– the intergovernmental organization through which Member States act together
     on matters related to measurement science and measurement standards.
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BIPM staff members  

Director of the Chemistry Department; also Head of IT Services
Executive Secretary of the CCQM; Executive Secretary of the JCTLM

Contact details

    Dept./Section:      Chemistry Department
     E-mail (@bipm.org):       rwielgosz
     Tel.:       +33 1 45 07 62 51
     Fax:       +33 1 45 34 20 21


Dr Robert Wielgosz is the Director of the Chemistry Department within the BIPM, and responsible for the establishment, strategic development and management of the BIPM programme in Metrology in Chemistry; the formulation of programme needs and activities with stakeholders; coordination of international comparisons for air quality and greenhouse gas standards as well as organic small and large molecule primary calibrator standard comparisons. The comparison programme results in 170 participations from National Metrology Institutes (NMIs) each programme cycle.

Dr Wielgosz is the Executive Secretary for the Consultative Committee for Amount of Substance; Metrology in Chemistry and Biology (CCQM), which coordinates twenty international comparisons for NMIs annually, covering the fields of organic, inorganic, electrochemical, gas, surface and bio analysis. He is also Executive Secretary of the Joint Committee for Traceability and Laboratory Medicine (JCTLM), which develops and maintains an international database and review process for Reference Materials, Methods and Measurement Services for in vitro diagnostics. He represents the BIPM on the IUPAC Interdivisional Committee on Terminology, Nomenclature and Symbols (ICTNS).

Selected publications


Prior to establishing the Chemistry Department at the BIPM, Dr Wielgosz was a Senior Scientist at the National Physical Laboratory (UK). He has an M.A. in the Natural Sciences from Emmanuel College, Cambridge University, a Ph.D. on Electrochemical studies of Porous Silicon from the University of Bath, and he completed a Royal Society Postdoctoral Fellowship at the University of Ulm (Germany) investigating metal deposition processes on semiconductor surfaces using scanning probe microscopies.

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