New search facility:  
BIPM Home | Site map | Metrologia | KCDB | JCTLM-DB | Contact us  
   
CCL key comparison portfolio
CCL summary
General information
CCL members
CCL publications and bibliography
Mise en pratique for the definition of the metre
Presentation by Prof. Chung to the 23rd CGPM
CCL key comparison portfolio
CCL working groups
Photographs of the CCL
Key comparisons
DimVIM: Multilingual CMC classification scheme
Open access
CCL documents
CCL-CCTF documents
CCL-WG-MRA documents
Restricted access  
CCL working documents
CCL-CCTF documents
CCL-WG documents
CCL-WG-MRA documents
CCL-WG-N documents
CCL-WG-S documents
MePWG documents
WGDM documents
Direct access

At its 13th meeting (2007) the CCL approved the following list of key comparisons in dimensional metrology proposed by the WGDM:

K11 National standards of length (mise en pratique stabilized lasers: former BIPM.L-K11) CCL-K11
K1 Gauge blocks up to 500 mm (including also former K2) CCL-K1
K3 Angle standards (polygons and angle blocks) CCL-K3
K4 Cylindrical diameter standards CCL-K4.a
CCL-K4.b
K5 Step gauge CCL-K5
K7 Line scales  
K8 Surface texture standards  

CCL-K6 (2-dimensional CMM artifacts) will not be continued. K7 and K8 are recognized as being principal techniques relevant for customer services and have therefore been added to the list of CCL key comparisons.