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Atelier NMIJ-BIPM : Présentations 26-40
English version
Au sommaire
Atelier NMIJ-BIPM : Présentations 1-14
Atelier NMIJ-BIPM : Présentations 15-25
Atelier NMIJ-BIPM : Présentations 26-40
Satellite Workshop on Key Comparison Data Evaluation
Accès direct

20 mai 2005


  No. Title Author Affiliation
WS-26 Microsensor arrays for trace chemical detection John Lu, Nell Sedransk NIST (USA)
WS-27 Ensuring best practice in software and IT for metrology Seton Bennett, Trevor Esward NPL (UK)
WS-28 Distributed computing: an important new tool for metrologists Trevor Esward NPL (UK)
WS-29 The use of Monte Carlo techniques for metrology – evaluation of uncertainties and simulation of experiments Bernd Siebert PTB (Germany)
WS-30 Use of Penelope Monte-Carlo technique for metrology in nuclear medicine K.B. Lee KRISS (Rep. Korea)
WS-31 Simulation of proficiency testing results using the Monte Carlo technique Kil-Hoon Ahn KRISS (Rep. Korea)
WS-32 Monte Carlo uncertainties: choosing parent distributions Alan Steele, Rob Douglas NRC (Canada)
WS-33 Bayesian computation for linear regression and analysis of variance models Blaza Toman NIST (USA)
WS-34 Software components for measurement Blair Hall MSL (New Zealand)
WS-35 Supplements to the Guide to the Expression of Uncertainty in Measurement Maurice Cox, Peter Harris NPL (UK)
WS-36 Software validation in metrology: experience from PTB's activities Dieter Richter PTB (Germany)
WS-37 Legal metrology requirements for software in measuring instruments Tanaski Tasic MIRS (Slovenia)
WS-38 Web-based application for polynomial thermoelectric calculation and verification of its correction curve Uros Palmin MIRS (Slovenia)
WS-39 Metrological certification of algorithms and validation of corresponding software intended for measurement data processing Anna Chunovkina, Alexander Stepanov VNIIM (Russian Fed.)
WS-40 The evaluation of "intelligent" measurement instruments Gert Rietveld NMi (Netherlands)