BIPM - metrology for dynamic measurement

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BIPM Workshop on Challenges in Metrology for Dynamic Measurement: 15-16 November 2012
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BIPM Workshop on Challenges in Metrology for Dynamic Measurement
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Background
The traceability from NMI-level to the calibration laboratory is usually available on a static basis. Currently, there are only a few facilities in some NMIs where research in the field of dynamic measurement is performed. In particular, at present, a verification of dynamic measurement capabilities via key comparisons is a long way off, due to a lack of validated methods and accepted procedures.

Rationale
The aim of this workshop was to bring together experts from the NMIs and industrial users who have needs of traceable, reliable and comparable dynamic measurements, as well as those responsible for writing and applying specification standards and/or environment, energy saving and safety legislation.
The expected outcomes of the process initiated by the Workshop are:

  • a collaboration aimed at characterizing the challenges in the field of dynamic measurements traceable to the SI;
  • harmonization of terms and methods so that measurements made by various methodologies can be related to each other, thereby enabling comparability of research work and a consistent approach to the estimation of measurement results and their uncertainties; and
  • best practice guides and/or documents which could be adopted as the basis for the measurement aspects of international standardization, regulation and/or legislation.

Participation
Participation at the workshop was by invitation only. NMI Directors were invited to nominate participants. Space was limited to one participant per NMI or in exceptional cases two participants.

BIPM Workshop on Metrology for Dynamic Measurement
Date: 15-16 November 2012
Venue: BIPM, Sèvres France
Agenda

Scientific Steering Committee:
T. Usuda (Chair) NMIJ AIST (Japan)
F. Arrhen SP (Sweden)
T. Bruns PTB (Germany)
T. Esward NPL (United Kingdom)
J. Filtz LNE (France)
N. Fletcher (Scientific Secretary) BIPM
J. Wright NIST (United States)
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Summary


Agenda