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Électricité et magnétisme : Publications du BIPM

2018

  • Gournay P., Rolland B., Mortara A., Jeanneret B., On-site comparison of Quantum Hall Effect resistance standards of METAS and the BIPM: Ongoing key comparison BIPM.EM-K12, Metrologia, 2018, 55, Tech. Suppl., 01002
  • Rüfenacht A., Tang Y.-h., Solve S., Fox A.E., Dresselhaus P.D., Burroughs C.J., Schwall R.E., Chayramy R., Benz S.P., Automated direct comparison of two cryocooled 10 volt programmable Josephson voltage standards, Metrologia, 2018, 55(4), 585-596
  • Solve S., Chayramy R., Maruyama M., Urano C., Kaneko N.-H., Rufenacht A., Direct DC 10 V comparison between two programmable Josephson voltage standards made of niobium nitride (NbN)-based and niobium (Nb)-based Josephson junctions, Metrologia, 2018, 55(2), 302-313
  • Solve S., Chayramy R., Matlejoane A.M., Magagula L., Stock M., Bilateral comparison of 1 V and 10 V standards between the NMISA (South Africa) and the BIPM April to June 2017 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b), Metrologia, 2018, 55, Tech. Suppl., 01001

2017

  • Gournay P., Helmy M., Raouf A., Hamed H.A.M., Eliwa Gad A., Bilateral comparison of 10 pF and 100 pF standards (ongoing BIPM key comparisons BIPM.EM-K14.a and 14.b) between the NIS (Egypt) and the BIPM, Metrologia, 2017, 54, Tech. Suppl., 01008
  • Gournay P., Khoz M., Bilateral comparison of 10 pF and 100 pF standards (ongoing BIPM key comparisons BIPM.EM-K14.a and 14.b) between the NMISA (South Africa) and the BIPM, Metrologia, 2017, 54, Tech. Suppl., 01010
  • Gournay P., Rolland B., Kucera J., Vojackova L., On-site comparison of Quantum Hall Effect resistance standards of the CMI and the BIPM: ongoing key comparison BIPM.EM-K12, Metrologia, 2017, 54, Tech. Suppl., 01014
  • Kyu-Tae Kim, Michitaka Maruyama, Stephane Solve, Louis Marais, Abdul Rashid B Zainal Abidin, Sze Wey Chua, Dennis Lee, Chun-feng Huang, Sittisak Pimsut, Seksembayev Nurlan, APMP key comparison of DC voltage at 1.018 V and 10 V, Metrologia, 2017, 54, Tech. Suppl., 01012
  • Rolland B., Fletcher N., Khumthukthit N., Jassadajin C., Bilateral comparison of 1 Ω and 10 kΩ standards (ongoing BIPM key comparisons BIPM.EM-K13.a and 13.b) between the NIMT (Thailand) and the BIPM, Metrologia, 2017, 54, Tech. Suppl., 01002
  • Rolland B., Fletcher N., Kučera J., Chrobok P., Vojčkov L., Bilateral comparison of 1 Ω and 10 kΩ standards (ongoing BIPM key comparisons BIPM.EM-K13.a and 13.b) between the CMI (Czech Republic) and the BIPM, Metrologia, 2017, 54, Tech. Suppl., 01007
  • Rolland B., Fletcher N., Power O., Bilateral comparison of 1 Ω and 10 kΩ standards (ongoing BIPM key comparisons BIPM.EM-K13.a and 13.b) between the NSAI NML (Ireland) and the BIPM, Metrologia, 2017, 54, Tech. Suppl., 01003
  • Rolland B., Fletcher N., Tenev A., Hadzhistoykova R., Bilateral comparison of 1 Ω and 10 kΩ standards (ongoing BIPM key comparisons BIPM.EM-K13.a and 13.b) between the BIM (Bulgaria) and the BIPM, Metrologia, 2017, 54, Tech. Suppl., 01001
  • Rolland B., Fletcher N., Vlad D., Bilateral comparison of 1 O and 10 kO standards (ongoing BIPM key comparisons BIPM.EM-K13.a and 13.b) between the SMD (Belgium) and the BIPM, Metrologia, 2017, 54, Tech. Suppl., 01015
  • Schurr J., Fletcher N., Gournay P., Thévenot O., Overney O., Johnson L., Xie R., Dierikx E., Final report of the supplementary comparison EURAMET.EM-S31 comparison of capacitance and capacitance ratio, Metrologia, 2017, 54, Tech. Suppl., 01016

2016

  • Solve S., Chayramy R., Ben Salah B., Mallat A., Abene L., Stock M., Bilateral comparison of 1 V and 10 V standards between the DEFNAT (Tunisia) and the BIPM February to March 2016 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b), Metrologia, 2016, 53, Tech. Suppl., 01004
  • Solve S., Chayramy R., Maruyama M., Urano C., Kaneko N., A direct DC 10 V comparison between the NMIJ and the BIPM programmable Josephson voltage standards, Proc. 2016 CPEM, 2016,
  • Solve S., Chayramy R., Power O., Stock M., Bilateral comparison of 10 V standards between the NSAI - NML (Ireland) and the BIPM, February 2016 (part of the ongoing BIPM key comparison BIPM.EM-K11.b), Metrologia, 2016, 53, Tech. Suppl., 01007
  • Solve S., Chayramy R., Stock M., Pantelic-Babic J., Sofranac Z., Cincar Vujovic T., Comparison of the Josephson Voltage Standards of the DMDM and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b), Metrologia, 2016, 53, Tech. Suppl., 01005
  • Solve S., Chayramy R., Stock M., Pimsut S., Rujirat N., Comparison of the Josephson Voltage Standards of the NIMT and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b), Metrologia, 2016, 53, Tech. Suppl., 01006

2015

  • Fletcher N., Götz M., Rolland B., Pesel E., Behavior of 1 Ω resistors at frequencies below 1 Hz and the problem of assigning a dc value, Metrologia, 2015, 52(4), 509-513
  • Power O., Moran A., Fletcher N., Goebel R., Stock M., Bilateral comparison of 10 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.a) between the NSAI-NML, Ireland, and the BIPM, March-August 2011, Metrologia, 2015, 52, Tech. Suppl., 01017
  • Power O., Moran A., Fletcher N., Goebel R., Stock M., Bilateral comparison of 100 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.b) between the NSAI-NML, Ireland, and the BIPM, March-August 2011, Metrologia, 2015, 52, Tech. Suppl., 01018
  • Saleem M., Ansari M.A., Saxena A.K., Fletcher N., Goebel R., Stock M., Bilateral comparison of 10 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.a) between the NPLI and the BIPM, July 2010-May 2011, Metrologia, 2015, 52, Tech. Suppl., 01015
  • Saleem M., Ansari M.A., Saxena A.K., Fletcher N., Goebel R., Stock M., Bilateral comparison of 100 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.b) between the NPLI and the BIPM, July 2010-May 2011, Metrologia, 2015, 52, Tech. Suppl., 01016
  • Sapunova I., Fletcher N., Goebel R., Stock M., Bilateral comparison of 10 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.a) between the BIM, Bulgaria, and the BIPM, April 2012 to September 2012, Metrologia, 2015, 52, Tech. Suppl., 01012
  • Sapunova I., Fletcher N., Goebel R., Stock M., Bilateral comparison of 100 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.b) between the BIM, Bulgaria, and the BIPM, April 2012 to September 2012, Metrologia, 2015, 52, Tech. Suppl., 01013
  • Solve S., Chayramy R., Stock M., Mageed H.M.A., Aladdin O.M., Raouf M.H.A., Bilateral comparison of 1 V and 10 V standards between the NIS (Egypt) and the BIPM, August to September 2014 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b), Metrologia, 2015, 52, Tech. Suppl., 01011
  • Solve S., Chayramy R., Stock M., Palafox L., Behr R., Comparison of the Josephson Voltage Standards of the PTB and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b), Metrologia, 2015, 52, Tech. Suppl., 01025
  • Solve S., Chayramy R., Stock M., Pantelic-Babic J., Sofranac Z., Zivkovic V., Bilateral comparison of 1 V and 10 V standards between the DMDM (Serbia) and the BIPM, January to March 2014 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b), Metrologia, 2015, 52, Tech. Suppl., 01006
  • Solve S., Chayramy R., Stock M., Pimsut S., Bilateral Comparison of 1 V and 10 V Standards between the NIMT (Thailand) and the BIPM October to December 2014 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b), Metrologia, 2015, 52, Tech. Suppl., 01019
  • Solve S., Chayramy R., Stock M., Power O., Bilateral Comparison of 10 V Standards between the NSAI - NML (Ireland) and the BIPM, March 2015 (part of the ongoing BIPM key comparison BIPM.EM-K11.b), Metrologia, 2015, 52, Tech. Suppl., 01021
  • Solve S., Chayramy R., Stock M., Sengebush F., Bilateral Comparison of 1 V and 10 V Standards between the JV (Norway) and the BIPM, January to February 2015 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b), Metrologia, 2015, 52, Tech. Suppl., 01022
  • Solve S., Chayramy R., Stock M., Simionescu M., Cîrneanu L., Comparison of the Josephson voltage standards of the INM and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b), Metrologia, 2015, 52, Tech. Suppl., 01009
  • Solve S., Chayramy R., Stock M., Vlad D., Bilateral Comparison of 1 V and 10 V Standards between the SMD (Belgium) and the BIPM October to December 2014 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b), Metrologia, 2015, 52, Tech. Suppl., 01020

2014

  • Goebel R., Fletcher N., Rolland B., Götz M., Pesel E., Final report on the on-going comparison BIPM.EM-K12: Comparison of quantum Hall effect resistance standards of the PTB and the BIPM, Metrologia, 2014, 51, Tech. Suppl., 01011
  • Power O., Chayramy R., Solve S., Stock M., Bilateral comparison of 10 V standards between the NSAI–NML (Ireland) and the BIPM, January to February 2013 (part of the ongoing BIPM key comparison BIPM.EM-K11.b), Metrologia, 2014, 51, Tech. Suppl., 01006
  • Solve S., Chayramy R., Power O., Stock M., Bilateral comparison of 10 V standards between the NSAI–NML (Ireland) and the BIPM, March 2014 (part of the ongoing BIPM key comparison BIPM.EM-K11.b), Metrologia, 2014, 51, Tech. Suppl., 01008
  • Solve S., Chayramy R., Stock M., Simionescu M., Cirneanu L., Bilateral comparison of 1 V and 10 V standards between the INM (Romania) and the BIPM, August to October 2013 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b), Metrologia, 2014, 51, Tech. Suppl., 01005
  • Solve S., Chayramy R., Stock M., Yuan G., Honghui L., Zengmin W., Comparison of the Josephson voltage standards of the NIM and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b), Metrologia, 2014, 51, Tech. Suppl., 01009

2013

2012

  • Goebel R., Kim W.-S., Fletcher N., Stock M., Bilateral comparison of 10 kΩ standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the KRISS (Rep. of Korea) and the BIPM, Metrologia, 2012, 49, Tech. Suppl., 01006
  • Goebel R., Power O., Fletcher N., Stock M., Bilateral comparison of 1 Ω standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the NSAI-NML (Ireland) and the BIPM, Metrologia, 2012, 49, Tech. Suppl., 01004
  • Goebel R., Power O., Fletcher N., Stock M., Bilateral comparison of 10 kΩ standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the NSAI-NML (Ireland) and the BIPM, Metrologia, 2012, 49, Tech. Suppl., 01005
  • Janssen T.J.B.M., Williams J.M., Fletcher N.E., Goebel R., Tzalenchuk A., Yakimova R., Lara-Avila S., Kubatkin S., Fal'ko V.I., Precision comparison of the quantum Hall effect in graphene and gallium arsenide, Metrologia, 2012, 49(3), 294-306
  • Power O., Solve S., Chayramy R., Stock M., Bilateral comparison of 10 V standards between the NSAI-NML (Ireland) and the BIPM, February to March 2012 (part of the ongoing BIPM key comparison BIPM.EM-K11.b), Metrologia, 2012, 49, Tech. Suppl., 01014
  • Solve S., Chayramy R., Stock M., Avilés D., Navarrete E., Hernández D., Comparison of the Josephson voltage standards of the CENAM and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b), Metrologia, 2012, 49, Tech. Suppl., 01011
  • Solve S., Chayramy R., Stock M., Christian L., Comparison of the Josephson voltage standards of the MSL and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b), Metrologia, 2012, 49, Tech. Suppl., 01015
  • Solve S., Chayramy R., Stock M., Iuzzolino R., Tonina A., Comparison of the Josephson voltage standards of the INTI and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.a), Metrologia, 2012, 49, Tech. Suppl., 01009
  • Solve S., Chayramy R., Stock M., Jeanneret B., Comparison of the Josephson voltage standards of the METAS and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.a and b), Metrologia, 2012, 49, Tech. Suppl., 01010
  • Solve S., Chayramy R., Stock M., Streit J., Šíra M., Comparison of the Josephson voltage standards of the CMI and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b), Metrologia, 2012, 49, Tech. Suppl., 01003

2011

  • Goebel R., Fletcher N., Stock M., Dudek E., Domanska-Mysliwiec D., Mosiadz M., Orzepowski M., Bilateral comparison of 1 Ω standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the GUM (Poland) and the BIPM, Metrologia, 2011, 48, Tech. Suppl., 01001
  • Goebel R., Fletcher N., Stock M., Dudek E., Domanska-Mysliwiec D., Mosiadz M., Orzepowski M., Bilateral comparison of 10 kΩ standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the GUM (Poland) and the BIPM, Metrologia, 2011, 48, Tech. Suppl., 01002
  • Janssen T.J.B.M., Fletcher N.E., Goebel R., Williams J.M., Tzalenchuk A., Yakimova R., Kubatkin S., Lara-Avila S., Falko V.I., Graphene, universality of the quantum Hall effect and redefinition of the SI system, New J. Phys., 2011, 13, 093026
  • Power O., Solve S., Chayramy R., Stock M., Bilateral comparison of 10 V standards between the NSAI-NML (Ireland) and the BIPM, March to April 2011 (part of the ongoing BIPM key comparison BIPM.EM-K11.b), Metrologia, 2011, 48, Tech. Suppl., 01010
  • Solve S., Chayramy R., Stock M., The BIPM 1.018 V Zener Measurement Set-up, Rapport BIPM-2011/05, 32 pp
  • Solve S., Chayramy R., Stock M., Katkov A., Comparison of the Josephson voltage standards of the VNIIM and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b), Metrologia, 2011, 48, Tech. Suppl., 01007
  • Solve S., Chayramy R., Stock M., Zhou Y., Lee J., Wey Chua S., Comparison of the Josephson voltage standards of the NMC, A*STAR and the BIPM (part of the ongoing BIPM key comparisons BIPM.EM-K10.a and BIPM.EM-K10.b), Metrologia, 2011, 48, Tech. Suppl., 01006

2010

  • Fletcher N., Goebel R., Wang Y., Bilateral comparison of 10 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.a) between the NIST, United States and the BIPM, June 2007-March 2008, Metrologia, 2010, 47, Tech. Suppl., 01013
  • Goebel R., Kurupakorn C., Fletcher N., Stock M., Final report on bilateral comparison of 10 kΩ standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the NIMT-Thailand and the BIPM, Metrologia, 2010, 47, Tech. Suppl., 01005
  • Power O., Solve S., Chayramy R., Stock M., Bilateral comparison of 1.018 V and 10 V standards between the NSAI-NML (Ireland) and the BIPM, March to April 2010 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b), Metrologia, 2010, 47, Tech. Suppl., 01017
  • Solve S., Chayramy R., Stock M., Nicolas J., Van Theemsche A., Comparison of the Josephson voltage standards of the SMD and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b), Metrologia, 2010, 47, Tech. Suppl., 01004
  • Streit J., Fletcher N., Bilateral comparison of 10 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.a) between the CMI, Czech Republic and the BIPM, January-July 2009, Metrologia, 2010, 47, Tech. Suppl., 01012
  • Streit J., Fletcher N., Bilateral comparison of 100 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.b) between the CMI, Czech Republic and the BIPM, January-July 2009, Metrologia, 2010, 47, Tech. Suppl., 01014
  • Tonina A., Iuzzolino R., Bierzychudek M., Real M., Solve S., Chayramy R., Stock M., Bilateral comparison of 1.018 V and 10 V standards between the INTI (Argentina) and the BIPM, August to October 2009 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b), Metrologia, 2010, 47, Tech. Suppl., 01002
  • Witt T.J., Fletcher N.E., Standard deviation of the mean and other time series properties of voltages measured with a digital lock-in amplifier, Metrologia, 2010, 47(5), 616-630

2009

  • Goebel R., Fletcher N., Stock M., Pritchard B., Xie R., Coogan P., Johnson L., Bilateral comparison of 1 Ω standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the NMIA (Australia) and the BIPM, Metrologia, 2009, 46, Tech. Suppl., 01011
  • Power O., Solve S., Chayramy R., Bilateral comparison of 10 V standards between the NML (Ireland) and the BIPM, April to May 2009 (part of the ongoing BIPM key comparison BIPM.EM-K11.b), Metrologia, 2009, 46, Tech. Suppl., 01008
  • Solve S., Chayramy R., Djorjevic S., Séron O., Comparison of the Josephson voltage standards of the LNE and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b), Metrologia, 2009, 46, Tech. Suppl., 01002
  • Solve S., Chayramy R., Stock M., Tang Y.H., Sims J.E., Comparison of the Josephson voltage standards of the NIST and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b), Metrologia, 2009, 46, Tech. Suppl., 01010