| |
No. |
Title |
Author |
Affiliation |
 |
S-00 |
Introduction: Workshop objectives |
Maurice Cox |
NPL (UK) |
|
S-01 |
Is it possible to reduce costs and increase benefits of key comparisons? |
Lars Nielsen |
DFM (Denmark) |
|
S-02 |
Statistical analysis on uncertainty for autocorrelated measurements and its applications to key comparisons |
Nien-Fan Zhang |
NIST (USA) |
|
S-03 |
Problems for the KCDB concerning updating of published results to take posterior information into account: the case of isotopic systematic effect in thermal metrology |
Franco Pavese |
IMGC (Italy) |
|
S-04 |
The evaluation of key comparison data: determining the largest consistent subset |
Maurice Cox |
NPL (UK) |
|
S-05 |
Specific techniques for analysing key comparison results |
Alan Steele, Rob Douglas |
NRC (Canada) |
|
S-06 |
Key comparison data evaluation for unstable artefacts |
Wolfgang Wöger |
PTB (Germany) |
|
S-07 |
Considerations for the deta evaluation of key comparisons involving several artefacts |
Maurice Cox, Peter Harris, Emma Woolliams |
NPL (UK) |
|
S-08 |
Bayesian analysis of key comparison data with large uncertainty B |
Blaza Toman |
NIST (USA) |
|
S-09 |
Algorithms for calculating a detree of equivalence of measurement standards in RMO key comparisons |
Anna Chunovkina |
VNIIM (Russian Fed.) |
|
S-10 |
Confronting the linkage problem for multiple key and supplementary comparisons |
Nell Sedransk |
NIST (USA) |
|
S-11 |
The BIPM key comparison database (KCDB): linkage of key comparison results
[See also Rapport BIPM-2005/06] |
Claudine Thomas |
BIPM |
|
S-12 |
Towards a framework for key comparison data evaluation: Panel discussion |
Maurice Cox |
NPL (UK) |
16 mai 2005
