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CMCs General Physics (6)
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Properties of detectors and sources
Properties of materials (6)
Colour, surface, x, y, Y (6)
IONIZING RADIATION
Emission rate
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United Kingdom (6)
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Your query 'United Kingdom' produced 6 results New search

 
United Kingdom, NPL (National Physical Laboratory)
Complete CMCs in Photometry and Radiometry for United Kingdom (.PDF file)
Colour, surface, x, y, Y. General material, x, y = 0 to x, y = 0.9
Absolute expanded uncertainty (k = 2, level of confidence 95 %): 0.0002
Integrating sphere spectrophotometer
Specific measurement conditions: 0/d, 2 nm bandwidth
Type of material: non-fluorescent
Approved on 07 May 2007
 
Colour, surface, x, y, Y. General material, Y = 0 to Y = 1
Absolute expanded uncertainty (k = 2, level of confidence 95 %): (0.0005 + 0.0035Y)
Integrating sphere spectrophotometer
Specific measurement conditions: 0/d, 2 nm bandwidth
Type of material: non-fluorescent
Approved on 07 May 2007
 
Colour, surface, x, y, Y. Fluorescent material, x, y = 0 to x, y = 0.9
Absolute expanded uncertainty (k = 2, level of confidence 95 %): 0.003
Reference spectrofluorimeter
Type of source used: monochromator
Specific measurement conditions: 0/45
Type of fluorescent material: general
Approved on 07 May 2007
 
Colour, surface, x, y, Y. Fluorescent material, Y = 0 to Y = 300
Absolute expanded uncertainty (k = 2, level of confidence 95 %): 0.003
Reference spectrofluorimeter
Type of source used: monochromator
Specific measurement conditions: 0/45
Type of fluorescent material: general
Approved on 07 May 2007
 
Colour, surface, x, y, Y. Diffusely reflecting material, x, y = 0 to x, y = 0.9
Absolute expanded uncertainty (k = 2, level of confidence 95 %): 0.0002
Integrating sphere spectrophotometer
Specific measurement conditions: 0/d, 2 nm bandwidth
Other types of material can also be calibrated
Approved on 07 May 2007
 
Colour, surface, x, y, Y. Diffusely reflecting material, Y = 0 to Y = 1
Absolute expanded uncertainty (k = 2, level of confidence 95 %): (0.0005 + 0.0035Y)
Integrating sphere spectrophotometer
Specific measurement conditions: 0/d, 2 nm bandwidth
Other types of material can also be calibrated
Approved on 07 May 2007