quantum-metrology INTRO

BIPM Workshop: The Quantum Revolution in Metrology

28-29 September 2017 (at the BIPM)

 

quantum-metrology SC

Steering Committee

Sang-Kyung Choi

KRISS

Patrick Gill

NPL

Martin Milton (Chair)

BIPM

Maria-Luisa Rastello

INRIM

Uwe Siegner

PTB

Carl Williams

NIST

Workshop Executive Secretary

Pierre Gournay

BIPM

quantum-metrology METROLOGIA

Focus Issue of Metrologia

quantum-metrology DETAILS

Introduction

The objective of the workshop is to promote scientific exchange amongst the National Metrology Institutes and with leading researchers on the applications of quantum-based technologies to metrology.

 

Workshop sessions

The workshop was organized in five thematic sessions:

  1. Advances in quantum electrical standards, single-electron transistors and demonstrations of the quantum metrology triangle;

  2. Single-photon measurements, radiometry with entangled sources, superconducting particle detectors;

  3. Highly entangled systems for metrology, entangled optical clocks;

  4. Quantum standards for mass, force, pressure, vacuum, temperature, acoustics and vibration;

  5. Emerging ideas in quantum metrology.

Publications

Workshop documents

WS-QR/2017-Session1-P2

A single-emitter sub-shot noise quantum light source: press a button and get one photon

Stephan Götzinger (Max Planck Institute for Light, Germany)

WS-QR/2017-Session1-S1-02

The effect of turbulence in free-space synchronization, using second-order quantum interferenc

Filippus S. Roux (NMISA, South Africa)

WS-QR/2017-Session1-S1-12

Single photon detection without losing the count

Mauro Rajteri (INRIM, Italy)

WS-QR/2017-Session3-P4

Non-destructive detection for strontium optical lattice clocks: Towards a lattice clock in the quantum regime

Jérôme Lodewyck (LNE-SYRTE, France)

WS-QR/2017-Session3-S3-02

Towards creation of the nuclear clock and frequency reference point: Search for the optimal parameters today, working instruments of the future

Feodr F. Karpeshin, (VNIIM, Russia)

WS-QR/2017-Session3-S3-05

Optical-clock local-oscillator universal interrogation protocol for zero probe-field-induced frequency-shifts

Thomas Zanon-Willette (Observatoire de Paris, France)

WS-QR/2017-Session3-S3-08

How to optimize the shape of quantum light for quantum metrology

Claude Fabre (Laboratoire Kastler Brossel, France)

WS-QR/2017-Session4-S4-03

Impact of the new generation of Josephson voltage standards in ac and dc electric metrology

Al)ain Rüfenacht (NIST, USA)

WS-QR/2017-Session4-S4-04

Error modelling of quantum Hall array resistance standards

Martina Marzano (INRIM, Italy)

WS-QR/2017-Session4-S4-08

Distinction between electromagnetically induced transparency and Autler-Townes splitting: a conceptual approach

Satya kesh Dubey (CSIR-NPLI, India)

WS-QR/2017-Session4-S4-14

The robustness and universality of tunable-barrier electron pumps

Stephen Giblin (NPL, UK)

WS-QR/2017-Session5-P4

Quantum optical explorations of the nanoscale metrology frontier

Jacob Taylor (NIST/JQI, USA)

WS-QR/2017-Session5-S5-04

Searching for an invariant of the sample composition in the measurement of the amount of substance

Hong Yi (NIM, China)

WS-QR/2017-Session5-S5-05

Measuring a mole of photons: optical power traceable to the kilogram

John Lehman (NIST, USA)

WS-QR/2017-Session5-S5-07

Novel source of multimode squeezed light for quantum enhanced space-time positioning

Lucas La Volpe (Laboratoire Kastler Brossel, France)

WS-QR/2017-Session5-S5-11

see Session3: S3-08

WS-QR/2017-Session5-S5-13

Optical magnetometry beyond the shot noise limit

Ricardo Jimenez-Martinez (ICFO - The Institute of Photonic Sciences, Spain)

WS-QR/2017-Session5-S5-14

Chip‐scale atomic instrumentation for metrology

John Kitching (NIST, USA)

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quantum-metrology PHOTO