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Calibration and characterization certificates: Finland
2016
No. 28 Ionization chamber FC65-G, No. 3360, in a 60Co gamma-ray beam STUK, Finland
No. 27 Ionization chamber FC65-G, No. 3360, in medium-energy x-rays STUK, Finland
No. 13 10 pF capacitance standard, Andeen-Hagerling model AH11A, No. 01195 MIKES, Finland
No. 12 10 pF capacitance standard, Andeen-Hagerling model AH11A, No. 01194 MIKES, Finland
No. 11 100 pF capacitance standard, Andeen-Hagerling model AH11A, No. 01193 MIKES, Finland
No. 10 100 pF capacitance standard, Andeen-Hagerling model AH11A, No. 01192 MIKES, Finland

2014
No. 76 Ionization chamber NE 2561, No. 097 in a 60Co gamma-ray beam STUK, Finland
No. 75 Ionization chamber NE 2561, No. 097 in medium-energy x-rays STUK, Finland
No. 74 Ionization chamber PTW 23344, No. 620, in mammography x-rays STUK, Finland
No. 73 Ionization chamber PTW 23344, No. 620 in low-energy x-rays STUK, Finland

2011
No. 93 1 kg mass prototype, No. 23 Finland
No. 88 100 pF capacitance standard, Andeen-Hagerling model AH11A, No. 01193 MIKES, Finland
No. 87 100 pF capacitance standard, Andeen-Hagerling model AH11A, No. 01192 MIKES, Finland
No. 86 10 pF capacitance standard, Andeen-Hagerling model AH11A, No. 01195 MIKES, Finland
No. 85 10 pF capacitance standard, Andeen-Hagerling model AH11A, No. 01194 MIKES, Finland

2010
No. 10 Ionization chamber PTW 23344, No. 620 in low-energy x-rays STUK, Finland
No. 9 Ionization chamber NE 2561, No. 097 in medium-energy x-rays STUK, Finland
No. 8 Ionization chamber NE 2561, No. 097 in a 60Co gamma-ray beam STUK, Finland

2009
No. 85 Volume magnetic susceptibility of sample, P17 1kg D MIKES, Finland

2007
No. 13 100 pF capacitance standard, No. 01193 MIKES, Finland
No. 12 100 pF capacitance standard, No. 01192 MIKES, Finland
No. 11 10 pF capacitance standard, No. 01195 MIKES, Finland
No. 10 10 pF capacitance standard, No. 01194 MIKES, Finland

2004
No. 40 100 pF capacitance standard, No. 01192 MIKES, Finland
No. 38 Helium-neon laser at 633 nm, MR13 MIKES, Finland
No. 16 Ionization chamber in 60Co gamma-ray beam, NE 2561-097 STUK, Finland
No. 15 Ionization chamber in medium-energy x-rays, NE 2561-097 STUK, Finland
No. 14 Ionization chamber in low-energy x-rays, NE 2536/3-R17827 STUK, Finland
No. 13 Ionization chamber in low-energy x-rays, PTW 23344-620 STUK, Finland

2001
No. 58 Prototype de masse, no 23 Finland

Study Notes
2005
No. 8 Helium-neon laser at 633 nm FGI, Finland

2004
No. 4 100 pF capacitance standard, No. 01193 MIKES, Finland
No. 3 10 pF capacitance standard, No. 01195 MIKES, Finland
No. 2 10 pF capacitance standard, No. 01194 MIKES, Finland

2001
No. 8 Laser à hélium-néon de longueur d'onde 633 nm, no 19 FGI, Finland
No. 7 Laser à hélium-néon de longueur d'onde 633 nm, no 18 FGI, Finland
Traceability to the SI through the BIPM
Subject area:
What is traceability?
BIPM policy on stating uncertainties
Provision of BIPM technical services per Member State
Chemistry
Electricity
Ionizing Radiation
Mass
Time
Related articles
BIPM calibration and measurement services
Comparisons piloted by the BIPM