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Metrologia is an international journal dealing with the scientific aspects of metrology.
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Goebel R.,
Chrobok P., Fletcher N., Stock M.,
Final report on the bilateral comparison of 1  standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the CMI (Czech Republic) and the BIPM,
Metrologia,
2008,
45, Tech. Suppl.,
01004
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GoebeL R.,
Elmquist R., Fletcher N., Stock M.,
Final report on the bilateral comparison of 1 standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the NIST (USA) and the BIPM,
Metrologia,
2008,
45, Tech. Suppl.,
01001
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Power O.,
Fletcher N.,
Final report on the bilateral comparison of 100 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.b) between the NML, Ireland and the BIPM, June-October 2007,
Metrologia,
2008,
45, Tech. Suppl.,
01002
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A. S. Katkov,
S. Solve, M. Stock,
Bilateral comparison of 10 V standards between the VNIIM (Russia) and the BIPM, August to October 2007 (part of the ongoing BIPM key comparison BIPM.EM-K11.b),
Rapport BIPM-2007/07,
10 pp
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Fischer J.,
Stock M. et al.,
Preparative steps towards the new definition of the kelvin in terms of the Boltzmann constant,
Int. J. Thermophysics,
2007,
28(6),
1753-1765
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Fletcher N.E.,
Giblin S.P., Williams J.M., Lines K.L.,
New capability for generating and measuring small dc currents at NPL,
IEEE Trans. Instrum. Meas.,
2007,
56,
326-330
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Litorja M.,
Fowler J., Hartmann J., Fox N., Stock M., Razet A., Khlevnoy B., Ikonen E., Machacs M., Doytchinov K.,
Final report on the CCPR-S2 supplementary comparison of area measurements of apertures for radiometry,
Metrologia,
2007,
44, Tech. Suppl.,
02002
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Picard A.,
Fang H., Stock M.,
The BIPM watt balance: Progress and principle,
Proc. 20th IMEKO TC3 Conference,
2007,
12 pp
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Picard A.,
Stock M., Fang H., Witt T.J., Reymann D.,
The BIPM watt balance,
IEEE Trans. Instrum. Meas.,
2007,
56,
538-542
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Power O.,
Solve S., Stock M., Witt T.J.,
Bilateral comparison of 10 V standards between the NML (Ireland) and the BIPM, March to April 2007 (part of the ongoing BIPM key comparison BIPM.EM-K11.b),
Rapport BIPM-2007/03,
7 pp
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Reymann D.,
Solve S.,
Limits to the accuracy of 10 V Josephson standards revealed by BIPM on-site comparisons,
IEEE Trans. Instrum. Meas.,
2007,
56,
555-558
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Solve S.,
Chayramy R., Reymann D.,
A new fully automated measurement chain for electronic voltage standards at 1.018 V,
IEEE Trans. Instrum. Meas.,
2007,
56,
588-591
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Solve S.,
Chayramy R., van den Brom H.E., Houtzager E.,
Comparison of the Josephson voltage standards of NMi-VSL and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b),
Rapport BIPM-2007/01,
12 pp
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Stock M.,
Watt balance experiments: towards an improved SI system,
Proc. VII Semetro, Belo Horizonte,
2007,
4 pp
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Witt T.J.,
Using the autocorrelation function to characterize time series of voltage measurements,
Metrologia,
2007,
44(3),
201-209
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Georgieva U.,
Reymann D., Witt T.J.,
Bilateral comparison of 1.018 V and 10 V standards between the NCM (Bulgaria) and the BIPM, April to June 2006 (part of the ongoing BIPM key comparisons BIPM.EM-K11.a and .b),
Rapport BIPM-2006/05,
7 pp
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Klushin A.M.,
Solve S. et al.,
A new millimeterwave synthesizer for Josephson voltage standards,
CPEM 2006 Digest,
2006,
368-369
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Popovici G.,
Cirneanu L., Simionescu M., Jaouen A., Delahaye F., Fletcher N., Witt T.J.,
Bilateral comparison of 1 standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the INM (Romania) and the BIPM, May 2006,
Rapport BIPM-2006/11,
6 pp
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Popovici G.,
Cirneanu L., Simionescu M., Jaouen A., Delahaye F., Fletcher N., Witt T.J.,
Bilateral comparison of 10 k standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the INM (Romania) and the BIPM, April 2006,
Rapport BIPM-2006/12,
7 pp
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Power O.,
Jaouen A., Delahaye F., Fletcher N., Witt T.J.,
Bilateral comparison of 1 standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the NML (Ireland) and the BIPM, April 2006,
Rapport BIPM-2006/13,
6 pp
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Power O.,
Jaouen A., Delahaye F., Fletcher N., Witt T.J.,
Bilateral comparison of 10 k standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the NML (Ireland) and the BIPM, April 2006,
Rapport BIPM-2006/14,
6 pp
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Power O.,
Reymann D., Witt T.J.,
Bilateral comparison of 10 V standards between the NML (Ireland) and the BIPM, April to June 2006 (part of the ongoing BIPM key comparison BIPM.EM-K11.b),
Rapport BIPM-2006/04,
6 pp
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Reymann D.,
Solve S., Afonso E., Ferreira V., Landim R.P.,
Comparison of the Josephson voltage standards of the INMETRO and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b),
Rapport BIPM-2006/06,
14 pp
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Reymann D.,
Solve S., Budovsky I., Rigby R.,
Comparison of the Josephson voltage standards of the NMIA and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b),
Rapport BIPM-2006/09,
12 pp
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Reymann R.,
Solve S., Nunes M.C., Ribeiro L.F.,
Comparison of the Josephson voltage standards of the INETI and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b),
Rapport BIPM-2006/03,
11 pp
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Stock M.,
Watt balances and the future of the kilogram,
Proc. Symposium of Metrology 2006, Quéretaro, Mexico,
2006,
6 pp
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Stock M.,
Solve S., del Campo D., Chimenti V., Méndez-Lango E., Liedber H., Steur P.P.M., Marcarino P., Dematteis R., Filipe E., Lobo I., Kang K.H., Gam K.S., Kim Y.-G., Renaot E., Bonnier G., Valin M., White R., Dransfield T.D., Duan Y., Xiaoke Y., Strouse G., Ballico M., Sukkar D., Arai M., Mans A., de Groot M., Kerkhof O., Rusby R., Gray J., Head D., Hill K., Tegeler E., Noatsch U., Duris S., Kho H.Y., Ugur S., Pokhodun A., Gerasimov S.F.,
Final Report on CCT-K7: Key comparison of water triple point cells,
Metrologia,
2006,
43, Tech. Suppl.,
03001
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Stock M.,
Witt T.J.,
International news - CPEM 2006 Round table discussion 'Proposed changes to the SI',
Metrologia,
2006,
43(6),
583-592
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Stock M.,
Solve S.,
International comparison of water triple point cells leading to a more precise definition of the kelvin,
Proc. Symposium of Metrology 2006, Quéretaro, Mexico,
2006,
6 pp
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Urano C,,
Reymann D., Solve S. et al.,
Comparison of two 10 V Josephson arrays of the NMIJ-AIST,
CPEM 2006 Digest,
2006,
392-393
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Delahaye F.,
Goebel R.,
Evaluation of the frequency dependence of the resistance and capacitance standards in the BIPM quadrature bridge,
IEEE Trans. Instrum. Meas.,
2005,
54(2),
533-537
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Reymann D.,
Power O, Witt T.J.,
Bilateral comparison of 10 V standards between the NML (Ireland) and the BIPM, March to April 2005 (part of the ongoing BIPM key comparison BIPM.EM-K11.b),
Rapport BIPM-2005/04,
6 pp
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Reymann D.,
Solve S., Hernandez R., Perez S., Raso F.,
Comparison of the Josephson voltage standards of the CEM and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b),
Rapport BIPM-2005/12,
7 pp
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Reymann D.,
Solve S., Porter C.H., Jansen T.J.B.M., Williams J.M.,
Comparison of the Josephson voltage standards of the NPL and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b),
Rapport BIPM-2005/02,
10 pp
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Reymann D.,
Solve S., Urano C., Marayama Y., Yoshida H.,
Comparison of the Josephson voltage standards of the NMIJ-AIST and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b),
Rapport BIPM-2005/13,
9 pp
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Reymann D.,
Solve S., Waldmann W., Heine G., Scheibenreiter P., Pribil J.,
Comparison of the Josephson voltage standards of the BEV and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b),
Rapport BIPM-2005/14,
7 pp
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Reymann D.,
Solve S., Wood B.,
Comparison of the Josephson voltage standards of the NRC and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b),
Rapport BIPM-2005/03,
14 pp
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Witt T.J.,
Allan variances and spectral densities for DC voltage measurements with polarity reversals,
IEEE Trans. Instrum. Meas.,
2005,
54(2),
550-553
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Witt T.J.,
Tang Y.,
Investigations of noise in measurements of electronic voltage standards,
IEEE Trans. Instrum. Meas.,
2005,
54(2),
567-570
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Delahaye F.,
Holiastou M., Flouda E., Jaouen A., Witt T.J.,
Bilateral comparison of 10 k standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the EIM, Greece and the BIPM, September 2003,
Rapport BIPM-2004/07,
8 pp
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Delahaye F.,
Power O., Jaouen A., Witt T.J.,
Bilateral comparison of 10 k standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the NML (Ireland) and the BIPM, June 2004,
Rapport BIPM-2004/14,
6 pp
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Delahaye F.,
Power O., Jaouen A., Witt T.J.,
Bilateral comparison of 1 standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the NML (Ireland) and the BIPM, June 2004,
Rapport BIPM-2004/13,
5 pp
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Power O.,
Delahaye F.,
Bilateral comparison of 100 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.b between the NML, Ireland and the BIPM, January/April 2004,
Rapport BIPM-2004/10,
7 pp
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Reymann D.,
Frenkel R., Witt T.J.,
Bilateral comparison of 1.018 V and 10 V standards between the NML/CSIRO (Australia) and the BIPM, October to December 2003 (part of the ongoing BIPM key comparisons BIPM.EM-K11a & b),
Rapport BIPM-2004/03,
8 pp
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Reymann D.,
Power O., Witt T.J.,
Bilateral comparison of 10 V standards between the NML (Ireland) and the BIPM, March to May 2004 (part of the ongoing BIPM key comparison BIPM.EM-K11b),
Rapport BIPM-2004/09,
12 pp
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Reymann D.,
Tarnow E., Witt T.J.,
Bilateral comparison of 10 V standards between the CSIR-NML (South Africa) and the BIPM, October to December 2003 (part of the ongoing BIPM key comparison BIPM.EM-K11b),
Rapport BIPM-2004/02,
13 pp
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Yu K.M.,
Jaouen A., Delahaye F., Witt T.J.,
Bilateral comparison of 1 standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the KRISS, Republic of Korea and the BIPM, June 2003,
Rapport BIPM-2004/01,
7 pp
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Behr R.,
Kohlmann J., Janssen T.J.B.M., Kleinschmidt P., Williams J.M., Djordjevic S., Lo-Hive J.-P., Piquemal F., Hetland P.O., Reymann D., Eklund G., Hof Ch., Jeanneret B., Chevtchenko O., Houtzager E., Brom H. van den Sosso A., Andreone D., Nissilä J., Helisto P.,
Analysis of different measurement setups for a programmable Josephson voltage standard,
IEEE Trans. Instrum. Meas,
2003,
52,
524-528
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Delahaye F.,
Awan S.A.,
Bilateral comparison of 10 pF and 100 pF capacitance standards (ongoing BIPM key comparisons BIPM.EM-K14.a and BIPM.EM-K14.b) between the NPL and the BIPM, April/May 2002 (report modified July 2004),
Rapport BIPM-2003/01,
10 pp
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Delahaye F.,
Jeckelmann B.,
Revised technical guidelines for reliable dc measurements of the quantized Hall resistance,
Metrologia,
2003,
40(5),
217-223
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Kupec J.,
Ahlers H., Belliss J., Bryant S., Fiorillo F., Khorev V., Kohout V., Shifrin V., Weyand K.,
EUROMET EM.M-S1 - EUROMET Project No. 597: Comparison of magnetic flux by means of a coil transfer standard,
Metrologia,
2003,
40, Tech. Suppl.,
01006
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Liefrink F.,
Dierikx E.F., Heimeriks J.W., Eklund G., Flouda I., Funck T., Helistö P., Jakab A., Janssen J.-T., Jeanneret B., Jensen H.D., Hetland P.O., Lindic M., Lo-Hive J.-P., Nicolas J., Nunes M., Power O., Raso Alonso F.I., Reymann D., Selçik S., Streit J., Vrab,
EUROMET project no 429: Comparison of 10 V electronic voltage standards,
Metrologia,
2003,
40, Tech. Suppl.,
01004
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Power O.,
Reymann D., Witt T.J.,
Bilateral comparison of 10 V standards (part of the ongoing BIPM key comparison BIPM.EM-K11.b) between the NML (Ireland) and the BIPM, March 2003,
Rapport BIPM-2003/06,
6 pp
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Reymann D.,
Link between the comparison EUROMET.EM.BIPM-K11.b and the ongoing comparison BIPM.EM-K11.b,
Metrologia,
2003,
40, Tech. Suppl.,
01005
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Witt T.J.,
Experimental sampling distributions and confidence intervals of the Allan variance in some DC electrical measurements,
IEEE Trans. Instrum. Meas,
2003,
52,
487-490
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Delahaye F.,
Witt T.J.,
Linking the results of key comparison CCEM-K4 with the 10 pF results of EUROMET.EM-K4,
Metrologia,
2002,
39, Tech. Suppl.,
01005
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Power O.,
Jaouen A., Delahaye F., Witt T.J.,
Bilateral comparison of 1 standards between NML, Ireland and the BIPM, March 2002,
Rapport BIPM-2002/13,
6 pp
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Power O.,
Jaouen A., Delahaye F., Witt T.J.,
Bilateral comparison of 10 k standards between NML, Ireland and the BIPM, March 2002,
Rapport BIPM-2002/14,
6 pp
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Powers O.,
Reymann D., Witt T.J.,
Bilateral comparison of 1.018 V and 10 V standards between the NML (Ireland) and the BIPM, March 2002,
Rapport BIPM-2002/05,
7 pp
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Witt T.J.,
Maintenance and dissemination of voltage standards by Zener-diode-based instruments,
IEE Proc. Sci. Meas. Technol,
2002,
149,
305-312
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Delahaye F.,
Instructions for ac measurements of gated QHE devices,
Rapport BIPM-2001/01,
11 pp
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Power O.,
Reymann D., Witt T.J.,
Bilateral comparisons of 10 V standards between the NML, Ireland and the BIPM, March 2001,
Rapport BIPM-2001/02,
4 pp
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Reymann D.,
Witt T.J., Vrabcek, P., Tang Y.H., Hamilton C.A., Katkov A.S., Jeanneret B., Power O.,
Recent developments in BIPM voltage standard comparisons,
IEEE Trans. Instrum. Meas.,
2001,
50,
206-209
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Satrapinski A.,
Seppä H., Schumacher B., Warnecke P., Delahaye F., Poirier W., Piquemal F.,
Comparison of four QHR systems within one month using a temperature and pressure stabilized W resistor,
IEEE Trans. Instrum. Meas.,
2001,
50,
238-241
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Sochocka D.,
Stanioch W., Reymann D., Witt T.J.,
Bilateral comparison of 1.018 V and
10 V standards between the GUM, Poland and the BIPM, May 2001,
Rapport BIPM-2001/06,
7 pp
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Vrabcek P.,
Reymann D., Witt T.J.,
Bilateral comparison of 1.018 V and 10 V standards between the SMU, Slovakia and the BIPM, April 2001,
Rapport BIPM-2001/05,
7 pp
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Waldmann W.,
Reymann D., Witt T.J.,
Bilateral comparison of 1.018 V and 10 V standards between the BEV, Austria and the BIPM, April 2001,
Rapport BIPM-2001/03,
7 pp
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Witt T.J.,
Using the Allan variance and power spectral density to characterize dc nanovoltmeters,
IEEE Trans. Instrum. Meas.,
2001,
50,
445-448
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Chrobok P.,
Jaouen A., Delahaye F., Witt T.J.,
Bilateral comparisons of 10 k standards between the CMI, Czech Republic and the BIPM, April 2000,
Rapport BIPM-2000/10,
6 pp
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Delahaye F.,
Witt T.J., Elmquist R.E., Dziuba R.F.,
Comparison of quantum Hall effect resistance standards of the NIST and the BIPM,
Metrologia,
2000,
37(2),
173-176
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Delahaye F.,
Kibble B.P., Zarka A.,
Controlling ac losses in quantum Hall effect devices,
Metrologia,
2000,
37(6),
659-670
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Power O.,
Jaouen A., Delahaye F., Witt T.J.,
Bilateral comparison of 1 standards between NML, Ireland and the BIPM, April 2000,
Rapport BIPM-2000/08,
6 pp
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Power O.,
Jaouen A., Delahaye F., Witt T.J.,
Bilateral comparison of 10 k standards between NML, Ireland and the BIPM, April 2000,
Rapport BIPM-2000/07,
6 pp
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Power. O.,
Reymann D., Witt T.J.,
Bilateral comparison of 1.018 V and 10 V standards between the NML, Ireland and the BIPM, April 2000,
Rapport BIPM-2000/02,
7 pp
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Sebela A.,
Reymann D., Witt T.J.,
Bilateral comparison of 1.018 V and 10 V standards between the CMI, Czech Republic and the BIPM, April 2000,
Rapport BIPM-2000/03,
7 pp
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Witt T.J.,
Testing for correlations in measurements,
Advanced Mathematical and Computational Tools in Metrology IV,
World Scientific (P. Ciarlini, A.B. Forbes, F. Pavese & D. Richter eds),
200 | |
