Home    Key and supplementary comparisons    Calibration and Measurement Capabilities - CMCs
The BIPM key comparison database
Refine your search
CMC AREA
CMCs General Physics (2)
PHYSICS
Dimensional metrology (2)
Surface texture (2)
End standards
CHEMICAL ANALYTE
lead
GEOGRAPHIC LOCATION
SIM (2)
Mexico (2)
Result of the search
Your query 'cenam' produced 2 results New search

 
Mexico, CENAM (Centro Nacional de Metrologia)
Complete CMCs in Length for Mexico (.PDF file)
Surface texture. Groove or step-height standard: step height, H, 0.03 µm to 10 µm
Absolute expanded uncertainty (k = 2, level of confidence 95%) in nm: (15 + 2.7H), H in µm, ranges from 15 nm to 42 nm
2-D profile stylus instrument
Approved on 14 June 2004
Internal NMI service identifier: CENAM/32
 
Surface texture. Roughness standard: roughness parameter, 0.01 µm to 20 µm
Absolute expanded uncertainty (k = 2, level of confidence 95%) in nm: (10 + 18P), P in µm, ranges from 10 nm to 370 nm
2-D profile stylus instrument
Roughness parameter PRa, Rz, Rmax
Approved on 14 June 2004
Internal NMI service identifier: CENAM/33