New search facility:  
BIPM Home | Site map | Metrology portal | KCDB | JCTLM-DB | Contact us  
   
Calibration and characterization certificates: Finland
 
Traceability to the SI through the BIPM
Subject area:
What is traceability?
BIPM policy on stating uncertainties
Summary
BIPM services in the field of electricity
BIPM services in the field of ionizing radiation
BIPM calibrations and services in mass and related quantities
BIPM services in the field of time, frequency and gravimetry
Related articles
Ongoing comparisons conducted by the BIPM
Database
Direct access

For other services offered by the BIPM, please refer to the summary charts for electricity, ionizing radiation, mass and time, frequency and gravimetry.

2011
No. 93 1 kg mass prototype, No. 23 Finland
No. 88 100 pF capacitance standard, Andeen-Hagerling model AH11A, No. 01193 MIKES, Finland
No. 87 100 pF capacitance standard, Andeen-Hagerling model AH11A, No. 01192 MIKES, Finland
No. 86 10 pF capacitance standard, Andeen-Hagerling model AH11A, No. 01195 MIKES, Finland
No. 85 10 pF capacitance standard, Andeen-Hagerling model AH11A, No. 01194 MIKES, Finland

2010
No. 10 Ionization chamber PTW 23344, No. 620 in low-energy x-rays STUK, Finland
No. 9 Ionization chamber NE 2561, No. 097 in medium-energy x-rays STUK, Finland
No. 8 Ionization chamber NE 2561, No. 097 in a 60Co gamma-ray beam STUK, Finland

2009
No. 85 Volume magnetic susceptibility of sample, P17 1kg D MIKES, Finland

2007
No. 13 100 pF capacitance standard, No. 01193 MIKES, Finland
No. 12 100 pF capacitance standard, No. 01192 MIKES, Finland
No. 11 10 pF capacitance standard, No. 01195 MIKES, Finland
No. 10 10 pF capacitance standard, No. 01194 MIKES, Finland

2004
No. 40 100 pF capacitance standard, No. 01192 MIKES, Finland
No. 38 Helium-neon laser at 633 nm, MR13 MIKES, Finland
No. 16 Ionization chamber in 60Co gamma-ray beam, NE 2561-097 STUK, Finland
No. 15 Ionization chamber in medium-energy x-rays, NE 2561-097 STUK, Finland
No. 14 Ionization chamber in low-energy x-rays, NE 2536/3-R17827 STUK, Finland
No. 13 Ionization chamber in low-energy x-rays, PTW 23344-620 STUK, Finland

2001
No. 58 Prototype de masse, no 23 Finland

Study Notes
2005
No. 8 Helium-neon laser at 633 nm FGI, Finland

2004
No. 4 100 pF capacitance standard, No. 01193 MIKES, Finland
No. 3 10 pF capacitance standard, No. 01195 MIKES, Finland
No. 2 10 pF capacitance standard, No. 01194 MIKES, Finland

2001
No. 8 Laser à hélium-néon de longueur d'onde 633 nm, no 19 FGI, Finland
No. 7 Laser à hélium-néon de longueur d'onde 633 nm, no 18 FGI, Finland