Home    Key and supplementary comparisons    Calibration and Measurement Capabilities - CMCs
The BIPM key comparison database
Refine your search
METROLOGY AREA
Length (35)
Dimensional Metrology (31)
Laser Frequencies (4)
TYPE
Key comparisons (23)
Supplementary comparisons (12)
STATUS
Approved for equivalence (19)
Approved and published (10)
In progress (2)
Ongoing, approved for equivalence (1)
Published (1)
Report in progress, Draft B (1)
Report in progress, Draft A (1)
ORGANISATIONS
APMP (18)
CCL (11)
EURAMET (formerly EUROMET) (3)
BIPM (2)
SIM (1)
Result of the search
Your query 'Japan' produced 35 results New search
1  2

  BIPM.L- K10 Comparison of the frequencies of Helium-Neon lasers at wavelength 633 nm
1988 - 2000
Comparison type, Field   Key comparison in Length, Laser Frequencies
Status   Approved for equivalence, Results available
  CCL- K1 Gauge blocks by interferometry
1998 - 1999
Comparison type, Field   Key comparison in Length, Dimensional Metrology
Steel and tungsten carbide materials
Status   Approved for equivalence, Results available
  CCL- K3 Angle standards
2000 - 2002
Comparison type, Field   Key comparison in Length, Dimensional Metrology
Status   Approved for equivalence, Results available
  CCL- K5 One-dimensional coordinate measuring machine artefacts
1999 - 2002
Comparison type, Field   Key comparison in Length, Dimensional Metrology
Step gauge and ball bars
Status   Approved for equivalence, Results available
  CCL- S1 Nanometrology: one-dimensional gratings
1999 - 2000
Comparison type, Field   Supplementary comparison in Length, Dimensional Metrology
Pitch of gratings: 290 nm and 700 nm
Status   Approved and published, Results available
  SIM.L- S3.PREV Measurement of Rockwell hardness indenter geometry
1998
Comparison type, Field   Supplementary comparison in Length, Dimensional Metrology
Status   Published
  CCL- S3 Nanometrology: line scale standards
2000 - 2002
Comparison type, Field   Supplementary comparison in Length, Dimensional Metrology
Line structure: 4 µm width, 1 mm length
Status   Approved and published
  APMP.L- K1 Gauge blocks by interferometry
2001 - 2002
Comparison type, Field   Key comparison in Length, Dimensional Metrology
Status   Approved for equivalence, Results available
  CCL- K6 Two-dimensional coordinate measuring machine artefacts
2000 - 2003
Comparison type, Field   Key comparison in Length, Dimensional Metrology
Status   Approved for equivalence, Results available
  APMP.L- K2 Long gauge blocks from 200 to 500 mm
2000 - 2002
Comparison type, Field   Key comparison in Length, Dimensional Metrology
Status   Approved for equivalence, Results available
  CCL- K2 Long gauge blocks by interferometry
1999 - 2001
Comparison type, Field   Key comparison in Length, Dimensional Metrology
Status   Approved for equivalence, Results available
  CCL- S2 Nanometrology: step height standards
2000 - 2002
Comparison type, Field   Supplementary comparison in Length, Dimensional Metrology
Step height: between 7 nm and 800 nm
Status   Approved and published
  APMP.L- S1 Thermal expansion coefficient of gauge blocks
2004
Comparison type, Field   Supplementary comparison in Length, Dimensional Metrology
Parameter(s)   Temperature: 10 °C to 30 °C
Status   Approved and published
  APMP.L- K1.1 Gauge blocks by interferometry
2005 - 2006
Comparison type, Field   Key comparison in Length, Dimensional Metrology
Status   Approved for equivalence, Results available
  APMP.L- K11 Comparison of primary wavelength standards
2004
Comparison type, Field   Key comparison in Length, Laser Frequencies
633 nm
Status   Approved for equivalence, Results available
  APMP.L- K4 Diameter standards
2008 - 2010
Comparison type, Field   Key comparison in Length, Dimensional Metrology
Internal and external diameters
Status   Approved for equivalence, Results available
  CCL- S4 Nanometrology: two-dimensional gratings
1998 - 2000
Comparison type, Field   Supplementary comparison in Length, Dimensional Metrology
Pitch and angle
Status   Approved and published
  APMP.L- K3 Calibration of angle standards
2005 - 2007
Comparison type, Field   Key comparison in Length, Dimensional Metrology
Status   Approved for equivalence, Results available
  EURAMET.L- K3.2009 Angle comparison using an autocollimator
2009 - 2016
Comparison type, Field   Key comparison in Length, Dimensional Metrology
Status   Approved for equivalence, Results available
  APMP.L- S4 Geometrical roundness measurements using error separation
2012 - 2013
Comparison type, Field   Supplementary comparison in Length, Dimensional Metrology
Status   Approved and published