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METROLOGY AREA
Length (11)
TYPE
Key comparisons (7)
Supplementary comparisons (4)
STATUS
Approved for equivalence (5)
Approved and published (4)
Ongoing, approved for equivalence (1)
In progress (1)
ORGANISATIONS
CCL (11)
Result of the search
Your query 'Japan' produced 11 results New search

  CCL- K1 Gauge blocks by interferometry
1998 - 1999
Comparison type, Field   Key comparison in Length, Dimensional Metrology
Steel and tungsten carbide materials
Status   Approved for equivalence, Results available
  CCL- K3 Angle standards
2000 - 2002
Comparison type, Field   Key comparison in Length, Dimensional Metrology
Status   Approved for equivalence, Results available
  CCL- K5 One-dimensional coordinate measuring machine artefacts
1999 - 2002
Comparison type, Field   Key comparison in Length, Dimensional Metrology
Step gauge and ball bars
Status   Approved for equivalence, Results available
  CCL- S1 Nanometrology: one-dimensional gratings
1999 - 2000
Comparison type, Field   Supplementary comparison in Length, Dimensional Metrology
Pitch of gratings: 290 nm and 700 nm
Status   Approved and published, Results available
  CCL- S3 Nanometrology: line scale standards
2000 - 2002
Comparison type, Field   Supplementary comparison in Length, Dimensional Metrology
Line structure: 4 µm width, 1 mm length
Status   Approved and published
  CCL- K6 Two-dimensional coordinate measuring machine artefacts
2000 - 2003
Comparison type, Field   Key comparison in Length, Dimensional Metrology
Status   Approved for equivalence, Results available
  CCL- K2 Long gauge blocks by interferometry
1999 - 2001
Comparison type, Field   Key comparison in Length, Dimensional Metrology
Status   Approved for equivalence, Results available
  CCL- S2 Nanometrology: step height standards
2000 - 2002
Comparison type, Field   Supplementary comparison in Length, Dimensional Metrology
Step height: between 7 nm and 800 nm
Status   Approved and published
  CCL- S4 Nanometrology: two-dimensional gratings
1998 - 2000
Comparison type, Field   Supplementary comparison in Length, Dimensional Metrology
Pitch and angle
Status   Approved and published
  CCL- K11 Comparison of optical frequency and wavelength standards
2008 -
Comparison type, Field   Key comparison in Length, Laser Frequencies
Status   Ongoing, approved for equivalence, Results available
  CCL- K1.2011 Calibration by optical Interferometry of short and long gauge blocks
2011 - 2014
Comparison type, Field   Key comparison in Length, Dimensional Metrology
Central length from 0.5 mm to 500 mm
Status   In progress