– the intergovernmental organization through which Member States act together
     on matters related to measurement science and measurement standards.
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25th meeting of the CGPM: 18-20 November 2014
What's new?
The General Conference on Weights and Measures (Conférence Générale des Poids et Mesures, CGPM) is made up of delegates of the governments of the Member States with observers from the Associates of the CGPM.

The General Conference receives the report of the International Committee for Weights and Measures (CIPM) on work accomplished; it discusses and examines the arrangements required to ensure the propagation and improvement of the International System of Units (SI); it endorses the results of new fundamental metrological determinations and various scientific resolutions of international scope; and it decides all major issues concerning the organization and development of the BIPM, including the dotation of the BIPM.

Elections of CIPM members will take place during the meeting and the CIPM is seeking the names of suitable candidates.

Updated Agenda (Working version 5)
Previous meetings of the CGPM
Meeting logistics
Attendance and registration
Provisional timetable
Preparatory meeting
Hotels in Versailles
Working documents
Draft Resolutions
Process for election of CIPM Members
BIPM highlights of progress made, and notes supporting the dotation 2016-2019
Draft BIPM Work Programme (for comment)
Proposal for a BIPM Visitor Programme (for comment)
Report of the CIPM President
Reports of the Presidents of the CIPM Consultative Committees (CCs)
BIPM strategic plan and Consultative Committee strategy documents
Work of the BIPM
Role, Mission, Objectives
Member States
Associate States and Economies
Annual Report
Director's Report
Compendium of main rules and practices applicable to the BIPM
Calculating Member State contributions
Calculating Associate subscriptions
List of members
Reports of the CIPM
The Consultative Committees
Impact of metrology
The CIPM Mutual Recognition Arrangement
Impact and case studies related to metrology