New search facility:  
BIPM Home | Site map | Metrology portal | KCDB | JCTLM-DB | Contact us  
  > You are here: BIPM > calibration and measurement services > calibration certificates  
Calibration and characterization certificates: Egypt
 
Traceability to the SI through the BIPM
Subject area:
What is traceability?
BIPM policy on stating uncertainties
Summary
BIPM services in the field of electricity
BIPM services in the field of ionizing radiation
BIPM calibrations and services in mass and related quantities
BIPM services in the field of time, frequency and gravimetry
Related articles
Ongoing comparisons conducted by the BIPM
Database

• Direct access   
Direct access
• USEFUL LINKS
• ACRONYMS
• CIPM MRA
• KCDB
• JCTLM DATABASE
• MEETINGS
• CC DIRECTORY
• BIPM STAFF DIRECTORY
• PRACTICAL INFORMATION
• THE TIME
• METROLOGIA
• FUNDAMENTAL PHYSICAL
  CONSTANTS

For other services offered by the BIPM, please refer to the summary charts for electricity, ionizing radiation, mass and time, frequency and gravimetry.

2011
No. 1 1 kg mass prototype, No. 58 Egypt

 2010
No. 43 1 kg mass standard in stainless steel, E1 NIS, Egypt
No. 42 1 kg mass standard in stainless steel, A NIS, Egypt

 2009
No. 67 10 000 ohm resistance standard, No. 307106 NIS, Egypt
No. 66 1 ohm resistance standard, No. 1679692 NIS, Egypt
No. 65 1 ohm resistance standard, No. 1684330 NIS, Egypt
No. 64 1 ohm resistance standard, No. 1681958 NIS, Egypt
No. 56 Zener diode voltage standard, No. 8140006 NIS, Egypt
No. 55 Zener diode voltage standard, No. 8140009 NIS, Egypt

 2007
No. 43 Zener diode voltage standard, No. 8 140 006 NIS, Egypt
No. 39 Helium-neon laser at 633 nm, No. 299s NIS, Egypt
No. 27 1 ohm resistance standard, No. 1684330 NIS, Egypt
No. 26 1 ohm resistance standard, No. 1681958 NIS, Egypt
No. 18 Ionization chamber in low-energy x-rays, No. 1250 NIS, Egypt
No. 17 Ionization chamber in medium-energy x-rays, No. 2016 NIS, Egypt
No. 16 Ionization chamber in gamma-ray beams, No 2016 NIS, Egypt
No. 15 Ionization chamber in medium-energy x-rays, No.229 NIS, Egypt
No. 14 Ionization chamber in gamma-ray beams, No. 229 NIS, Egypt

 2004
No. 71 Helium-neon laser at 633 nm, No. 299s NIS, Egypt
No. 39 Zener diode voltage standard, No. 8140006 NIS, Egypt

 2002
No. 49 1 ohm resistance standard, No. 168 433 0 NIS, Egypt
No. 48 1 ohm resistance standard, No. 167 969 2 NIS, Egypt
No. 47 1 ohm resistance standard, No. 168 195 8 NIS, Egypt
No. 18 Ionization chamber in 60Co gamma-ray beam, PTW 23343-2862 NIS, Egypt
No. 17 Ionization chamber in 60Co gamma-ray beam, NE 2571-1262 NIS, Egypt
No. 16 Ionization chamber in 60Co gamma-ray beam, NE 2561-229 NIS, Egypt
No. 15 Ionization chamber in medium-energy x-rays, NE 2571-1262 NIS, Egypt
No. 14 Ionization chamber in medium-energy x-rays, NE 2561-229 NIS, Egypt
No. 13 Étalon de force électomotrice à diode de Zener, no 582 5005 NIS, Egypt
No. 12 Prototype de masse, no 58 Egypt

Study Notes
2010
No. 3 1 kg mass standard in stainless steel, E0 NIS, Egypt

 2009
No. 6 1.018 V electronic voltage standard, No. 8140003 NIS, Egypt
 
> You are here: BIPM > calibration and measurement services > calibration certificates Printable version   Back to top