A series of invited papers will review the contributions that quantum-based technologies have brought to current metrology. There is an open call for papers addressing progress in quantum metrology and future developments particularly in those branches of metrology that have not yet seen applications of quantum-based technologies. In addition to 20 minute oral presentations, there will be opportunities to present posters.
Participants wishing to submit an abstract (of 200 to 300 words) for a presentation or poster should use the template available at:
The deadline for abstracts is 31 March 2017.
Acceptance will be notified to the participants by 28 April 2017.
A registration form to apply to participate in the workshop can be found at:
On-line application form
The deadline for registration is 26 May 2017.
Participation will be confirmed by 31 May 2016.