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General physics
Geographical location
In the CMCs uncertainty statements, the notation Q[a, b] stands for the root-sum-square of the terms between brackets: Q[a, b] = [a 2 + b 2]1/2
Unless otherwise stated the expanded uncertainties given below correspond to k = 2 (at a 95 % level of confidence)
Sweden, RISE (Research Institutes of Sweden AB)
Complex geometry , Surface texture : 0.01 µm to 20 µm
Roughness standard (ISO 5436-1 type D): ISO roughness parameters
Absolute expanded uncertainty : 1.0E1 nm to 6.1E2 nm
Q[10 nm, 30E-03 Rp]
Stylus instrument
Parameters : Rp, Rv, Rz, Rt
Approved on 21 October 2001
Institute service identifier : L-37
CMC ID : EURAMET-L-SE-00000CX9-7
 
Complex geometry , Surface texture : 0.01 µm to 20 µm
Roughness standard (ISO 5436-1 type D): ISO roughness parameters
Absolute expanded uncertainty : 5 nm to 4.1E2 nm
Q[5 nm, 20E-03 Ra]
Stylus instrument
Parameters : Ra, Rq
Approved on 21 October 2001
Institute service identifier : L-37
CMC ID : EURAMET-L-SE-00000CX8-7
 
Form , Roundness standards : 0 µm to 400 µm
Internal cylinder: roundness R
Absolute expanded uncertainty : 2.0E1 nm to 1.3E4 nm
Q[20 nm, 30E-03 R]
Stylus-on-spindle roundness instrument
Diameter : up to 250 mm
Approved on 21 October 2001
Institute service identifier : L-30
CMC ID : EURAMET-L-SE-00000CX2-7
 
Form , Flatness standards : 0 µm to 250 µm
Surface plate: flatness F
Absolute expanded uncertainty : 0.68 µm to 4.8 µm
Q[0.6 µm, 0.8E-06 L, 0.01 F]
Electronic levels
Length L : 0.4 m to 5 m
Approved on 21 October 2001
Institute service identifier : L-28
CMC ID : EURAMET-L-SE-00000CX0-7
 
Angle , Angle artifacts : 0 µm to 100 µm
90° cylinder square: squareness
Absolute expanded uncertainty : 0.5 second
Stylus on vertical straight edge
Height : up to 400 mm
Approved on 21 October 2001
Institute service identifier : L-25
CMC ID : EURAMET-L-SE-00000CWX-7
 
Form , Flatness standards : 0 µm to 2 µm
Optical flat: surface flatness
Absolute expanded uncertainty : 0.1 µm
Michelson interferometer
Diameter : up to 50 mm
Approved on 21 October 2001
Institute service identifier : L-26
CMC ID : EURAMET-L-SE-00000CWY-6
 
Complex geometry , Screw standards : 1.5 mm to 75 mm
Thread plug, plain: simple pitch diameter
Absolute expanded uncertainty : 2.5 µm
1-D measuring machine, 3-wire
Approved on 21 October 2001
Institute service identifier : L-38
CMC ID : EURAMET-L-SE-00000CXA-6
 
Angle , Angle instruments : 0 ° to 360 °
Protractor: error of indicated angle
Absolute expanded uncertainty : 5 minute
Sine-table
Approved on 21 October 2001
Institute service identifier : L-23
CMC ID : EURAMET-L-SE-00000CWV-7
 
Form , Roundness standards : 0 µm to 400 µm
Sphere (hemisphere): roundness R
Absolute expanded uncertainty : 5 nm to 8.1E3 nm
Q[5 nm, 20E-03 R]
Stylus-on-spindle roundness instrument
Diameter : up to 250 mm
Approved on 21 October 2001
Institute service identifier : L-31
CMC ID : EURAMET-L-SE-00000CX3-7
 
Linear dimensions , End standards : 0.1 mm to 100 mm
Gauge block: central length L
Absolute expanded uncertainty : 5.0E1 nm to 7.9E1 nm
Q[50 nm, 0.6E-06 L]
Mechanical comparison
Approved on 21 October 2001
Institute service identifier : L-7
CMC ID : EURAMET-L-SE-00000CWF-7
 
Linear dimensions , Diameter standards : 3 mm to 500 mm
Internal cylinder (ring): diameter L
Absolute expanded uncertainty : 0.2 µm to 1.3 µm
Q[0.2 μm, 2.5E-06 L]
1-D measuring machine, gauge substitution
Approved on 21 October 2001
Institute service identifier : L-17
CMC ID : EURAMET-L-SE-00000CWP-7
 
Complex geometry , Screw standards : 3 mm to 70 mm
Thread ring plain: simple pitch diameter
Absolute expanded uncertainty : 3.5 µm
1-D measuring machine, 2-ball
Pitch : 0.5 mm to 6 mm
Approved on 21 October 2001
Institute service identifier : L-39
CMC ID : EURAMET-L-SE-00000CXB-6
 
Angle , Small-angle generators : 1 mm to 400 mm
Sine tables: cylinder spacing L
Absolute expanded uncertainty : 1 µm to 1.6 µm
Q[1 μm, 3E-06 L]
1-D measuring machine and optical microscope
Approved on 21 October 2001
Institute service identifier : L-19
CMC ID : EURAMET-L-SE-00000CWR-7
 
Linear dimensions , Length instruments : 0 m to 5 m
Error of indicated displacement L
Absolute expanded uncertainty : 0.1 µm to 1.6 µm
Q[0.1 μm, 0.3E-06 L]
1-D measuring machine
Approved on 21 October 2001
Institute service identifier : L-4
CMC ID : EURAMET-L-SE-00000CWC-7
 
Linear dimensions , Length instruments : 0 mm to 100 mm
Displacement transducer: displacement L
Absolute expanded uncertainty : 0.1 µm to 0.16 µm
Q[0.1 μm, 1.2E-06 L]
1-D measuring machine
Approved on 21 October 2001
Institute service identifier : L-5
CMC ID : EURAMET-L-SE-00000CWD-7
 
Radiations of the mise en pratique , Laser radiations : 633 nm
Frequency stabilized laser: vacuum wavelength
Absolute expanded uncertainty : 4.0E-2 fm
Optical beat frequency
Approved on 21 October 2001
Institute service identifier : L-1
CMC ID : EURAMET-L-SE-00000CW7-6
 
Radiations of the mise en pratique , Laser radiations : 474 THz
Frequency stabilized laser: absolute frequency
Absolute expanded uncertainty : 2.4E1 kHz
Optical beat frequency
Approved on 21 October 2001
Institute service identifier : L-1
CMC ID : EURAMET-L-SE-00000CW8-6
 
Form , Roundness standards : 0 µm to 400 µm
Magnification standard: roundness R
Absolute expanded uncertainty : 5.0E1 nm to 1.3E4 nm
Q[50 nm, 30E-03 R]
Stylus-on-spindle roundness instrument
Approved on 21 October 2001
Institute service identifier : L-32
CMC ID : EURAMET-L-SE-00000CX4-7
 
Complex geometry , Surface texture : 0.05 µm to 1000 µm
Groove or step-height standard: step height H
Absolute expanded uncertainty : 5 nm to 2.1E4 nm
Q[5 nm, 20E-03 H]
Stylus instrument
Approved on 21 October 2001
Institute service identifier : L-36
CMC ID : EURAMET-L-SE-00000CX7-7
 
Linear dimensions , Length instruments : 0 m to 20 m
Laser interferometer: error of indicated displacement L
Absolute expanded uncertainty : 2.0E-2 µm to 2.1 µm
Q[0.02 μm, 0.1E-06 L]
Comparison to master laser interferometer
Approved on 21 October 2001
Institute service identifier : L-3a
CMC ID : EURAMET-L-SE-00000CWA-7
 

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General physics
Acoustics, Ultrasound, Vibration

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This metrology area covers the fields of DC and AC measurements, impedance, electric and magnetic fields, radiofrequencies and measurements on materials.

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This metrology area covers the fields of laser frequencies and dimensional metrology.

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This metrology area covers the fields of mass standards, force, pressure, density, hardness, torque, gravity and viscosity.

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This metrology area covers all fields relevant to chemistry and biology.

Ionizing radiation
Ionizing Radiation

This metrology area covers the fields of dosimetry, radioactivity and neutron measurements.