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Metrologia, 1989, 26(1), 63-68
Technical Guidelines for Reliable Measurements of the Quantized Hall Resistance
Delahaye F.

Full text available on-line: http://stacks.iop.org/met/26/63


References in Metrologia: 1 Citations in Metrologia: 10
References in Metrologia
Delahaye F., Dominguez D., Alexandre F., Andre J.P., Hirtz J.P., Razeghi M.
Precise Quantized Hall Resistance Measurements in GaAs/AlxGa1–xAs and InxGa1–xAs/InP Heterostructures
Metrologia, 1986, 22, n°2, 103-110
Citations in Metrologia
Schurr J., Kučera J., Pierz K., Kibble B.P.
The quantum Hall impedance standard
Metrologia, 2011, 48, n°1, 47-57
Schurr J., Bürkel V., Kibble B.P.
Realizing the farad from two ac quantum Hall resistances
Metrologia, 2009, 46, n°6, 619-628
Ahlers F.J., Jeanneret B., Overney F., Schurr J., Wood B.M.
Compendium for precise ac measurements of the quantum Hall resistance
Metrologia, 2009, 46, n°5, R1-R11
Poirier W., Bounouh A., Piquemal F., André J.-P.
A new generation of QHARS: discussion about the technical criteria for quantization
Metrologia, 2004, 41, n°4, 285-294
Delahaye F., Jeckelmann B.
Revised technical guidelines for reliable dc measurements of the quantized Hall resistance
Metrologia, 2003, 40, n°5, 217-223
Delahaye F., Kibble B.P., Zarka A.
Controlling ac losses in quantum Hall effect devices
Metrologia, 2000, 37, n°6, 659-670
Jeffery A., Elmquist R.E., Shields J.Q., Lee L.H., Cage M.E., Shields S.H., Dziuba R.F.
Determination of the von Klitzing constant and the fine-structure constant through a comparison of the quantized Hall resistance and the ohm derived from the NIST calculable capacitor
Metrologia, 1998, 35, n°2, 83-96
Jeckelmann B., Inglis A.D., Jeanneret B.
Short Communication: Are anomalous values of the quantized Hall resistance really anomalous?
Metrologia, 1996, 33, n°5, 499-502
Hartland A.
The Quantum Hall Effect and Resistance Standards
Metrologia, 1992, 29, n°2, 175-190
Dominguez S., von Klitzing K., Ploog K.
Optimization of the Contact Geometry for Accurate Quantized Hall Resistance Measurements
Metrologia, 1989, 26, n°3, 197-201