertainties given below correspond to k = 2 (at a 95 % level of confidence)
New Zealand, MSL (Measurement Standards Laboratory)
Spectral properties of materials , Transmittance, diffuse, spectral : 1.00E-4 to 4.00E-3
Spectrally-neutral material
Absolute expanded uncertainty : 2.0E-4
Spectrophotometer, integrating sphere
Wavelength range : 400 nm to 1000 nm
Bandwidth : 1 nm to 3 nm
Specific measurement conditions : 0/d
Other types of material can also be calibrated
Approved on 20 October 2005
Institute service identifier : MSLT.O.020
Spectral properties of materials , Transmittance, regular, spectral : 1.00E-4 to 0.01
Spectrally-neutral material
Absolute expanded uncertainty : 5.0E-5
Spectrophotometer
Wavelength range : 380 nm to 1000 nm
Bandwidth : 1 nm to 3 nm
Approved on 27 September 2004
Institute service identifier : MSLT.O.006
Items for defining ITS-90 , Temperature : 29.7646 °C
Gallium melting point cell
Absolute expanded uncertainty : 0.13 mK
Comparison with reference cell(s)
Temperature controlled furnaceModified on 09 February 2015
Approved on 24 June 2004
Institute service identifier : MSL/T3
Items for defining ITS-90 , Temperature : 419.527 °C
Zinc freezing point cell
Absolute expanded uncertainty : 1.9 mK
Comparison with reference cell(s)
Temperature controlled furnaceModified on 09 February 2015
Approved on 24 June 2004
Institute service identifier : MSL/T6
Items for defining ITS-90 , Temperature : 231.928 °C
Tin freezing point cell
Absolute expanded uncertainty : 0.82 mK
Comparison with reference cell(s)
Temperature controlled furnaceModified on 09 February 2015
Approved on 24 June 2004
Institute service identifier : MSL/T5
Time interval , Time interval : 1.00E-7 s to 8.64E4 s
Time difference source
Absolute expanded uncertainty : 2 ns
Direct time interval measurement
Trigger level : > 0.5 V (50 Ohm)
Number of measurements : 10
Pulse rise time : < 50 ns for 5 V
Excluded DUT's effect
Approved on 12 February 2008
Institute service identifier : MSL/6
AC power , AC power and energy: three phase, reactive power : 0 var to 7.20E4 var
Power meter, energy meter, power converter, wattmeter, VAR meters, three phase source
Relative expanded uncertainty
40 + 90QF

values range from 40 µvar/VA to 130 µvar/VA

The uncertainty is expressed in µvar (VA)-1
Power bridge
Reactive power factor, QF : 1 to 0, inductive or capacitive
Voltage : 60 V to 240 V
Current : 0.01 A to 100 A
Frequency : 45 Hz to 75 Hz
Voltage and current ranges are per phase
Approved on 10 November 2014
Institute service identifier : 61b
Impedance (up to the MHz range) , Capacitance for dielectric capacitors : 0 µF to 100 µF
Fixed capacitor, switched capacitor, capacitance box: capacitance C
Absolute expanded uncertainty
0.2/f + 22C

f in Hz, C in µF

The uncertainty is expressed in pF
Universal impedance bridge
Frequency f : 40 Hz to 2 kHz
Expanded uncertainty values range from 0.0001 pF to 2200 pF
Approved on 22 November 2006
Institute service identifier : 39
Impedance (up to the MHz range) , AC resistance: real and imaginary component : 0 MΩ to 1 MΩ
Fixed resistor: resistance R
Absolute expanded uncertainty
2000/f + 19R

f in Hz, R in Ω

The uncertainty is expressed in µΩ
Universal impedance bridge
Frequency f : 40 Hz to 2 kHz
Expanded uncertainty values range from 1 µΩ to 19 Ω
Approved on 22 November 2006
Institute service identifier : 46
Radio frequency measurements , RF voltage: meters : 1 V to 3 V
RF voltmeter
Relative expanded uncertainty : 0.3 mV/V to 8 mV/V
Comparison with calibrated source or meter
Frequency : 1 MHz to 100 MHz
Approved on 10 November 2014
Institute service identifier : 66
Density , Density of solid : 1400 kg/m3 to 2500 kg/m3
Solid density artifact
Relative expanded uncertainty : 1.0E-5
Comparison in liquid
Mass : 400 g to 200 g
Temperature : 17 °C to 23 °C
Approved on 14 April 2005
Institute service identifier : MSL/10
Spectral properties of materials , Transmittance, diffuse, spectral, T : 0.1 to 1
Spectrally-neutral material
Relative expanded uncertainty
0.05T
Spectrophotometer, integrating sphere
Wavelength range : 300 nm to 400 nm
Bandwidth : 1 nm to 3 nm
Specific measurement conditions : 0/d
Other types of material can also be calibrated
Approved on 20 October 2005
Institute service identifier : MSLT.O.020
Properties of detectors , Responsivity, spectral power
Broadband detector
Relative expanded uncertainty : 8.0E-2 %
Monochromator and reference detectors
Wavelength range : 680 nm to 800 nm
Bandwidth : 1 nm to 5 nm
Power level : 0.1 µW to 10 µW
Approved on 20 October 2005
Institute service identifier : MSLT.O.040 or MSLT.O.009
Photometry , Illuminance responsivity, tungsten source
Illuminance meter
Relative expanded uncertainty : 0.8 %
Standard lamp
Illuminance : 10 lx to 3000 lx
Correlated colour temperature : 2700 K to 3000 K
Approved on 21 October 2001
Institute service identifier : MSLT.O.001, MSLT.O.016
Items for defining ITS-90 , Temperature : -38.8344 °C
SPRT
Absolute expanded uncertainty : 0.4 mK
Mercury triple point cell
Fixed point cellModified on 09 February 2015
Approved on 24 June 2004
Institute service identifier : MSL/T7
Items for defining ITS-90 , Temperature : 0.01 °C
SPRT
Absolute expanded uncertainty : 0.12 mK
Water triple point cell
Modified on 09 February 2015
Approved on 23 November 2009
Frequency , Frequency : 0.1 MHz to 10 MHz
Local frequency standard
Relative expanded uncertainty : 2.0E-13 Hz/Hz
Phase comparison
Measurement time : 3 days
Amplitude : > 0.5 V (50 Ohm)
Excluded DUT's effect
Approved on 12 February 2008
Institute service identifier : MSL/3
DC resistance , DC resistance standards and sources: low values : 10 mΩ to 1000 mΩ
Fixed resistors, resistance box
Relative expanded uncertainty : 2.5E1 µΩ/Ω
Voltage comparator
Current : below or equal to 1 A
Voltage : above or equal to 10 mV
Approved on 22 November 2006
Institute service identifier : 16
Photometry , Luminance responsivity
Luminance meter
Relative expanded uncertainty : 1.4 %
Tungsten-based source
Luminance : 2 cd m-2 to 800 cd m-2
Type of source used : illuminant A
Approved on 27 September 2004
Institute service identifier : MSLT.O.002
Spectral properties of materials , Reflectance, diffuse, spectral : 0.016 to 0.9
Spectrally-neutral material
Relative expanded uncertainty : 5.0E1 % to 0.4 %
Spectrophotometer
Wavelength range : 360 nm to 820 nm
Bandwidth  : 1 nm to 3 nm
Specific measurement conditions : 0:de, 6:di, 6:de
Other types of material can also be calibrated
Approved on 08 February 2022
Institute service identifier : MSLT.O.024

Select Metrology Area

General physics
Acoustics, Ultrasound, Vibration

This metrology area covers the fields of acoustics, ultrasound and vibration.

Electricity and Magnetism

This metrology area covers the fields of DC and AC measurements, impedance, electric and magnetic fields, radiofrequencies and measurements on materials.

Length

This metrology area covers the fields of laser frequencies and dimensional metrology.

Mass and related quantities

This metrology area covers the fields of mass standards, force, pressure, density, hardness, torque, gravity and viscosity.

Photometry and Radiometry

Thermometry

Time and Frequency

Chemistry and Biology
Chemistry and Biology

This metrology area covers all fields relevant to chemistry and biology.

Ionizing radiation
Ionizing Radiation

This metrology area covers the fields of dosimetry, radioactivity and neutron measurements.