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General physics
Geographical location
In the CMCs uncertainty statements, the notation Q[a, b] stands for the root-sum-square of the terms between brackets: Q[a, b] = [a 2 + b 2]1/2
Unless otherwise stated the expanded uncertainties given below correspond to k = 2 (at a 95 % level of confidence)
Sweden, RISE (Research Institutes of Sweden AB)
Form , Flatness standards : 0 µm to 10 µm
Optical parallel: parallelism
Absolute expanded uncertainty : 0.1 µm
Mechanical comparator
Diameter : up to 50 mm
Approved on 21 October 2001
Institute service identifier : RISE/27
Form , Flatness standards : 0 µm to 2 µm
Optical flat: surface flatness
Absolute expanded uncertainty : 0.1 µm
Michelson interferometer
Diameter : up to 50 mm
Approved on 21 October 2001
Institute service identifier : RISE/26
Angle , Angle artifacts : 0 µm to 100 µm
90° square: squareness
Absolute expanded uncertainty : 0.5 second
Stylus on vertical straight edge
Height : up to 400 mm
Approved on 21 October 2001
Institute service identifier : RISE/24
Linear dimensions , End standards : 5 mm to 1500 mm
Step gauge: face spacing L
Absolute expanded uncertainty : 0.5 µm to 1.1 µm
Q[0.5 μm, 0.6E-06 L]
1-D measuring machine and mechanical probe
Approved on 21 October 2001
Institute service identifier : RISE/11
Angle , Angle instruments : 0 ° to 0.1 °
Spirit (bubble) level: error of indicated angle
Absolute expanded uncertainty : 2 second
Sine-bar
Approved on 21 October 2001
Institute service identifier : RISE/22
Angle , Angle instruments : 0 ° to 0.2 °
Electronic level: error of indicated angle
Absolute expanded uncertainty : 0.3 second
Sine-bar
Approved on 21 October 2001
Institute service identifier : RISE/20
Angle , Angle instruments : 0 ° to 360 °
Protractor: error of indicated angle
Absolute expanded uncertainty : 5 minute
Sine-table
Approved on 21 October 2001
Institute service identifier : RISE/23
Form , Straightness standards : 0 µm to 100 µm
Cylindrical straightness standard: straightness S
Absolute expanded uncertainty : 0.3 µm to 1.1 µm
Q[0.3 μm, 10E-03 S]
Stylus-on-spindle form instrument
Diameter : up to 400 mm
Height : up to 500 mm
Approved on 21 October 2001
Institute service identifier : RISE/34
Complex geometry , Surface texture : 0.01 µm to 20 µm
Roughness standard (ISO 5436-1 type D): ISO roughness parameters
Absolute expanded uncertainty : 5 nm to 4.1E2 nm
Q[5 nm, 20E-03 Ra]
Stylus instrument
Parameters : Ra, Rq
Approved on 21 October 2001
Institute service identifier : RISE/37
Linear dimensions , End standards : 0.1 mm to 100 mm
Gauge block: central length L
Absolute expanded uncertainty : 2.5E1 nm to 5.6E1 nm
Q[25 nm, 0.5E-06 L]
Interferometry exact fractions
Approved on 21 October 2001
Institute service identifier : RISE/6
Linear dimensions , Length instruments : 0 m to 5 m
Error of indicated displacement L
Absolute expanded uncertainty : 0.1 µm to 1.6 µm
Q[0.1 μm, 0.3E-06 L]
1-D measuring machine
Approved on 21 October 2001
Institute service identifier : RISE/4
Complex geometry , Screw standards : 3 mm to 70 mm
Thread ring plain: simple pitch diameter
Absolute expanded uncertainty : 3.5 µm
1-D measuring machine, 2-ball
Pitch : 0.5 mm to 6 mm
Approved on 21 October 2001
Institute service identifier : RISE/39
Form , Roundness standards : 0 µm to 400 µm
Sphere (hemisphere): roundness R
Absolute expanded uncertainty : 5 nm to 8.1E3 nm
Q[5 nm, 20E-03 R]
Stylus-on-spindle roundness instrument
Diameter : up to 250 mm
Approved on 21 October 2001
Institute service identifier : RISE/31
Angle , Angle artifacts : 0 µm to 100 µm
90° cylinder square: squareness
Absolute expanded uncertainty : 0.5 second
Stylus on vertical straight edge
Height : up to 400 mm
Approved on 21 October 2001
Institute service identifier : RISE/25
Angle , Angle instruments : 0 ° to 360 °
Clinometers: error of indicated angle
Absolute expanded uncertainty : 2 minute
Sine-table
Approved on 21 October 2001
Institute service identifier : RISE/21
Linear dimensions , End standards : 1.00E-5 K-1 to 1.20E-5 K-1
Length bar (long gauge block): thermal expansivity
Absolute expanded uncertainty : 2.0E-7 K-1
Interferometry exact fractions
Length : 125 mm to 1000 mm
Temperature : around 20 °C
Approved on 21 October 2001
Institute service identifier : RISE/10
Complex geometry , Screw standards : 1.5 mm to 75 mm
Thread plug, plain: simple pitch diameter
Absolute expanded uncertainty : 2.5 µm
1-D measuring machine, 3-wire
Approved on 21 October 2001
Institute service identifier : RISE/38
Radiations of the mise en pratique , Laser radiations : 474 THz
Frequency stabilized laser: absolute frequency
Absolute expanded uncertainty : 2.4E1 kHz
Optical beat frequency
Approved on 21 October 2001
Institute service identifier : RISE/1
Form , Straightness standards : 0 µm to 100 µm
Straight edge: straightness S
Absolute expanded uncertainty : 0.7 µm to 3.1 µm
Q[0.7 µm, 30E-03 S]
Stylus on horizontal straight edge
Length : up to 2 m
Approved on 21 October 2001
Institute service identifier : RISE/33
Linear dimensions , Line standards : 1 m to 3 m
Surveyor's levelling rod: line spacing L
Absolute expanded uncertainty : 2.2E1 µm to 3.7E1 µm
Q[20 μm, 10R-06 L]
1-D measuring machine and optical microscope
Approved on 21 October 2001
Institute service identifier : RISE/15

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This metrology area covers the fields of acoustics, ultrasound and vibration.

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This metrology area covers the fields of DC and AC measurements, impedance, electric and magnetic fields, radiofrequencies and measurements on materials.

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