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NMIJ-BIPM Workshop: Presentations 15-25
Summary
Satellite Workshop on Key Comparison Data Evaluation
NMIJ-BIPM Workshop: Presentations 1-14
NMIJ-BIPM Workshop: Presentations 15-25
NMIJ-BIPM Workshop: Presentations 26-40
Direct access

19 May 2005


  No. Title Author Affiliation
WS-15 Spectral density-based statistical measures for image sharpness and the related software Nien Fan Zhang NIST (USA)
WS-16 Special issues and methods in testing uncertainty evaluating software Craig Shakarji NIST (USA)
WS-17 Propagation of uncertainties in meaurements using generalized inference Jack Wang NIST (USA)
WS-18 Automated algorithms for applied spectral analysis Anthony Kearsley NIST (USA)
WS-19 Mixture-model probability density functions and the robust estimation of location and dispersion David Lee Duewer NIST (USA)
WS-20 A machine vision system for surface roughness assessment using adaptive neuro fuzzy inference system Arun Raj Ethi IIT Madras (India)
WS-21 The BIPM key comparison database (KCDB): technical aspects and data management
[See also Rapport BIPM-2005/07]
Claudine Thomas BIPM
WS-22 Statistical procedures for key comparisons for vector measurands Hari K. Iyer NIST (USA)
WS-23 A Bayesian interface for a key comparison with unstable travelling standards: with application to CCM.M-K1 Hung-Kung Liu, Zeina Jabbour NIST (USA)
WS-24 A network database system for thermophysical property data Tetsuya Baba NMIJ (Japan)
WS-25 Importance of IT to the determination and distribution of recommended values of the fundamental constants and related quantities Barry Taylor NIST (USA)