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Recent publications: BIPM Physical Metrology Department - Electricity

2017

  Rolland B., Fletcher N., Khumthukthit N., Jassadajin C., Bilateral comparison of 1 Ω and 10 kΩ standards (ongoing BIPM key comparisons BIPM.EM-K13.a and 13.b) between the NIMT (Thailand) and the BIPM, Metrologia, 2017, 54Tech. Suppl., 01002  
  Rolland B., Fletcher N., Kučera J., Chrobok P., Vojčkov L., Bilateral comparison of 1 Ω and 10 kΩ standards (ongoing BIPM key comparisons BIPM.EM-K13.a and 13.b) between the CMI (Czech Republic) and the BIPM, Metrologia, 2017, 54Tech. Suppl., 01007  
  Rolland B., Fletcher N., Power O., Bilateral comparison of 1 Ω and 10 kΩ standards (ongoing BIPM key comparisons BIPM.EM-K13.a and 13.b) between the NSAI NML (Ireland) and the BIPM, Metrologia, 2017, 54Tech. Suppl., 01003  
  Rolland B., Fletcher N., Tenev A., Hadzhistoykova R., Bilateral comparison of 1 Ω and 10 kΩ standards (ongoing BIPM key comparisons BIPM.EM-K13.a and 13.b) between the BIM (Bulgaria) and the BIPM, Metrologia, 2017, 54Tech. Suppl., 01001  

2016

  Fletcher N., Gournay, P. Rolland B., Götz M., Novikov S., Lebedeva N., Satrapinski A., Experimental study of carrier density tuning in epitaxial graphene QHR devices, Proc. 2016 Conference on Precision Electromagnetic Measurements (CPEM), 2016,  
  Gournay P., Fletcher N., Robertsson L., Stock M., Progress report on measuring the von Klitzing constant at the BIPM, Proc. 2016 Conference on Precision Electromagnetic Measurements (CPEM), 2016,  
  Gournay P., Fletcher N., Stock M., A new CCEM-K4 comparison of capacitance at 10 pF, Proc. 2016 Conference on Precision Electromagnetic Measurements (CPEM), 2016,  
  Satrapinski A., Götz M., Pesel E., Fletcher N., Gournay P., Rolland B., Testing the new generation of low-frequency current comparators, Proc. 2016 Conference on Precision Electromagnetic Measurements (CPEM), 2016,  
  Solve S., Chayramy R., Temperature sensitivity coefficients of the BIPM secondary voltage standards, Proc. 2016 Conference on Precision Electromagnetic Measurements (CPEM), 2016, DOI: 10.1109/CPEM.2016.7540702  
  Solve S., Chayramy R., Ben Salah B., Mallat A., Abene L., Stock M., Bilateral comparison of 1 V and 10 V standards between the DEFNAT (Tunisia) and the BIPM February to March 2016 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b), Metrologia, 2016, 53Tech. Suppl., 01004  
  Solve S., Chayramy R., Maruyama M., Urano C., Kaneko N., A direct DC 10 V comparison between the NMIJ and the BIPM programmable Josephson voltage standards, Proc. 2016 CPEM, 2016,  
  Solve S., Chayramy R., Power O., Stock M., Bilateral comparison of 10 V standards between the NSAI - NML (Ireland) and the BIPM, February 2016 (part of the ongoing BIPM key comparison BIPM.EM-K11.b), Metrologia, 2016, 53Tech. Suppl., 01007  
  Solve S., Chayramy R., Stock M., Pantelic-Babic J., Sofranac Z., Cincar Vujovic T., Comparison of the Josephson Voltage Standards of the DMDM and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b), Metrologia, 2016, 53Tech. Suppl., 01005  
  Solve S., Chayramy R., Stock M., Pimsut S., Rujirat N., Comparison of the Josephson Voltage Standards of the NIMT and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b), Metrologia, 2016, 53Tech. Suppl., 01006  
  Zwinkels J., Sperling A., Goodman T., Campos Acosta J., Ohno Y., Rastello M.L., Stock M., Woolliams E., Mise en pratique for the definition of the candela and associated derived units for photometric and radiometric quantities in the International System of Units (SI), Metrologia, 2016, 53(3), G1  

2015

  Fletcher N., Götz M., Rolland B., Pesel E., Behavior of 1 Ω resistors at frequencies below 1 Hz and the problem of assigning a dc value, Metrologia, 2015, 52(4), 509-513  
  Power O., Moran A., Fletcher N., Goebel R., Stock M., Bilateral comparison of 10 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.a) between the NSAI-NML, Ireland, and the BIPM, March-August 2011, Metrologia, 2015, 52Tech. Suppl., 01017  
  Power O., Moran A., Fletcher N., Goebel R., Stock M., Bilateral comparison of 100 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.b) between the NSAI-NML, Ireland, and the BIPM, March-August 2011, Metrologia, 2015, 52Tech. Suppl., 01018  
  Saleem M., Ansari M.A., Saxena A.K., Fletcher N., Goebel R., Stock M., Bilateral comparison of 10 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.a) between the NPLI and the BIPM, July 2010-May 2011, Metrologia, 2015, 52Tech. Suppl., 01015  
  Saleem M., Ansari M.A., Saxena A.K., Fletcher N., Goebel R., Stock M., Bilateral comparison of 100 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.b) between the NPLI and the BIPM, July 2010-May 2011, Metrologia, 2015, 52Tech. Suppl., 01016  
  Sapunova I., Fletcher N., Goebel R., Stock M., Bilateral comparison of 10 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.a) between the BIM, Bulgaria, and the BIPM, April 2012 to September 2012, Metrologia, 2015, 52Tech. Suppl., 01012  
  Sapunova I., Fletcher N., Goebel R., Stock M., Bilateral comparison of 100 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.b) between the BIM, Bulgaria, and the BIPM, April 2012 to September 2012, Metrologia, 2015, 52Tech. Suppl., 01013  
  Solve S., Chayramy R., Stock M., Mageed H.M.A., Aladdin O.M., Raouf M.H.A., Bilateral comparison of 1 V and 10 V standards between the NIS (Egypt) and the BIPM, August to September 2014 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b), Metrologia, 2015, 52Tech. Suppl., 01011  
  Solve S., Chayramy R., Stock M., Palafox L., Behr R., Comparison of the Josephson Voltage Standards of the PTB and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b), Metrologia, 2015, 52Tech. Suppl., 01025  
  Solve S., Chayramy R., Stock M., Pantelic-Babic J., Sofranac Z., Zivkovic V., Bilateral comparison of 1 V and 10 V standards between the DMDM (Serbia) and the BIPM, January to March 2014 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b), Metrologia, 2015, 52Tech. Suppl., 01006  
  Solve S., Chayramy R., Stock M., Pimsut S., Bilateral Comparison of 1 V and 10 V Standards between the NIMT (Thailand) and the BIPM October to December 2014 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b), Metrologia, 2015, 52Tech. Suppl., 01019  
  Solve S., Chayramy R., Stock M., Power O., Bilateral Comparison of 10 V Standards between the NSAI - NML (Ireland) and the BIPM, March 2015 (part of the ongoing BIPM key comparison BIPM.EM-K11.b), Metrologia, 2015, 52Tech. Suppl., 01021  
  Solve S., Chayramy R., Stock M., Sengebush F., Bilateral Comparison of 1 V and 10 V Standards between the JV (Norway) and the BIPM, January to February 2015 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b), Metrologia, 2015, 52Tech. Suppl., 01022  
  Solve S., Chayramy R., Stock M., Simionescu M., Cîrneanu L., Comparison of the Josephson voltage standards of the INM and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b), Metrologia, 2015, 52Tech. Suppl., 01009  
  Solve S., Chayramy R., Stock M., Vlad D., Bilateral Comparison of 1 V and 10 V Standards between the SMD (Belgium) and the BIPM October to December 2014 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b), Metrologia, 2015, 52Tech. Suppl., 01020  

2014

  Burroughs C. J., Rüfenacht A., Waltrip B.C., Solve S., Dresselhaus P.D., Benz S.P., AC Waveform Source Referred to a Programmable Josephson Voltage Standard, Proc. 2014 Conference on Precision Electromagnetic Measurements (CPEM), 2014, 736-737  
  Fang H., Kiss A., Lavergne T., Robertsson L., de Mirandés E., Solve S., Picard A., Stock M., Update from the BIPM watt balance, Proc. 2014 Conference on Precision Electromagnetic Measurements (CPEM), 2014, 710-711  
  Fletcher N., Rietveld G., Olthoff J., Budovsky I., Milton M., Electrical units in the new SI: Saying goodbye to the 1990 values, NCSLI Measure, 2014, 9(2), 30-35  
  Goebel R., Fletcher N., Rolland B., Götz M., Pesel E., Final report on the on-going comparison BIPM.EM-K12: Comparison of quantum Hall effect resistance standards of the PTB and the BIPM, Metrologia, 2014, 51Tech. Suppl., 01011  
  Power O., Chayramy R., Solve S., Stock M., Bilateral comparison of 10 V standards between the NSAI–NML (Ireland) and the BIPM, January to February 2013 (part of the ongoing BIPM key comparison BIPM.EM-K11.b), Metrologia, 2014, 51Tech. Suppl., 01006  
  Solve S., Chayramy R., Power O., Stock M., Bilateral comparison of 10 V standards between the NSAI–NML (Ireland) and the BIPM, March 2014 (part of the ongoing BIPM key comparison BIPM.EM-K11.b), Metrologia, 2014, 51Tech. Suppl., 01008  
  Solve S., Chayramy R., Rüfenacht A., Burroughs C. J., Benz S.P., The leakage resistance to ground of a NIST Programmable Josephson Voltage Standard, Proc. 2014 Conference on Precision Electromagnetic Measurements (CPEM), 2014, 462-463  
  Solve S., Chayramy R., Stock M., Simionescu M., Cirneanu L., Bilateral comparison of 1 V and 10 V standards between the INM (Romania) and the BIPM, August to October 2013 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b), Metrologia, 2014, 51Tech. Suppl., 01005  
  Solve S., Chayramy R., Stock M., Yuan G., Honghui L., Zengmin W., Comparison of the Josephson voltage standards of the NIM and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b), Metrologia, 2014, 51Tech. Suppl., 01009  

2013

  Avilés D., Navarrete E., Hernández D., Solve S., Chayramy R., Direct comparison of Josephson voltage standards at 10 V between BIPM and CENAM, IEEE Trans. Instrum. Meas., 2013, 1640-1645  
  Chayramy R., Solve S., A very low thermal EMF computer-controlled scanner, Meas. Sci. Technol., 2013, 24, 035008  
  Fang H., Kiss A., de Mirandés E., Lan J., Robertsson L., Solve S., Picard A., Stock M., Status of the BIPM watt balance, IEEE Trans. Instrum Meas., 2013, 62, 1491-1498  
  Solve S., Chayramy R., Picard A., Kiss A., Fang H., Robertsson L, de Mirandés E., Stock M., A bias source for the voltage reference of the BIPM watt balance, IEEE Trans. Instrum. Meas., 2013, 1594-1599  
  Solve S., Rüfenacht A., Burroughs C.J., Benz S.P., Direct comparison of two NIST PJVS systems at 10 V, Metrologia, 2013, 50(5), 441-451  
  Stock M., Watt balance experiments for the determination of the Planck constant and the redefinition of the kilogram, Metrologia, 2013, 50(1), R1-R16  

2012

  Chayramy R., Solve S., A very low thermal EMFs computer-controlled scanner, Proc. 2012 Conference on Precision Electromagnetic Measurements (CPEM), 2012, 548-549  
  de Mirandés E., Zeggagh A., Bradley M., Picard A., Fang H., Kiss A., Stock M., Superconducting coil system to study the behavior of superconducting coils for a cryogenic watt balance, Proc. 2012 Conference on Precision Electromagnetic Measurements (CPEM), 2012, 470-471  
  Fletcher N., Goebel R., Robertsson L. and Stock M., Progress towards a determination of RK at the BIPM, Proc. 2012 Conference on Precision Electromagnetic Measurements (CPEM), 2012, 252-253  
  Goebel R., Kim W.-S., Fletcher N., Stock M., Bilateral comparison of 10 kΩ standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the KRISS (Rep. of Korea) and the BIPM, Metrologia, 2012, 49Tech. Suppl., 01006  
  Goebel R., Power O., Fletcher N., Stock M., Bilateral comparison of 1 Ω standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the NSAI-NML (Ireland) and the BIPM, Metrologia, 2012, 49Tech. Suppl., 01004  
  Goebel R., Power O., Fletcher N., Stock M., Bilateral comparison of 10 kΩ standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the NSAI-NML (Ireland) and the BIPM, Metrologia, 2012, 49Tech. Suppl., 01005  
  Janssen T.J.B.M., Williams J.M., Fletcher N.E., Goebel R., Tzalenchuk A., Yakimova R., Lara-Avila S., Kubatkin S., Fal'ko V.I., Precision comparison of the quantum Hall effect in graphene and gallium arsenide, Metrologia, 2012, 49(3), 294-306  
  Power O., Solve S., Chayramy R., Stock M., Bilateral comparison of 10 V standards between the NSAI-NML (Ireland) and the BIPM, February to March 2012 (part of the ongoing BIPM key comparison BIPM.EM-K11.b), Metrologia, 2012, 49Tech. Suppl., 01014  
  Rolland B., Goebel R., Fletcher N., A transportable thermoregulated enclosure for standard resistors, Proc. 2012 Conference on Precision Electromagnetic Measurements (CPEM), 2012, 378-379  
  Solve S., Chayramy R., Stock M., Avilés D., Navarrete E., Hernández D., Comparison of the Josephson voltage standards of the CENAM and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b), Metrologia, 2012, 49Tech. Suppl., 01011  
  Solve S., Chayramy R., Stock M., Christian L., Comparison of the Josephson voltage standards of the MSL and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b), Metrologia, 2012, 49Tech. Suppl., 01015  
  Solve S., Chayramy R., Stock M., Iuzzolino R., Tonina A., Comparison of the Josephson voltage standards of the INTI and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.a), Metrologia, 2012, 49Tech. Suppl., 01009  
  Solve S., Chayramy R., Stock M., Jeanneret B., Comparison of the Josephson voltage standards of the METAS and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.a and b), Metrologia, 2012, 49Tech. Suppl., 01010  
  Solve S., Chayramy R., Stock M., Streit J., Šíra M., Comparison of the Josephson voltage standards of the CMI and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b), Metrologia, 2012, 49Tech. Suppl., 01003  
  Solve S., Stock M., BIPM direct on-site Josephson voltage standard comparisons: 20 years of results, Meas. Sci. Technol., 2012, 23(12), 124001 (10 pp)  

2011

  de Mirandés E., Fang H., Kiss A., Solve S., Stock M., Picard A., Alignment procedure used in the BIPM watt balance, IEEE Trans. Instrum. Meas., 2011, 60(7), 2415-2421  
  Goebel R., Fletcher N., Stock M., Dudek E., Domanska-Mysliwiec D., Mosiadz M., Orzepowski M., Bilateral comparison of 1 Ω standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the GUM (Poland) and the BIPM, Metrologia, 2011, 48Tech. Suppl., 01001  
  Goebel R., Fletcher N., Stock M., Dudek E., Domanska-Mysliwiec D., Mosiadz M., Orzepowski M., Bilateral comparison of 10 kΩ standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the GUM (Poland) and the BIPM, Metrologia, 2011, 48Tech. Suppl., 01002  
  Janssen T.J.B.M., Fletcher N.E., Goebel R., Williams J.M., Tzalenchuk A., Yakimova R., Kubatkin S., Lara-Avila S., Falko V.I., Graphene, universality of the quantum Hall effect and redefinition of the SI system, New J. Phys., 2011, 13, 093026  
  Katkov A.S., Solve S., Key comparisons of the VNIIM and BIPM voltage standards, Meas. Tech., 2011, 54(11), 1313-1318  
  Picard A., Bradley M.P., Fang H., Kiss A., de Mirandés E., Parker B., Solve S., Stock M., The BIPM watt balance: Improvements and developments, IEEE Trans. Instrum. Meas., 2011, 60(7), 2378-2386  
  Power O., Solve S., Chayramy R., Stock M., Bilateral comparison of 10 V standards between the NSAI-NML (Ireland) and the BIPM, March to April 2011 (part of the ongoing BIPM key comparison BIPM.EM-K11.b), Metrologia, 2011, 48Tech. Suppl., 01010  
  Solve S., Chayramy R., The BIPM compact Josephson voltage standard, IEEE Trans. Instrum. Meas., 2011, 60(7), 2366-2371  
  Solve S., Chayramy R., Stock M., The BIPM 1.018 V Zener Measurement Set-up, Rapport BIPM-2011/05, 32 pp  
  Solve S., Chayramy R., Stock M., Katkov A., Comparison of the Josephson voltage standards of the VNIIM and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b), Metrologia, 2011, 48Tech. Suppl., 01007  
  Solve S., Chayramy R., Stock M., Zhou Y., Lee J., Wey Chua S., Comparison of the Josephson voltage standards of the NMC, A*STAR and the BIPM (part of the ongoing BIPM key comparisons BIPM.EM-K10.a and BIPM.EM-K10.b), Metrologia, 2011, 48Tech. Suppl., 01006  
  Stock M., Review article: The watt balance: determination of the Planck constant and redefinition of the kilogram, Phil. Trans. R. Soc. A., 2011, 369(1953), 3936-3953  
  Tang Y., Solve S., Witt T.J., Impact of 1/f noise of DVM on Josephson voltage standard comparison, Proc. 2010 Conference on Precision Electromagnetic Measurements (CPEM), 2011, 175-176  
  Tang Y., Solve S., Witt T.J., Allan variance analysis of Josephson voltage standard comparison for data taken at unequal time intervals, IEEE Trans. Instrum. Meas., 2011, 60(7), 2248-2254  

2010

  Fletcher N., Goebel R., Wang Y., Bilateral comparison of 10 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.a) between the NIST, United States and the BIPM, June 2007-March 2008, Metrologia, 2010, 47Tech. Suppl., 01013  
  Goebel R., Kurupakorn C., Fletcher N., Stock M., Final report on bilateral comparison of 10 kΩ standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the NIMT-Thailand and the BIPM, Metrologia, 2010, 47Tech. Suppl., 01005  
  Power O., Solve S., Chayramy R., Stock M., Bilateral comparison of 1.018 V and 10 V standards between the NSAI-NML (Ireland) and the BIPM, March to April 2010 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b), Metrologia, 2010, 47Tech. Suppl., 01017  
  Solve S., Chayramy R., Stock M., Holiastou M., Flouda I., Comparison of the Josephson voltage standards of the EIM and the BIPM, Metrologia, 2010, 47Tech. Suppl., 01009  
  Solve S., Chayramy R., Stock M., Nicolas J., Van Theemsche A., Comparison of the Josephson voltage standards of the SMD and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b), Metrologia, 2010, 47Tech. Suppl., 01004  
  Streit J., Fletcher N., Bilateral comparison of 10 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.a) between the CMI, Czech Republic and the BIPM, January-July 2009, Metrologia, 2010, 47Tech. Suppl., 01012  
  Streit J., Fletcher N., Bilateral comparison of 100 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.b) between the CMI, Czech Republic and the BIPM, January-July 2009, Metrologia, 2010, 47Tech. Suppl., 01014  
  Tonina A., Iuzzolino R., Bierzychudek M., Real M., Solve S., Chayramy R., Stock M., Bilateral comparison of 1.018 V and 10 V standards between the INTI (Argentina) and the BIPM, August to October 2009 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b), Metrologia, 2010, 47Tech. Suppl., 01002  
  Witt T.J., Fletcher N.E., Standard deviation of the mean and other time series properties of voltages measured with a digital lock-in amplifier, Metrologia, 2010, 47(5), 616-630  

2009

  Goebel R., Fletcher N., Stock M., Pritchard B., Xie R., Coogan P., Johnson L., Bilateral comparison of 1 Ω standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the NMIA (Australia) and the BIPM, Metrologia, 2009, 46Tech. Suppl., 01011  
  Goebel R., Power O., Fletcher N., Stock M., Bilateral comparison of 1 Ω standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the NML-Ireland and the BIPM, Metrologia, 2009, 46Tech. Suppl., 01012  
  Goebel R., Power O., Fletcher N., Stock M., Bilateral comparison of 10 kΩ standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the NML-Ireland and the BIPM, Metrologia, 2009, 46Tech. Suppl., 01013  
  Picard A., Fang H., Kiss A., de Mirandés E., Stock M., Urano C., Progress on the BIPM watt balance, IEEE Trans. Instrum. Meas., 2009, 58(4), 924-929  
  Power O., Solve S., Chayramy R., Bilateral comparison of 10 V standards between the NML (Ireland) and the BIPM, April to May 2009 (part of the ongoing BIPM key comparison BIPM.EM-K11.b), Metrologia, 2009, 46Tech. Suppl., 01008  
  Solve S., Chayramy R., Djorjevic S., Séron O., Comparison of the Josephson voltage standards of the LNE and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b), Metrologia, 2009, 46Tech. Suppl., 01002  
  Solve S., Chayramy R., Stock M., Tang Y.H., Sims J.E., Comparison of the Josephson voltage standards of the NIST and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b), Metrologia, 2009, 46Tech. Suppl., 01010  
  Wood B.M., Solve S., A review of Josephson comparison results, Metrologia, 2009, 46(6), R13-R20  

2008

  Djordjevic S., Séron O., Solve S., Chayramy R., Direct comparison between a programmable and a conventional Josephson voltage standard at the level of 10 V, Metrologia, 2008, 45(4), 429-435  
  Goebel R., Chrobok P., Fletcher N., Stock M., Final report on the bilateral comparison of 1 ohm standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the CMI (Czech Republic) and the BIPM, Metrologia, 2008, 45Tech. Suppl., 01004  
  Goebel R., Chrobok P., Fletcher N., Stock M., Bilateral comparison of 10 kohm standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the CMI (Czech Republic) and the BIPM, Metrologia, 2008, 45Tech. Suppl., 01010  
  GoebeL R., Elmquist R., Fletcher N., Stock M., Final report on the bilateral comparison of 1 ohm standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the NIST (USA) and the BIPM, Metrologia, 2008, 45Tech. Suppl., 01001  
  Power O., Fletcher N., Final report on the bilateral comparison of 100 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.b) between the NML, Ireland and the BIPM, June-October 2007, Metrologia, 2008, 45Tech. Suppl., 01002  
  Power O., Murray J., Solve S., Chayramy R., Bilateral comparison of 10 V standards between the NML (Ireland) and the BIPM, May to June 2008 (part of the ongoing BIPM key comparison BIPM.EM-K11.b), Metrologia, 2008, 45Tech. Suppl., 01008  
  Solve S., Chayramy R., Stock M., Kim K.-T., Song W., Kim M.-S., Chong Y., Comparison of the Josephson voltage standards of the KRISS and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b), Metrologia, 2008, 45Tech. Suppl., 01006  
  Solve S., Chayramy R., Stock M., Kim K.-T., Song W., Kim M.-S., Chong Y., Bilateral comparison of 1.018 V and 10 V standards between the KRISS (Republic of Korea) and the BIPM, February 2008 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b), Metrologia, 2008, 45Tech. Suppl., 01007  
Summary
Calculable capacitor
Ongoing comparisons piloted by the BIPM
Calibration services
BIPM services in the field of electricity
Recent publications
Staff of the Physical Metrology Department