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 Hong Kong, China, SCL (Standards and Calibration Laboratory)    Complete CMCs in Time and Frequency for Hong Kong, China (.PDF file)
  
Time scale difference. Local clock vs UTC(SCL), 1E09 s to 1 s   Absolute expanded uncertainty (k = 2, level of confidence 95 %) in ns: 1   Direct time interval measurement against UTC(SCL) using calibrated counter   1 PPS amplitude: 1 V to 5 V (50 ohm)   Ideal DUT effect included Approved on 31 August 2005   Internal NMI service identifier: SCL/1 
 Time interval. Time difference source, 1E09 s to 1 s   Absolute expanded uncertainty (k = 2, level of confidence 95 %) in ns: 1   Direct time interval measurement using calibrated counter   Trigger level: 4 V to +4 V (50 ohm)   Slew rate: > 1E+09 V/s   Ideal DUT effect included Approved on 31 August 2005   Internal NMI service identifier: SCL/21 
 Time interval. Time difference source, 1 s to 999 s   Absolute expanded uncertainty (k = 2, level of confidence 95 %) in ns: 1 to 3   Direct time interval measurement using calibrated counter   Trigger level: 4 V to +4 V (50 ohm)   Slew rate: > 1E+09 V/s   Ideal DUT effect included Approved on 31 August 2005   Internal NMI service identifier: SCL/22 
 Time interval. Time difference meter, 1E09 s to 1 s   Absolute expanded uncertainty (k = 2, level of confidence 95 %) in ns: 1   Measuring test signals from calibrated generator   Trigger level: 2 V to +2 V (50 ohm)   Slew rate: > 1E+09 V/s   Ideal DUT effect included Approved on 31 August 2005   Internal NMI service identifier: SCL/28 
 Time interval. Time difference meter, 1 s to 999 s   Absolute expanded uncertainty (k = 2, level of confidence 95 %) in ns: 1 to 15   Measuring test signals from calibrated generator   Trigger level: 2 V to +2 V (50 ohm)   Slew rate: > 1E+09 V/s   Ideal DUT effect included Approved on 31 August 2005   Internal NMI service identifier: SCL/29 
 Frequency. Local frequency standard, 10 MHz   Relative expanded uncertainty (k = 2, level of confidence 95 %): 8.0E14   Phase comparison with laboratory frequency standard   Measurement time: 5 d to 10 d   Amplitude: 0.5 V to 3 V (rms into 50 ohm)   Ideal DUT effect included Approved on 31 August 2005   Internal NMI service identifier: SCL/2 
 Frequency. Local frequency standard, 5 MHz   Relative expanded uncertainty (k = 2, level of confidence 95 %): 8.0E14   Phase comparison with laboratory frequency standard   Measurement time: 5 d to 10 d   Amplitude: 0.5 V to 3 V (rms into 50 ohm)   Ideal DUT effect included Approved on 31 August 2005   Internal NMI service identifier: SCL/3 
 Frequency. Local frequency standard, 1 MHz   Relative expanded uncertainty (k = 2, level of confidence 95 %): 8.2E14   Phase comparison with laboratory frequency standard   Measurement time: 5 d to 10 d   Amplitude: 0.5 V to 3 V (rms into 50 ohm)   Ideal DUT effect included Approved on 31 August 2005   Internal NMI service identifier: SCL/4 
 Frequency. Local frequency standard, 100 kHz   Relative expanded uncertainty (k = 2, level of confidence 95 %): 2.0E13   Phase comparison with laboratory frequency standard   Measurement time: 5 d to 10 d   Amplitude: 0.5 V to 3 V (rms into 50 ohm)   Ideal DUT effect included Approved on 31 August 2005   Internal NMI service identifier: SCL/5 
 Frequency. General frequency source, 1 Hz to 1E+03 Hz   Relative expanded uncertainty (k = 2, level of confidence 95 %): 4.0E06 to 3.0E09   Direct frequency measurement using calibrated frequency counter   Gate time: 120 s to 1000 s   Number of measurements: 5 to 10   Amplitude: 0.3 V to 2.5 V (peaktopeak into 50 ohm)   Ideal DUT effect included Approved on 31 August 2005   Internal NMI service identifier: SCL/6 
 Frequency. General frequency source, 1 kHz to 1E+03 kHz   Relative expanded uncertainty (k = 2, level of confidence 95 %): 3.0E09 to 5.0E11   Direct frequency measurement using calibrated frequency counter   Gate time: 120 s to 1000 s   Number of measurements: 5 to 10   Amplitude: 0.3 V to 2.5 V (peaktopeak into 50 ohm)   Ideal DUT effect included Approved on 31 August 2005   Internal NMI service identifier: SCL/7 
 Frequency. General frequency source, 1 MHz to 1.3E+03 MHz   Relative expanded uncertainty (k = 2, level of confidence 95 %): 5.0E11   Direct frequency measurement using calibrated frequency counter   Gate time: 120 s to 1000 s   Number of measurements: 5 to 10   Amplitude: 0.3 V to 2.5 V (peaktopeak into 50 ohm)   Ideal DUT effect included Approved on 31 August 2005   Internal NMI service identifier: SCL/8 
 Frequency. General frequency source, 1.3 GHz to 10 GHz   Relative expanded uncertainty (k = 2, level of confidence 95 %): 6.0E10 to 2.0E10   Direct frequency measurement using calibrated frequency counter   Gate time: 1 s   Number of measurements: 5 to 10   Amplitude: 0.01 mW to 3 mW (power into 50 ohm)   Ideal DUT effect included Approved on 31 August 2005   Internal NMI service identifier: SCL/9 
 Frequency. General frequency source, 10 GHz to 26.5 GHz   Relative expanded uncertainty (k = 2, level of confidence 95 %): 2.0E10 to 1.0E10   Direct frequency measurement using calibrated frequency counter   Gate time: 1 s   Number of measurements: 5 to 10   Amplitude: 0.01 mW to 3 mW (power into 50 ohm)   Ideal DUT effect included Approved on 31 August 2005   Internal NMI service identifier: SCL/10 
 Frequency. Frequency counter, 1 Hz to 1E+03 Hz   Relative expanded uncertainty (k = 2, level of confidence 95 %): 4.0E06 to 3.0E09   Measuring test signals from calibrated frequency source   Gate time: 120 s to 1000 s   Number of measurements: 5 to 10   Amplitude: 0.3 V to 2.5 V (peaktopeak into 50 ohm)   Ideal DUT effect included Approved on 31 August 2005   Internal NMI service identifier: SCL/11 
 Frequency. Frequency counter, 1 kHz to 1E+03 kHz   Relative expanded uncertainty (k = 2, level of confidence 95 %): 3.0E09 to 6.1E11   Measuring test signals from calibrated frequency source   Gate time: 120 s to 1000 s   Number of measurements: 5 to 10   Amplitude: 0.3 V to 2.5 V (peaktopeak into 50 ohm)   Ideal DUT effect included Approved on 31 August 2005   Internal NMI service identifier: SCL/12 
 Frequency. Frequency counter, 1 MHz to 1.3E+03 MHz   Relative expanded uncertainty (k = 2, level of confidence 95 %): 6.1E11   Measuring test signals from calibrated frequency source   Gate time: 120 s to 1000 s   Number of measurements: 5 to 10   Amplitude: 0.3 V to 2.5 V (peaktopeak into 50 ohm)   Ideal DUT effect included Approved on 31 August 2005   Internal NMI service identifier: SCL/13 
 Frequency. Frequency counter, 1.3 GHz to 10 GHz   Relative expanded uncertainty (k = 2, level of confidence 95 %): 6.1E10 to 2.0E10   Measuring test signals from calibrated frequency source   Gate time: 1 s   Number of measurements: 5 to 10   Amplitude: 0.01 mW to 3 mW (power into 50 ohm)   Ideal DUT effect included Approved on 31 August 2005   Internal NMI service identifier: SCL/14 
 Frequency. Frequency counter, 10 GHz to 26.5 GHz   Relative expanded uncertainty (k = 2, level of confidence 95 %): 2.0E10 to 1.0E10   Measuring test signals from calibrated frequency source   Gate time: 1 s   Number of measurements: 5 to 10   Amplitude: 0.01 mW to 3 mW (power into 50 ohm)   Ideal DUT effect included Approved on 31 August 2005   Internal NMI service identifier: SCL/15 
 Time interval. Period source, 1 ms to 1E+03 ms   Relative expanded uncertainty (k = 2, level of confidence 95 %): 3.0E09 to 4.0E06   Derived from direct frequency measurement using calibrated counter   Gate time: 120 s to 1000 s   Number of measurements: 5 to 10   Amplitude: 0.3 V to 2.5 V (peaktopeak into 50 ohm)   Ideal DUT effect included Approved on 31 August 2005   Internal NMI service identifier: SCL/16 
