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2011
No. 93 |
1 kg mass prototype, No. 23 |
Finland |
No. 88 |
100 pF capacitance standard, Andeen-Hagerling model AH11A, No. 01193 |
MIKES, Finland |
No. 87 |
100 pF capacitance standard, Andeen-Hagerling model AH11A, No. 01192 |
MIKES, Finland |
No. 86 |
10 pF capacitance standard, Andeen-Hagerling model AH11A, No. 01195 |
MIKES, Finland |
No. 85 |
10 pF capacitance standard, Andeen-Hagerling model AH11A, No. 01194 |
MIKES, Finland |
2010
No. 10 |
Ionization chamber PTW 23344, No. 620 in low-energy x-rays |
STUK, Finland |
No. 9 |
Ionization chamber NE 2561, No. 097 in medium-energy x-rays |
STUK, Finland |
No. 8 |
Ionization chamber NE 2561, No. 097 in a 60Co gamma-ray beam |
STUK, Finland |
2009
No. 85 |
Volume magnetic susceptibility of sample, P17 1kg D |
MIKES, Finland |
2007
No. 13 |
100 pF capacitance standard, No. 01193 |
MIKES, Finland |
No. 12 |
100 pF capacitance standard, No. 01192 |
MIKES, Finland |
No. 11 |
10 pF capacitance standard, No. 01195 |
MIKES, Finland |
No. 10 |
10 pF capacitance standard, No. 01194 |
MIKES, Finland |
2004
No. 40 |
100 pF capacitance standard, No. 01192 |
MIKES, Finland |
No. 38 |
Helium-neon laser at 633 nm, MR13 |
MIKES, Finland |
No. 16 |
Ionization chamber in 60Co gamma-ray beam, NE 2561-097 |
STUK, Finland |
No. 15 |
Ionization chamber in medium-energy x-rays, NE 2561-097 |
STUK, Finland |
No. 14 |
Ionization chamber in low-energy x-rays, NE 2536/3-R17827 |
STUK, Finland |
No. 13 |
Ionization chamber in low-energy x-rays, PTW 23344-620 |
STUK, Finland |
2001
No. 58 |
Prototype de masse, no 23 |
Finland |
Study Notes
2005
No. 8 |
Helium-neon laser at 633 nm |
FGI, Finland |
2004
No. 4 |
100 pF capacitance standard, No. 01193 |
MIKES, Finland |
No. 3 |
10 pF capacitance standard, No. 01195 |
MIKES, Finland |
No. 2 |
10 pF capacitance standard, No. 01194 |
MIKES, Finland |
2001
No. 8 |
Laser à hélium-néon de longueur d'onde 633 nm, no 19 |
FGI, Finland |
No. 7 |
Laser à hélium-néon de longueur d'onde 633 nm, no 18 |
FGI, Finland |
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