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In the CMCs uncertainty statements, the notation Q[a, b] stands for the root-sum-square of the terms between brackets: Q[a, b] = [a 2 + b 2]1/2
Unless otherwise stated the expanded uncertainties given below correspond to k = 2 (at a 95 % level of confidence)
Germany, PTB (Physikalisch-Technische Bundesanstalt)
Linear dimensions , Line standards : 50 m to 100 m
(surveyor, engineer) tape, steel: line spacing L
Absolute expanded uncertainty : 4.1E1 µm to 5.5E1 µm
Q[41 µm, 0.72E-06 (L - 50 m)]
50 m bench and laser interferometer
Support : multiple catenary, 0.4 m distance
Approved on 22 March 2005
Institute service identifier : PTB/5.23/5
CMC ID : EURAMET-L-DE-00000F61-2
 
Linear dimensions , Line standards : 0.14 µm to 4 µm
2-D grating: mean pitch
Absolute expanded uncertainty : 2.0E1 pm
Laser diffractometer
Grating area : > 0.1 mm2
Approved on 01 April 2010
Institute service identifier : PTB/4.22/2
CMC ID : EURAMET-L-DE-00000F47-1
 
Linear dimensions , Length instruments : 0 m to 50 m
Laser range finder (EDM) with flat reflector
Absolute expanded uncertainty : 4.6E2 µm
50 m bench and laser interferometer
Approved on 22 March 2005
Institute service identifier : PTB/5.23/13
CMC ID : EURAMET-L-DE-00000JKC-1
 
Linear dimensions , Line standards : 0 m to 50 m
(surveyor, engineer) tape, steel: line spacing L
Absolute expanded uncertainty : 1.3E1 µm to 1.4E2 µm
Q[13 µm, 2.6E-06 L]
50 m bench and laser interferometer
Support : multiple catenary, 0.4 m distance
Approved on 22 March 2005
Institute service identifier : PTB/5.23/2
CMC ID : EURAMET-L-DE-00000F5Y-2
 
Linear dimensions , Length instruments : 0 m to 50 m
Laser range finder (EDM) with retroreflector
Absolute expanded uncertainty : 1.0E2 µm
50 m bench and laser interferometer
Approved on 22 March 2005
Institute service identifier : PTB/5.23/14
CMC ID : EURAMET-L-DE-00000JKD-1
 
Various dimensional , Reference materials : 7 nm to 300 nm
Standard particle, particle size d
Absolute expanded uncertainty : 2.2 nm to 8 nm
2 nm + 0.02 d
Scanning Electron Microscopy in Transmission Mode (TSEM)
Approved on 12 September 2016
Institute service identifier : PTB/4.22/3
CMC ID : EURAMET-L-DE-00000F4I-2
 
Linear dimensions , Line standards : 0.5 µm to 400 µm
Photomask: linewidth
Absolute expanded uncertainty : 2.0E-2 µm
Optical microscope and interferometer
Approved on 21 October 2001
Institute service identifier : PTB/4.22/1
CMC ID : EURAMET-L-DE-00000F4S-2
 
Linear dimensions , Line standards : 0.1 m to 4 m
Precision line scale, invar: line spacing L
Absolute expanded uncertainty : 5.8 µm to 6 µm
Q[5.8 µm, 0.4E-06 L]
50 m bench and laser interferometer
Approved on 22 March 2005
Institute service identifier : PTB/5.23/7
CMC ID : EURAMET-L-DE-00000F63-2
 
Form , Flatness standards : 0 µm to 5 µm
Optical flat - flatness deviation over whole diameter
Absolute expanded uncertainty : 1.0E1 nm
Tolanski multiple beam Fizeau interferometer
Diameter of artefact : 10 mm to 250 mm
Approved on 21 October 2001
Institute service identifier : PTB/4.21/1
CMC ID : EURAMET-L-DE-00000F57-1
 
Linear dimensions , Line standards : 50 m to 100 m
(surveyor, engineer) tape, steel: line spacing L
Absolute expanded uncertainty : 0.13 µm to 0.19 µm
Q[0.13 mm, 2.6E-06 (L - 50 m)]
50 m bench and laser interferometer
Support : multiple catenary, 0.4 m distance
Approved on 22 March 2005
Institute service identifier : PTB/5.23/3
CMC ID : EURAMET-L-DE-00000F5Z-2
 
Linear dimensions , Line standards : 0 m to 50 m
(surveyor, engineer) tape, steel: line spacing L
Absolute expanded uncertainty : 1.4E1 µm to 3.8E1 µm
Q[14 µm, 0.72E-06 L]
50 m bench and laser interferometer
Support : multiple catenary, 0.4 m distance
Approved on 22 March 2005
Institute service identifier : PTB/5.23/4
CMC ID : EURAMET-L-DE-00000F60-2
 
Linear dimensions , Line standards : 0.1 m to 4 m
Precision line scale, steel: line spacing L
Absolute expanded uncertainty : 5.8 µm to 9.2 µm
Q[5.8 µm, 1.8E-06 L]
50 m bench and laser interferometer
Approved on 22 March 2005
Institute service identifier : PTB/5.23/6
CMC ID : EURAMET-L-DE-00000F62-2
 
Linear dimensions , Line standards : 0.14 µm to 4 µm
1-D grating: mean pitch
Absolute expanded uncertainty : 2.0E1 pm
Laser diffractometer
Grating area : > 0.1 mm2
Approved on 01 April 2010
Institute service identifier : PTB/4.22/2
CMC ID : EURAMET-L-DE-00000F46-1
 
Ukraine, NSC IM (National Scientific Centre "Institute of Metrology")
Form , Roundness standards : 0 µm to 300 µm
Magnification stanart (e. g. fkick standard): roundness
Absolute expanded uncertainty : 3.0E1 nm to 3.0E3 nm
Q[36 10R] R in mm
The uncertainty is expressed in nm
Stylus-on-spindle roundness instrument
Diameter : 1 mm to 300 mm
Approved on 09 November 2016
Institute service identifier : NSC IM-L-423/22
CMC ID : EURAMET-L-UA-00000OQD-1
 
Form , Roundness standards : 0 nm to 2000 nm
Sphere, hemisphere: roundness
Absolute expanded uncertainty : 3.6E1 nm
Stylus-on-spindle roundness instrument
Diameter : 1 mm to 100 mm
Approved on 09 November 2016
Institute service identifier : NSC IM-L-423/22
CMC ID : EURAMET-L-UA-00000OQE-1
 

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